First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio
Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.
 

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina
Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.
 

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance
Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.
 

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso
Will provide capabilities to establish world class facility at UTEP
 

JEOL Canada Increases Sales Support for Scientific Instrumentation
Appointments of new sales manager and customer service representative
 

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere
New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope
 

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.
 

Download SEM Theory and Operation Books from JEOL Website
Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.
 

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009
SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.
 

West Virginia University Advancing Nanoscience with New E-beam SEM
Analytical field emission SEM is part of the University’s vigorous WVNano Initiative
 

Shale and Solar Thin Film Cross Sectioning Demonstrated in New E-Brochure
Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples
 

Peter Genovese Named President of JEOL USA
Member of the JEOL sales organization for more than 25 years
 

New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University
JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory