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  RESOURCES : Sample Preparation  
Sample Prep.
Resources
New in the Sample Preparation Library
JIB-4500 MultiBeam SEM-FIB Product Brochure
New, easy-to-use MultiBeam system combines high resolution ion optics with the most popular SEM column in the world. The JIB-4500 MultiBeam offers increased throughput and productivity for a variety of applications, from viewing to analysis to micro milling. 		10/28/2007
Precise SEM Cross Section Polishing via Argon Beam Milling
SEM observation of a specimen cross section can provide important information for research and development as well as failure analysis. In most cases, surface observation alone cannot provide information concerning the cross sectional structure of granular materials, layered materials, fibrous materials, and powders. Preparing highly-polished cross sections of these materials is both a science and an art. 		9/29/2006
Artifact-free Cross-sections
Argon ion beam specimen preparation quickly and easily produces cross sections of a wide variety of materials with minimal artifacts. 		9/29/2006
Argon Beam Cross Sectioning
The broad argon ion beam eliminates problems associated with the conventional methods of specimen cross sectioning for SEM. 		9/29/2006
Introduction of Cross Section Specimen Preparation
Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM Cross Section Polisher (CP) SM-09010 		5/25/2006
Cross Section Polisher Brochure
The SM-09010 Cross Section Polisher product brochure 		5/25/2006
JEM-9320FIB Product Brochure
Focused Ion Beam System for Specimen Preparation 		5/25/2006

 
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