Highest Resolution Analytical S/TEM in Its Class
- Atomic Resolution S/TEM
The JEM-ARM200F atomic resolution analytical microscope has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world for any commercial TEM. This new generation of transmission electron microscope features an electron probe that, after aberration correction, contains a current density level higher by an order of magnitude than conventional TEMs. With this probe finely focused, the ARM200F is capable of atomic level analysis, substantially reducing measurement time and improving throughput.
- Environmental measures
The JEM-ARM200F offers the ultimate stability for imaging and analysis at the atomic scale. The electron column is isolated from the environmental disturbances found in most labs. A superior shielding design safeguards the ultrahigh-powered optics from airflow, vibration, acoustical, and electronic interference, magnetic fields, and thermal fluctuations.
- Enhanced mechanical stability
To enable atomic level analysis and imaging - utilizing spherical aberration correctors for electron optic and image forming systems - vibration and distortion on the atomic level need to be controlled. The ARM 200F features an overall mechanical strength twice higher than conventional TEMs. Enlarging the column size improves rigidity and optimizing the console structure enhances mechanical stability.
- Enhanced electrical stability
The ARM200F reduces the fluctuation of the high voltage system and the objective lens current by 50% of that of conventional TEMs, significantly enhancing its electrical stability.
- Wide ranging STEM analytical capabilities
Two types of dark field detectors with different STEM detection angles (one as standard), a bright field detector (standard), and a backscattered electron detector (option) can be simultaneously installed. A new scanning image acquisition system is capable of acquiring 4 different types of signals, enabling simultaneous observation of all 4 images.
- Optional spherical aberration corrector for TEM image forming system
With an optional spherical aberration corrector, the resolution of the TEM image can be improved to 0.11 nm.
- Integrated Software Automation
The latest in software automation has been designed into the new ARM200F, with tomography and holography simplified by a user-friendly GUI.
See interview - Dr. Tom Isabell talks about new ARM200F
Materials supplied courtesy of Microscopy & Analysis
View the JEM-ARM200F slide show here