The JWS-7855S Mask Observation Scanning Microscope has a stable thermal field emission electron gun, high tilt angle stage and specimen handling mechanism for the observing of reticules. The JWS-7855S allows for a specimen to be tilted from 0° to 60° without changing the field of view or focus. The JWS-7855S can also rapidly change from 800 volts to 12,000 volts for superior EDS analysis.

SEM Capability

Image resolution	6nm (at 1 kV accelerating voltage)
Magnification Area	x100 - x200,000 (on display)
Accelerating Voltage	0.5 kV - 3 kV (10V step) 3 kV - 5 kV (100V step) 5 kV - 12 kV (1000V step)

Specimen Stage