JEOL Resourceshttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-DownloadsA Note on Magnificationhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/a-note-on-magnificationIT200Mon, 02 Nov 2020 12:04:09 GMTSEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.<h4>JEOL Technical Note</h4> <p>Magnification is defined as the ratio of the size of the rastered area on the sample to the size of the rastered area of the output, as is shown in Figure 1. Traditionally, the output size was defined as a Polaroid 4x5 film size by all vendors and results were easy to compare. However, since images are now collected digitally and can be output at various sizes, this “output size” is ill-defined. SEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.</p> <p class="caption" style="text-align: center;"><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/A%20Note%20on%20Magnification%20fig1.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=qwBAKbK5vdFXBnMuqKvDTHaPuWU%3D" /><br /> <strong>Figure 1</strong>: A small raster on the specimen leads to a large magnification for the same output size.</p> <p>The SEM images of hematite from two different SEM manufacturers below illustrate this point. The left image is from a JEOL SEM and has a magnification labeled as 75,000 X with a 100 nm micron bar. The right image is from another SEM manufacturer and has a magnification labeled as 150,000 X with the exact same length 100 nm scale bar (highlighted in red). This shows that the enlargement of the sample is identical in the two images, even though the magnification value stated by the other SEM manufacturer is twice that of the JEOL image.</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/A%20Note%20on%20Magnification%20fig2.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=ee9XnW4z%2FNODAGjnIrjYn%2B%2Bz9%2Fg%3D" /><br /> <strong>Figure 2</strong>: SEM images of hematite with the same enlargement of the sample despite having different magnification values stated. Left image: From a JEOL SEM Right image: From a different SEM manufacturer</p> Air Isolated Transfer Systemhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/air-isolated-transfer-systemIT200Mon, 02 Nov 2020 12:16:34 GMTThere are a number of applications where scientists and engineers are faced with air or moisture sensitive samples that require imaging and analysis using a scanning electron microscope (SEM). Applications include: components in rechargeable batteries, fuel cells, and catalysts among others. Any exposure to oxygen or moisture in the air can completely alter or destroy the structure of these highly reactive materials. JEOL has built a special air-lock system that can handle the transfer of air-sensitive specimens to be imaged in the SEM without atmospheric exposure.<h4>Latest Innovation in our FE SEMs</h4> <h3>SMART – POWERFUL – FLEXIBLE</h3> <p>There are a number of applications where scientists and engineers are faced with air or moisture sensitive samples that require imaging and analysis using a scanning electron microscope (SEM). Applications include: components in rechargeable batteries, fuel cells, and catalysts among others. Any exposure to oxygen or moisture in the air can completely alter or destroy the structure of these highly reactive materials. JEOL has built a special air-lock system that can handle the transfer of air-sensitive specimens to be imaged in the SEM without atmospheric exposure.</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Air%20Isolated%20Transfer%20System%201.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=xkpdwzMtMpoQzXu0bEdfuNq5TUI%3D" /><br /> The sample can be prepared, mounted on the holder, and covered with a cap while inside a glove box. The cap seals and isolates the sample from the environment.</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Air%20Isolated%20Transfer%20System%202.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=pNIu1zuAhMeq0w%2FJQiRX3%2Bm9R%2Fg%3D" /><br /> The sample holder (w/cap) is then removed from the glovebox and transferred into the load lock of the SEM. After the airlock is evacuated, the user can open the cap and put the sample into the FE-SEM without air exposure.</p> Automated Imaging Solutions for SEMhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/automated-imaging-solutions-for-semIT500Wed, 03 Jan 2024 16:50:43 GMTJEOL now offers both simple and advanced automation solutions, giving users the capability to develop protocols that fit their exact imaging needs. When paired with best-in- class AI-driven auto-function technology (auto focus, auto astigmatism correction, auto brightness/contrast), JEOL’s automation solutions are fast, reliable, reproducible, and applicable to a wide range of applications.