JEOL USA JEM-1011 Transmission Electron Microscope

The JEM-1011 is a compact high performance TEM with advanced features and functions. Its high contrast objective lens polepiece combines the highest possible contrast and brightness with optimum resolution. The JEOL patented cool beam gun allows high-brightness, high coherence illumination conditions with filament-saving low emission current.

Other features include user friendly controls, file storage, automatic filament heating, and automatic exposure micrograph photography. Available attachments greatly increase the versatility of this TEM making it an essential item for any laboratory.

JEM-1011 Key Product Features

	High Contrast	High Contrast High Tilt	High Resolution
Resolution Lattice Image Point Image	0.2nm 0.4nm	0.2nm 0.45nm	0.14nm 0.3nm
Accelerating Voltage Range Variable Steps Stability	40 - 100 kV 25 V min. 250 V with lens excitation correction
Magnification (steps) Mag Mode (30) Low Mag Mode (14) SA Mag Mode (22) IOS Mode (13)	x800-600,000 x50-1,000 x2,500-300,000 x2,500-30,000	x600-500,000 x50-1,000 x2,000-250,000 x2,000-25,000	x1,200-1,000,000 x50-1,000 x4,000-500,000 x4,000-50,000
Camera Length (steps) SA DIFF (15) HD DIFF (14) FR DIFF (option)	150-3,500mm 4-80mm 337mm	200-5,000mm 4-80mm 337mm	100-2,500mm 4-80mm 337mm
Objective Lens Polepiece Focal Length Spherical Aberration Coefficient Chromatic Aberration Coefficient Minimum Focal Step Exciting Current Stability	EM-SAP-10B 3.9mm 3.4mm 3.0mm 9.8nm 1 ppm/min.	EM-SAP-10 5.0mm 5.6mm 3.9mm 7.0nm 1 ppm/min.	EM-SHP-10 2.5mm 1.9mm 1.9mm 3.5nm 1 ppm/min.
Specimen Stage	side entry goniometer
Specimen Chamber Specimen per Load Specimen Tilt Angle (X-axis)	2 ±20°	2 ±60°	2 ±25°
Specimen Movements X Direction Y Direction Z Direction	8.5mm 2.0mm 0.5mm (+0.2/-0.3mm)

note: configuration must be chosen at time of purchase.