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  PRODUCTS : Electron Optics : Transmission Electron Microscopes (TEM) : 200 kV : JEM-ARM200F  
JEOL Transmission Electron Microscopes
Also See
Application Images
  • Raw Annular Bright Field (ABF) STEM image of SrTiO3, showing enhanced contrast of oxygen.
  • Raw High Angle Annular Darkfield (HAADF) STEM image of Si(112) showing 78pm point-to-point resolution.
  • EDS spectrum image of GaAs, showing atomic positions of Ga (green) and As (red). Data courtesy of Dr. Masashi Watanabe, Lehigh University.
  • ABF, HAADF and EELS Ca3Co4O9 (110). Specimen Data courtesy of Dr. Robert Klie, University of Illinois at Chicago.
  • GaN [211] HAADF at 200kV.
  • Visualization of Hydrogen hydrogen atomic columns in YH2 by ABF imaging (Y = red, H = green). Data courtesy of Ryo Ishikawa and Dr. Eiji Abe (The University of Tokyo).
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JEM-ARM200F Transmission Electron Microscope

Highest Resolution Analytical S/TEM in Its Class – Optional Cold FEG

No other TEM can examine individual atoms this clearly and without distortion, analyze each atom for elemental composition, and reconstruct images in 2 and 3-d. The JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.

This atomic resolution analytical microscope achieves a scanning transmission image (STEM-HAADF) resolution of 80 picometers, the highest in the world for any commercial Cs corrected TEM.

When outfitted with the Cold Field Emission Gun (optional), resolution is guaranteed at 78 picometers and an energy resolution of 3eV. Higher brightness, narrower energy spread, and ultra stable emission greatly enhance atom-by-atom imaging and chemical analysis. The ARM200F with Cold FEG is the only TEM to “Flash & Go” - or resume observation and analysis almost immediately after flashing – saving valuable time.

JEM-ARM200F Details
  • “Flash & Go” eliminates the wait with cold FEG

    The ARM200F with Cold FEG is the only TEM to “Flash & Go” - or resume observation and analysis almost immediately after flashing. Instead of interrupting work for 30 minutes or more while waiting for the emission to stabilize, the ARM200F takes just seconds to continue operation after a flash. A newly developed vacuum system evacuates the area around the Cold FEG source to less than 1 x 10-9 Pa, resulting in unprecedented emission stability.
  • Wide ranging STEM analytical capabilities

    Two dark field STEM detectors with different detection angles (one as standard), a bright field detector (standard), and a backscattered electron detector (option) can be simultaneously installed. A new scanning image acquisition system is capable of acquiring 4 different types of signals, enabling simultaneous observation of all 4 images.
     
  • Optional spherical aberration corrector for TEM image forming system

    With an optional spherical aberration corrector, the resolution of the TEM image can be improved to 0.11 nm.
     
  • Ultimate Stability at the Nanometer Scale

    A superior shielding design safeguards the optics from airflow, vibration, acoustical, and electronic interference, magnetic fields, and thermal fluctuations.

    The ARM200F has an overall mechanical strength twice that of conventional TEMs. The larger diameter column improves rigidity and the console structure enhances mechanical stability.

    We have reduced the fluctuation of the high voltage system and the objective lens current by 50% of that of conventional TEMs, significantly enhancing electrical stability.
     
  • Integrated Software Automation

    The latest in software automation has been designed into the new ARM200F, with tomography and holography simplified by a user-friendly GUI.

Resolution
Scanning transmission image 1) 0.08 nm 2) (at 200kV)
Transmission image
Point image

Lattice image		  
0.19 nm (at 200kV)
0.11 nm with TEM Cs corrector 3) (at 200kV)
0.10 nm
Magnification
Scanning transmission image 200 to 150,000,000x
Transmission image

50 to 2,000,000x
Electron gun Schottky field emission gun
Accelerating voltage 80 to 200 kV 4)
Specimen Stage
Stage Eucentric side entry goniometer stage
Specimen size 3 mm dia.
Tilt angle Up to 25° (with double tilt holder)
Movement range X/Y: ±1.0 mm (motor drive/piezo drive)
Cs Correctors
STEM Cs corrector Standard
TEM Cs corrector Optional
Optional accessories Energy Dispersive X-Ray Spectrometer (EDS)
Electron energy-loss spectrometer (EELS)
CCD camera, etc.

1) With HAADF (high-angle annular dark-field) detector
2) Verified using Ge(112) specimen
3) Optional
4) Standard voltage: 80 kV, 200 kV
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