<p>Automation of routine imaging in Scanning Electron Microscopy (SEM) has gained significant popularity over recent years. Automation provides users with additional levels of flexibility, including unattended and remote operation, as well as repeatability of their measurements. This ability maximizes productivity and sample throughput and significantly lowers the level of expertise required to proficiently operate SEMs. JEOL now offers both simple and advanced automation solutions, giving users the capability to develop protocols that fit their exact imaging needs. When paired with best-in- class AI-driven auto-function technology (auto focus, auto astigmatism correction, auto brightness/contrast), JEOL’s automation solutions are fast, reliable, reproducible, and applicable to a wide range of applications.</p> <h2>Simple Automation with Simple SEM</h2> <p>Simple SEM, JEOL’s latest advancement in automated imaging solutions, is a fully-integrated interface for creating and implementing imaging routines (Figure 1) without the need for programing experience. Users have the ability to develop custom automated workflows, including acquisition of SEM images and EDS data at a series of magnifications and locations on the sample surface and with varying operating conditions (accelerating voltage, probe current). Simply checking a box enables JEOL’s best-in-class auto-functions, with the added flexibility to control how often these functions are utilized within the workflow. Once routines are created, they are automatically saved and can be quickly implemented by simply selecting the area(s) on the sample that the user wants to characterize directly from a live image or ZeroMag view.</p> <p>Simple SEM is available as part of the standard software package on JEOL’s JSM-IT210, JSM-IT510 and JSM-IT710 SEM models.</p> <p style="text-align: center;"><img alt="Figure 1. Simple SEM is fully integrated within JEOL’s SEM control software, creating an intuitive environment for users to develop automation workflows without any need for programing experience." src="https://jeolusa.s3.amazonaws.com/resources_eo/Automated%20Imaging%20Solutions%20for%20SEM%2001.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=u5liPJoFw7B3RHGeMBBkk4ASV%2FA%3D" /><br /> <strong>Figure 1.</strong> Simple SEM is fully integrated within JEOL’s SEM control software, creating an intuitive environment for users to develop automation workflows without any need for programing experience.</p> <p><strong>Compatible Instruments:</strong> JSM-IT210, JSM-IT510, JSM-IT710HR<br /> <strong>Options:</strong> integration with JEOL EDS</p> <h2>Advanced Automation with Python and C#</h2> <p>For customers with more unique or challenging imaging demands, JEOL continues offers advanced external SEM control using Python or C# (Figure 2). This gives users the flexibility to fully develop and customize imaging protocols and interfaces, optimize acquisition at any operating conditions, automate image processing, and even integrate machine learning (Figure 3).</p> <p style="text-align: center;"><img alt="Figure 2. JEOL offers full external microscope control using Python and C#, allowing users to develop custom interfaces and automation programs. A full library of functions is available upon request." src="https://jeolusa.s3.amazonaws.com/resources_eo/Automated%20Imaging%20Solutions%20for%20SEM%2002.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=0xg%2FOlL0MI8DNbF6BFEiq3Iw1Pw%3D" /><br /> <strong>Figure 2.</strong> JEOL offers full external microscope control using Python and C#, allowing users to develop custom interfaces and automation programs. A full library of functions is available upon request.</p> <p style="text-align: center;"><img alt="Figure 3. External control allows users to develop custom interfaces and programs and integrate complex automation routines." src="https://jeolusa.s3.amazonaws.com/resources_eo/Automated%20Imaging%20Solutions%20for%20SEM%2003.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=B7phd2jhNxYfnxUBgKf%2FwClFhsc%3D" /><br /> <strong>Figure 3.</strong> External control allows users to develop custom interfaces and programs and integrate complex automation routines.