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JEM-ARM200F Transmission Electron Microscope

Highest Resolution Analytical S/TEM in Its Class – Optional Cold FEG

Application Images
Visualization of Hydrogen hydrogen atomic columns in YH2 by ABF imaging (Y = red, H = green). Data courtesy of Ryo Ishikawa and Dr. Eiji Abe (The University of Tokyo).
Application Images
GaN [211] HAADF at 200kV.
Application Images
ABF, HAADF and EELS Ca3Co4O9 (110). Specimen Data courtesy of Dr. Robert Klie, University of Illinois at Chicago.
Application Images
EDS spectrum image of GaAs, showing atomic positions of Ga (green) and As (red). Data courtesy of Dr. Masashi Watanabe, Lehigh University.
Application Images
Raw High Angle Annular Darkfield (HAADF) STEM image of Si(112) showing 78pm point-to-point resolution.
Application Images
Raw Annular Bright Field (ABF) STEM image of SrTiO3, showing enhanced contrast of oxygen.

Highest Resolution Analytical S/TEM in Its Class – Optional Cold FEG

No other TEM can examine individual atoms this clearly and without distortion, analyze each atom for elemental composition, and reconstruct images in 2 and 3-d. The JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.

This atomic resolution analytical microscope achieves a scanning transmission image (STEM-HAADF) resolution of 80 picometers, the highest in the world for any commercial Cs corrected TEM.

When outfitted with the Cold Field Emission Gun (optional), resolution is guaranteed at 78 picometers and an energy resolution of 3eV. Higher brightness, narrower energy spread, and ultra stable emission greatly enhance atom-by-atom imaging and chemical analysis. The ARM200F with Cold FEG is the only TEM to “Flash & Go” - or resume observation and analysis almost immediately after flashing – saving valuable time.

JEM-ARM200F Details

Flash and Go
Flash and Go
Interview with Dr. Tom Isabell
Interview with Dr. Tom Isabell