JEOL is a world leader in the development and manufacture of high performance, high stability Transmission Electron Microscopes (TEM). We have more than 60 years of expertise in producing TEMs designed for life sciences and material sciences. Some of the world’s most notable researchers use JEOL TEMs in their work.
JEOL’s innovations in TEM technology are legion, ranging from ultrahigh resolution optics for atom-to-atom characterization, to optimizing the user experience with an ergonomic design, user-friendly software and remote operation.
Using the JEOL TEM, biologists and pathologists can view and reconstruct 3D images of the finest cell structures. Crystallographers, metallurgists or semiconductor research scientists use high voltage/high spatial resolution TEMs to routinely image atoms. Materials researchers monitor and design materials at the nanoscale with custom-tailored properties. Often JEOL TEMs are used for multidisciplinary purposes among several research teams.
There is a JEOL TEM for every application, including cryotomography, STEM, MDS, and EDS. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter. The aberration corrected (Cs) TEM ensures the highest image resolution.
Our TEM product line is comprised of:
100 / 120 kV TEM including the popular JEM-1400 high performance, high contrast TEM with over 50 installed in the U.S.
200 kV TEM/FEG TEM including the JEM-2100F Field Emission TEM and the ARM200F Atomic Resolution TEM with Cold FEG
300 kV TEM/FEG TEM including the JEM-3200FSC CryoTEM