</p> <p><em>External control with Python (3.5.1 or later) and C# available with all current JEOL SEM models. Additional compatible SEM models are available upon request.</em></p> Can I Trust My Quantitative EDS Data?https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/can-i-trust-my-quantitative-eds-dataIT200Mon, 02 Nov 2020 17:48:37 GMTScanning electron microscopes (SEM) coupled with an energy dispersive X-ray detector (EDS) are used extensively to provide insight into a sample’s chemical makeup. This SEM-EDS technique can provide information on the elements present, their relative concentrations and spatial distribution over very small volumes (micron and some instances nanometer scale).<p>NOTES ON STANDARDLESS QUANTITATIVE EDS IN SEM</p> <p>Scanning electron microscopes (SEM) coupled with an energy dispersive X-ray detector (EDS) are used extensively to provide insight into a sample’s chemical makeup. This SEM-EDS technique can provide information on the elements present, their relative concentrations and spatial distribution over very small volumes (micron and some instances nanometer scale).</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%201.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=iHeVhLBcmf2p1U5phWwmVO7q5BE%3D" /></p> <p>EDS, in general, is considered a semi quantitative elemental analysis technique. We are often asked how reliable are the quantitative results using SEM-EDS. This is a pretty broad question as it is dependent on a variety of factors including the sample matrix and morphology in addition to instrument considerations.</p> <p>So… what can be detected and how much? Modern systems are capable of detecting elements from Be to U. Detection limits are typically considered to be ≥1% for low atomic number elements (F to Be) and ≥0.1% (1000 ppm) for higher atomic number elements.</p> <p>One of the most common techniques used for quantitative EDS analyses is a method often described as Standardless quantitative EDS. With this method, the user does not use physical standards but instead uses a ratio of peak intensities to determine the relative abundance of the elements detected. The peak intensities are corrected for background and matrix effects and the results are then normalized to 100% based on the elements detected. This normalization can hide errors in the analysis results. With that said, if all criteria are met, one can expect around ±2% to ±5% relative for major components. However, this error can increase significantly for particles or rough surfaces.</p> <p>So, what are the criteria to consider when performing EDS quantitative analysis? Several assumptions are made with this technique regardless of whether the quantitative method is ‘Standardless’ or with physical standards. First, the sample is polished and flat. It is also homogeneous and infinitely thick relative to the beam interaction volume. If the sample is not homogeneous with respect to the beam interaction volume, the results may vary based on the contribution of neighboring components (Figure 1).</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%202.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=BtDfGCccxIm7elmvNbElmv209jg%3D" /><br /> <strong>Figure 1</strong>: A: Homogeneous sample within the beam scattering volume. B: Heterogeneous sample, a particle within the scattering volume will contribute to EDS quantitative results</p> <p>On the other hand, it may be particles or inclusions that you are trying to identify and quantify. By placing the beam on the particle, you may get a contribution from the surrounding matrix if the scattering volume is larger than the particle itself. For non-uniform materials it is good practice to collect spectra from several different areas and average the results.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%203.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=b3qC0e1VkfJ62zHvLYKBlM60vDQ%3D" /><br /> <strong>Figure 2</strong>: A: X-rays are blocked from reaching the detector by sample topography. B: Rotating the stage presents the region of interest in sight of the EDS detector allowing the X-rays to be detected.</p> <p>Only those X-rays that are within line of sight to the EDS detector are collected. If the sample has significant topography, the X-rays can be blocked entirely and not reach the detector. Or, in some instances, low energy X-rays may be absorbed by the sample matrix more than higher energy X-rays contributing to error in the quantitative results.