Highest Resolution Analytical S/TEM in Its Class – Optional Cold FEG
No other TEM can examine individual atoms this clearly and without distortion, analyze each atom for elemental composition, and reconstruct images in 2 and 3-d. The JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.
This atomic resolution analytical microscope achieves a scanning transmission image (STEM-HAADF) resolution of 80 picometers, the highest in the world for any commercial Cs corrected TEM.
When outfitted with the Cold Field Emission Gun (optional), resolution is guaranteed at 78 picometers and an energy resolution of 3eV. Higher brightness, narrower energy spread, and ultra stable emission greatly enhance atom-by-atom imaging and chemical analysis. The ARM200F with Cold FEG is the only TEM to “Flash & Go” - or resume observation and analysis almost immediately after flashing – saving valuable time.