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  PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : Conventional FE  
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JEOL Conventional Thermal FE SEMs
  • Field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
  • A new low vacuum FE SEM is also available.

Available Models

  Gun Type Resolution Accelerating
Voltage		 Magnification Stage
JSM-7001F in-lens thermal 1.2nm (30kV)

3.0nm (1kV)

3.0nm (15kV
10mm WD
5namp Ip)		 0.5 to 30 kV x10 to 1,000,000x
(printed as a 120mm x 90mm micrograph)

Type I
X=70mm,
Y=50mm

Type II
X=110mm,
Y=80mm

Type III
X=140mm,
Y=80mm

 
  

 
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