</p> <p>When dealing with a topographic sample, it is important to understand the sample position with respect to the EDS detector position. It is often possible to position the region of interest so that it has direct line of sight to the detector (Figure 2).</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%204.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=NZHYugmVDjNyUDZIVQdScSM6KuQ%3D" /><br /> <strong>Figure 3</strong>: Example of C X-ray Intensity Map of Ink on Paper taken from EDS detector position 2. The ink is raised on surface of paper and the result is a shadow where C X-rays are blocked by the topography of the sample from reaching the detector.</p> <p>Finally, the accelerating voltage must be high enough for efficient excitation of the X-ray lines for the elements present in the sample and there should be sufficient probe current to generate a statistically significant X-ray count rate. What is typical is to choose an accelerating voltage that is 1.5 to 2 times higher in energy than the energy of the X-Ray lines that is of interest. For an unknown sample, 15kV to 20kV is recommended. Deviation from any of these conditions will contribute to errors in the quantitative analysis results.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%205.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=LRgblLX28XR7oK0SiJ9FWwpRTiw%3D" /><br /> <strong>Figure 4</strong>: Example: EDS Standardless Quantitative Results – Gold Alloy</p> <p style="margin-left: 40px;">Acquisition Condition<br /> Volt : 20.00 kV<br /> Live time : 203.01 sec.<br /> Real Time : 244.76 sec.<br /> DeadTime : 17.00 %<br /> Count Rate : 11546.00 CPS</p> Choose the Right SEM − Analysis Editionhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/choose-the-right-sem-analysis-editionIT500Wed, 23 Jun 2021 13:12:28 GMTThe holy grail of nanoscale analysis with EDS is to quickly analyze any features which can be imaged in the SEM. However, for nanoscale features this is complicated by that fact that X-ray spatial resolution is typically larger than SEM imaging resolution. Figure 1 shows EDS maps from an integrated circuit cross section at 15kV and 6kV using a W SEM and an FE SEM, as well as the approximate X-ray signal depths at those voltages.<script> /* * rwdImageMaps jQuery plugin v1.6 * * Allows image maps to be used in a responsive design by recalculating the area coordinates to match the actual image size on load and window.resize * * Copyright (c) 2016 Matt Stow * https://github.com/stowball/jQuery-rwdImageMaps * http://mattstow.com * Licensed under the MIT license */ ; (function(a){ a.fn.rwdImageMaps=function(){ var c=this; var b=function(){ c.each(function(){ if(typeof(a(this).attr("usemap"))=="undefined"){ return} var e=this,d=a(e); a("<img />").on('load',function(){ var g="width",m="height",n=d.attr(g),j=d.attr(m); if(!n||!j){ var o=new Image(); o.src=d.attr("src"); if(!n){ n=o.width} if(!j){ j=o.height} } var f=d.width()/100,k=d.height()/100,i=d.attr("usemap").replace("#",""),l="coords"; a('map[name="'+i+'"]').find("area").each(function(){ var r=a(this); if(!r.data(l)){ r.data(l,r.attr(l))} var q=r.data(l).split(","),p=new Array(q.length); for(var h=0;h<p.length;++h){ if(h%2===0){ p[h]=parseInt(((q[h]/n)*100)*f)} else{ p[h]=parseInt(((q[h]/j)*100)*k)} } r.attr(l,p.toString())} )} ).attr("src",d.attr("src"))} )}; a(window).resize(b).trigger("resize"); return this} } )(jQuery); </script> <p>The holy grail of nanoscale analysis with EDS is to quickly analyze any features which can be imaged in the SEM. However, for nanoscale features this is complicated by that fact that X-ray spatial resolution is typically larger than SEM imaging resolution. Figure 1 shows EDS maps from an integrated circuit cross section at 15kV and 6kV using a W SEM and an FE SEM, as well as the approximate X-ray signal depths at those voltages.</p> <p style="text-align: center;"><strong><img alt="" class="img-responsive" data-gjs-type="image" draggable="true" loading="lazy" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20Analysis%20SEM%20Comparisons%20FE.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=duF%2FCUCiG3RtDqxt%2BSWglqbOvhA%3D" usemap="#AnalysisMap" /><br /> Figure 1</strong>: EDS maps (same count rate/total time) from IC cross section at 15kV and 6kV using a W SEM and an FE SEM.