JEOL USA JEM-3200FSC Transmission Electron Microscope

Ideally suited for imaging low contrast, frozen biological samples, the JEM-3200FSC field emission cryo-TEM is equipped with an in-column Omega-type energy filter spectrometer. The microscope combines excellent analytical performance for elemental mapping and zero-loss imaging with high resolution optics. The 300keV field emission gun produces a bright, coherent electron beam for the most demanding quantitative studies. The JEM-3200FSC features a liquid helium cooled cryogenic stage which allows specimen observation below 25K.

The JEM-3200FSC also features a Piezo-controlled anti-drift stage with side entry access and ±70° tilt. Quick beam select and computer controlled data management and storage are standard features on the JEM-3200FSC.

Other features Include:

Lattice resolution 0.20nm at 18K/RT
Energy resolution in image 20eV
Energy resolution in spectrum 0.9eV
Field-emission electron source
Magnification 100-1,200,000X
Manual specimen exchange

JEM-3200FSC Key Product Features

Resolution Lattice image Point image	0.204nm 0.17nm
Accelerating voltage	100 - 300kV
Magnification (steps)	x100-1,200,000 (27)
Camera length (steps)	250 to 3,000mm
Objective lens Spherical aberration coefficient Chromatic aberration coefficient	3.4 mm 4.4 mm
Spectrometer	In-column Omega filter
Specimen stage	Liquid helium cooled cryogenic stage
Specimen chamber Specimen per Load Specimen tilt angle (X-axis)	1 ±70°
Specimen movements X Direction Y Direction Z Direction	2.0mm 2.0mm 0.4mm (±0.2mm)