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JEOL USA Sample Preparation Tools

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. From Focused Ion Beam (FIB) systems for nanometric specimens, to a benchtop cross section polisher for large area samples, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, and multi-layer structures.

For coating of non-conductive samples and forming carbon and various metal-deposited films, we offer an extremely clean vacuum evaporator. These and other peripheral equipment compliment JEOL’s comprehensive line of electron microscopes.

SEM Sample Prep

Cross Section Polisher
Easy-to-use, sample preparation device for SEM, EPMA, and SAM applications
Smart Coater
Simple-to-use sputter coater with fully automated vacuum and sputtering

TEM Sample Prep

Vacuum Evaporator
Clean, oil-free, automatic evacuation system for carbon coating of samples