</p> <p><map name="AnalysisMap"><area coords="337,4,770,148" href="https://fast.wistia.com/embed/channel/121ptvxx1o" shape="rect" /> <area coords="791,4,1230,151" href="https://fast.wistia.com/embed/channel/xe5ehq9rf7" shape="rect" /></map><script> $('img[usemap]').rwdImageMaps(); </script></p> <p>The W SEM is suitable for analysis of larger structures (hundreds of nm). Lowering kV allows for a smaller X-ray signal depth within the sample and thus higher X-ray spatial resolution (see the O and Al maps). If ultra-high X-ray spatial resolution is needed to resolve ~50nm layers (see the Ti maps), then an FE SEM is the best option, since FE emitters maintain a very small spot size even at low kV. Table 1 shows a comparison of some relevant parameters between thermionic tungsten emitters and Schottky field emission emitters.</p> <table class="table"> <tbody> <tr> <th>Parameters</th> <th>Thermionic Tungsten</th> <th>Schottky Field Emission</th> </tr> <tr> <td>Brightness (A cm<sup>-2</sup>sr<sup>-1</sup></td> <td>10<sup>5</sup></td> <td>10<sup>7</sup>-10<sup>8</sup></td> </tr> <tr> <td>Energy spread (eV)</td> <td>1-3</td> <td>0.5-0.6</td> </tr> <tr> <td>Life time</td> <td>~100 h</td> <td>~3 years or longer</td> </tr> </tbody> </table> <p style="text-align: center;"><strong>Table 1</strong>: A comparison of parameters between thermionic tungsten and Schottky field emission emitters.</p> Compact, Analytical SEM-EDS: JEOL’s Latest Generation InTouchScope™ JSM-IT200LAhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/compact-analytical-sem-eds-jeols-latest-generation-intouchscope-jsm-it200laIT200Thu, 18 Feb 2021 14:57:28 GMTThe JSM-IT200LA SEM delivers the ultimate user experience for high through- put imaging and elemental analysis. An embedded color camera simplifies specimen navigation, advanced automation delivers crisp secondary and backscatter images in seconds, and Real-Time (Live) EDS provides instant feedback of the specimen composition for intuitive operation at any experi- ence level. This All-in-One SEM also includes high and low vacuum modes for observation of a wide range of specimen types without compromise. All of this is delivered at a great value.<h4>Easy, Accessible SEM</h4> <p>The JSM-IT200LA SEM delivers the ultimate user experience for high through- put imaging and elemental analysis. An embedded color camera simplifies specimen navigation, advanced automation delivers crisp secondary and backscatter images in seconds, and Real-Time (Live) EDS provides instant feedback of the specimen composition for intuitive operation at any experi- ence level. This All-in-One SEM also includes high and low vacuum modes for observation of a wide range of specimen types without compromise. All of this is delivered at a great value.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JSM-IT200LA.1.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=Lm7xe88BsL4YyEfjUhgd0oN2Xmc%3D" /></p> <h2>Upgraded Configuration and Features</h2> <h3>Stage Navigation System</h3> <ul> <li>Two (2) high resolution cameras for specimen navigation.</li> <li>The Stage Navigation System camera captures an image of the specimen mounted on stage. Point and click to the area of interest.</li> <li>A second Chamber Scope camera shows a side view position in relation to detectors and objective lens.</li> </ul> <h3>Zeromag for Seamless Transition from Color Image to SEM Image</h3> <p>With Zeromag, the optical image is linked with the SEM image for effortless navigation. Zoom in and automatically transition from the optical image to the live SEM image. Areas analyzed are displayed on the image or holder graphic for an instant map of analysis locations. Additionally, Live Analysis with our fully-embedded EDS (Real-Time EDS) provides an instant view of the element composition.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JSM-IT200LA.2.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=URVc4evU2N8wPHfj9L5quWJJ8bE%3D" /></p> <h3>Embedded EDS with Live Analysis</h3> <ul> <li>Real-Time display of spectrum and element composition all in the main software interface.</li> <li>Includes large area EDS (60mm2) detector for collection of data on even the most sensitive samples in half the time.</li> <li>SEM and EDS made and supported by JEOL for guaranteed uptime and rapid service and support.</li> </ul> <h3>Automation</h3> <ul> <li>Advanced algorithms for gun saturation & alignment, focus, astigmatism adjustment</li> <li>Large-area image and EDS montage</li> <li>EDS spectra and maps from multiple specimens or areas</li> </ul> <h3>Intuitive Software Interface</h3> <p><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JSM-IT200LA.3.