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High/Low Vacuum Tungsten or LaB6 SEMs

  • High Vacuum: Ideal for failure analysis, inspection, and characterization.
  • Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution
(W Source)
Accelerating
Voltage
Magnification Mechanically Eucentric Stage

JSM-IT300LV

HV: 3nm @ 30kV (SE)
LV: 4nm @ 30kV (BSE)
0.3 to 30kV X5 to X300,000
(Printed at 128mm x 96mm)
X=125mm, Y=100mm