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   SERVICE / SUPPORT : Applications Resources : Electron Optics  
Electron Optics
Resources
  
FEG Gallery Newest
Brightfield STEM image of semiconductor cross-section.
  
TEM Gallery Newest
Carbon soot particles in an organic ink medium, from Dead Sea Scroll fragment.
  
New in the Electron Optics Library
Technical Spotlight - NeoScope Benchtop SEM
Reprint from the May, 2008 issue of Advanced Materials & Processes magazine.
5/6/2008
NeoScope Gallery of Images
3/17/2008
Large Chamber and Stage (Tech Note, JSM-6490)
It is often inconvenient or impossible to cut down a large sample for SEM imaging and analysis. The large chamber and stage design of our JSM-6490 series SEMs can accommodate samples as large as 12 inches wide and greater than 3 inches tall. Of course for efficiency, such a large chamber will allow a user place to several smaller samples on the stage for continuous, unattended operation as well.
9/5/2007
Stage Navigation System for JEOL SEMs
The JEOL Stage Navigation System is a unique accessory for JEOL SEMs that simplifies navigation to a strategic location on a sample placed in the microscope. Navigation is done from a color image of the sample. After placing the sample in the chamber, the user takes a snapshot image of the entire sample which is then used for reference. The user simply selects the general area to be examined then selects the magnification for imaging with the SEM.
8/29/2007
Energy Table for EDS Analysis
6/21/2007
  

 
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