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=0PvsbtYmkKXU2WWCauQT3AENkoQ%3D" /></p> <h3>Specimen Exchange Navi - Guided Operation</h3> <p>Guides beginner users with step-by-step operation from sample introduction, condition setting to automatic image formation.</p> <h3>Smile View™ Lab - Data Management</h3> <ul> <li>Embedded central data management that links the optical image, SEM images and EDS data for easy reporting.</li> </ul> <h3>3D-Sight - 3Dimensional Software Images</h3> <ul> <li>Automatic 3D surface reconstruction enhances the view of complex microstructures.</li> </ul> <p><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JSM-IT200LA.4.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=R0cBPx1CvUfaI3%2FYOD8PpxznHSA%3D" /></p> Cryo Block for SEMhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/cryo-block-for-semIT200Fri, 15 Sep 2023 11:00:00 GMTCryo-SEM imaging is a powerful tool in studying the structures of electron beam and vacuum sensitive materials. These materials include: fragile biological structures such as fungi, plants, cells, etc. as well as soft or volatile samples and even liquids. Cryo-SEM offers some clear advantages by rapidly freezing a sample prior to imaging, thus maintaining the sample as close as possible to its natural state. Long dehydration and chemical fixation steps can be avoided. Inhibiting dehydration helps maintain delicate structures without shrinkage. Moreover, volatile or even liquid samples are stabilized under the electron beam. Cryo fracturing techniques allow for study of the internal microstructure of these types of vulnerable materials as well.<h3>SMART – POWERFUL – FLEXIBLE</h3> <p>Cryo-SEM imaging is a powerful tool in studying the structures of electron beam and vacuum sensitive materials. These materials include: fragile biological structures such as fungi, plants, cells, etc. as well as soft or volatile samples and even liquids. Cryo-SEM offers some clear advantages by rapidly freezing a sample prior to imaging, thus maintaining the sample as close as possible to its natural state. Long dehydration and chemical fixation steps can be avoided. Inhibiting dehydration helps maintain delicate structures without shrinkage. Moreover, volatile or even liquid samples are stabilized under the electron beam. Cryo fracturing techniques allow for study of the internal microstructure of these types of vulnerable materials as well. A few of the disadvantages are that for efficient freezing, the sample size must be small and the price may not be in everyone’s budget for a state-of-the-art cryo system with freezing station, cold stage, vacuum transfer system etc.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Poor%20Man's%20Cryo-SEM%201.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=oEkLBSoy8YUCLOFyw7uz5vvaIgg%3D" /><br /> <strong>Figure 1</strong>: Polymer screws isolate cryo-stub from holder</p> <p>A low cost alternative to a complete cryo-system that has been demonstrated to provide good results for many applications is a simple Cryo Block. The technique is a simple and cost effective means of looking at fully hydrated materials or other electron beam and vacuum sensitive samples. It involves pre-freezing a Cryo Block in liquid nitrogen and then contact freezing the sample prior to placing it in the SEM. The advantage of this technique is that it is simple, cost effective and the sample will in situ freeze dry in the SEM. The disadvantage is that there is no temperature control and the sample will in situ freeze dry inside the SEM.</p> <p>The supplies you’ll need are a thermos container or something suitable to put a small amount of liquid nitrogen in, a Cryo Block and cryo-glue or clamps to fix your sample to the stub.</p> <p>The sample preparation procedure is as follows:</p> <ol> <li>Immerse the Cryo-Stub in liquid nitrogen and let it equilibrate</li> <li>Once fully cooled, remove the Cryo-Stub and quickly contact freeze your sample and place inside the SEM</li> <li>Image as normal. It is helpful to insulate your cooled brass block from the basic holder –simple teflon screws or spacers would provide such insulation.</li> </ol> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Poor%20Man's%20Cryo-SEM%202.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=ywxfnmpfd2fS5GNe71Z8KwKgRJo%3D" /><br /> <strong>Figure 2</strong>: Orchid- Stigma anther</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Poor%20Man's%20Cryo-SEM%203.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=VOzIDRf435NWKhxQMmSOvdZez7w%3D" /><br /> <strong>Figure 3</strong>: Sour cream</p> Electron Flight Simulator (EFS)https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/electron-flight-simulator-efsIT200Wed, 04 Nov 2020 12:14:24 GMTUtilizing Monte Carlo Modeling of electron trajectories Electron Flight Simulator is a software tool designed to make your job easier. It can help you understand difficult samples, show the best way to run an analysis, and help explain results to others. With it you can see how the electron beam penetrates your sample, and where the X-ray signal comes from, for a wide variety of microscope conditions. You can model multiple layers, particles, defects, inclusions, and cross-sections. Any sample chemistry can be modeled.<p>Utilizing Monte Carlo Modeling of electron trajectories Electron Flight Simulator is a software tool designed to make your job easier. It can help you understand difficult samples, show the best way to run an analysis, and help explain results to others.</p> <p>With it you can see how the electron beam penetrates your sample, and where the X-ray signal comes from, for a wide variety of microscope conditions. You can model multiple layers, particles, defects, inclusions, and cross-sections. Any sample chemistry can be modeled.</p> <p class="caption" style="text-align:center;"><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Electron%20Flight%20Simulator%20PN-EFS%201.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=dvrgnxKOoKHFtSNkQF2oQeIcTOE%3D" /><br /> Bulk samples to particles on multi-layer samples or inclusions in bulk samples.</p> <p class="caption" style="text-align:center;"><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Electron%20Flight%20Simulator%20PN-EFS%202.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=Gh40DjckczbMdJEO6%2FfYMnKKk2U%3D" /><br /> Multi-layer samples normal to the beam or perpendicular in cross-section (or any angle in between).</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Electron%20Flight%20Simulator%20PN-EFS%203.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=t9RYFbNMGgJurU2qsAWEgK9091s%3D" /><br /> Electron beam scatter in low-vacuum.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Electron%20Flight%20Simulator%20PN-EFS%204.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=WJaMIUgsW8lgQfoUppCY5DpuIdw%3D" /><br /> The histogram shows beam intensity vs. lateral position. The green center indicates the radius of 80% of the beam.</p> <p>Simulation of:</p> <ul> <li>Electron trajectory in bulk or multi-layer sample</li> <li>Electron trajectory of particle or inclusion</li> <li>X-ray generation point indication</li> <li>PhiRhoZ curve</li> <li>EDS simulated spectrum</li> <li>Electron trajectory under low vacuum</li> </ul> <p>System Requirements:</p> <ul> <li>Computer: MS Windows 7 Based Computer</li> <li>MS Visual Basic 6 run time package</li> </ul> <p><strong>EFS part number: 803091761</strong></p> Environmental Airlock for JSM-IT210 Series SEMhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/environmental-airlock-for-jsm-it210-series-semIT200Tue, 16 Jan 2024 07:47:33 GMTThe JEOL Environmental Airlock system allows for the simple transfer of reactive specimens to the SEM without being exposed to air. For specimens where any exposure to air or moisture can alter or destroy the structure, this system provides a cost effective and simple method to bring specimens from a glove box directly to the SEM.<p><img alt="JEOL Environmental Airlock system" src="https://jeolusa.s3.amazonaws.com/resources_eo/Environmental%20Airlock%20for%20JSM-IT210%20Series%20SEM%2001.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=8aeKGNmU0fvpExvlJOKYm6rCR7g%3D" /></p> <p>The JEOL Environmental Airlock system allows for the simple transfer of reactive specimens to the SEM without being exposed to air. For specimens where any exposure to air or moisture can alter or destroy the structure, this system provides a cost effective and simple method to bring specimens from a glove box directly to the SEM.</p> <p>Compatible with the Transfer Vessel used with our Cooling Cross Section Polisher™ (CCP), this system enables a full air-isolated workflow from specimen preparation to SEM imaging and analysis.</p> <p>The Environmental Airlock system fits the Low Vacuum Secondary Electron port on the right side of the SEM chamber and installation is quick with just 4 bolts. The cap removal assembly is integrated with the Airlock and is used to remove/attach the air-tight cap of the Environmental Cell Specimen Holder. Easy manual control of Airlock and Environmental Cell requires no additional software for installation or operation. The dovetail design ensures smooth specimen exchange. The cap removal assembly uses a plunger and threaded screw to remove/attach the cap from the Environmental Cell Specimen Holder.</p> <h2>Key Features</h2> <table class="table"> <tbody> <tr> <td><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Environmental%20Airlock%20for%20JSM-IT210%20Series%20SEM%2002.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=lRULidMrk%2BjgrBM2373pnS8%2FixY%3D" style="height: 217px; width: 300px;" /></td> <td> <ul> <li>Specimen transfer in an inert gas atmosphere (argon gas) ensures specimen integrity from preparation to analysis.</li> <li>Environmental Cell Specimen Holder accepts specimens as large as 32mm in diameter. Fits standard 32mm SEM specimen mounts.</li> <li>Compatible with CCP Transfer Vessel for analyzing pristine cross sections using broad argon ion milling.</li> <li>Easy specimen exchange – Store Exchange Position from SEM software interface for transfer in minutes.</li> </ul> </td> </tr> </tbody> </table> <p><strong>Configuration:</strong></p> <p>JU2017438    Environmental Airlock for IT210 LVSED Port – CP Compatible<br /> JU2015274    Environmental Cell Specimen Holder<br /> JU2010448    Environmental Cell Specimen Stub – Top Referencing (32mm diameter)</p> <p><strong>Applicable Models:</strong></p> <p>JSM-IT210 series, JSM-IT200 series, JSM-IT100 series, JSM-IT6010 series</p> <p>For additional models, contact your local Sales representative.</p> JEOL SEM and Remote Viewing-Controlhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/jeol-sem-and-remote-viewing-controlIT200Wed, 04 Nov 2020 12:33:08 GMTJEOL SEMs are delivered with the capability for remote viewing and remote operation. The SEM computer includes a 2nd ethernet card for connection to your local area network. There is no need for a second support computer. Just connect your JEOL SEM computer to a reliable and fast broadband internet connection and choose the software platform that meets your remote access requirements.<p><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20SEM%20Remote%20Viewing-Control%201.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=Q6xV%2BhODW1h%2FtLAd4LCRCl07HJs%3D" style="margin: 6px 12px; float: right;" />Remote work has grown rapidly over the past decade. Changing social and business trends, advances in technology and necessity have facilitated this growth and this growth is expected to continue. Participation within the scientific community is especially strong and can be seen in a variety of ways such as: educational outreach programs, training, collaboration with teams at different locations, communicating with outside customers and even virtual scientific conferences.</p> <p>JEOL SEMs are delivered with the capability for remote viewing and remote operation. The SEM computer includes a 2nd ethernet card for connection to your local area network. There is no need for a second support computer. Just connect your JEOL SEM computer to a reliable and fast broadband internet connection and choose the software platform that meets your remote access requirements.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20SEM%20Remote%20Viewing-Control%202.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=2NDBu1KsJekSTlgTXh8zxQ7x8wQ%3D" /></p> <p>There are a host of software applications to choose from. Some are free and others will have either a one-time fee or are subscription based. Many remote desktop applications, screen sharing applications or video conferencing applications are compatible. When choosing which platform is right for you, consider whether you want to control the SEM remotely or just share the screen. Also consider how many simultaneous remote connections you may need at one time. There are simple peer-to-peer options or the ability to host a webinar type session with many attendees.</p> <p>Some examples of software applications for remote access, viewing or control include:</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20SEM%20Remote%20Viewing-Control%203.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=RInLs2ds3nSHmCWzXFr6QN%2Bax9k%3D" /></p> <p>Whether bringing SEM into your virtual class room or collaborating with teams across the globe, remote viewing and control of your JEOL SEM is ready.</p>