JEOL Resources

A Note on Magnification

Mon, 02 Nov 2020 12:04:09 GMT

JEOL Technical Note

Magnification is defined as the ratio of the size of the rastered area on the sample to the size of the rastered area of the output, as is shown in Figure 1. Traditionally, the output size was defined as a Polaroid 4x5 film size by all vendors and results were easy to compare. However, since images are now collected digitally and can be output at various sizes, this “output size” is ill-defined. SEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.

Figure 1: A small raster on the specimen leads to a large magnification for the same output size.

The SEM images of hematite from two different SEM manufacturers below illustrate this point. The left image is from a JEOL SEM and has a magnification labeled as 75,000 X with a 100 nm micron bar. The right image is from another SEM manufacturer and has a magnification labeled as 150,000 X with the exact same length 100 nm scale bar (highlighted in red). This shows that the enlargement of the sample is identical in the two images, even though the magnification value stated by the other SEM manufacturer is twice that of the JEOL image.

Figure 2: SEM images of hematite with the same enlargement of the sample despite having different magnification values stated. Left image: From a JEOL SEM Right image: From a different SEM manufacturer

Automated Imaging Solutions for SEM

Wed, 03 Jan 2024 16:50:43 GMT

Automation of routine imaging in Scanning Electron Microscopy (SEM) has gained significant popularity over recent years. Automation provides users with additional levels of flexibility, including unattended and remote operation, as well as repeatability of their measurements. This ability maximizes productivity and sample throughput and significantly lowers the level of expertise required to proficiently operate SEMs. JEOL now offers both simple and advanced automation solutions, giving users the capability to develop protocols that fit their exact imaging needs. When paired with best-in- class AI-driven auto-function technology (auto focus, auto astigmatism correction, auto brightness/contrast), JEOL’s automation solutions are fast, reliable, reproducible, and applicable to a wide range of applications.

Simple Automation with Simple SEM

Simple SEM, JEOL’s latest advancement in automated imaging solutions, is a fully-integrated interface for creating and implementing imaging routines (Figure 1) without the need for programing experience. Users have the ability to develop custom automated workflows, including acquisition of SEM images and EDS data at a series of magnifications and locations on the sample surface and with varying operating conditions (accelerating voltage, probe current). Simply checking a box enables JEOL’s best-in-class auto-functions, with the added flexibility to control how often these functions are utilized within the workflow. Once routines are created, they are automatically saved and can be quickly implemented by simply selecting the area(s) on the sample that the user wants to characterize directly from a live image or ZeroMag view.

Simple SEM is available as part of the standard software package on JEOL’s JSM-IT210, JSM-IT510 and JSM-IT710 SEM models.

Figure 1. Simple SEM is fully integrated within JEOL’s SEM control software, creating an intuitive environment for users to develop automation workflows without any need for programing experience.

Compatible Instruments: JSM-IT210, JSM-IT510, JSM-IT710HR
Options: integration with JEOL EDS

Advanced Automation with Python and C#

For customers with more unique or challenging imaging demands, JEOL continues offers advanced external SEM control using Python or C# (Figure 2). This gives users the flexibility to fully develop and customize imaging protocols and interfaces, optimize acquisition at any operating conditions, automate image processing, and even integrate machine learning (Figure 3).

Figure 2. JEOL offers full external microscope control using Python and C#, allowing users to develop custom interfaces and automation programs. A full library of functions is available upon request.

Figure 3. External control allows users to develop custom interfaces and programs and integrate complex automation routines.

External control with Python (3.5.1 or later) and C# available with all current JEOL SEM models. Additional compatible SEM models are available upon request.

Lithium Ion Battery Note

Mon, 04 Mar 2024 10:42:25 GMT

The applications for lithium ion batteries (LIB) cover a wide range, from power sources for personal computers and mobile devices to automobiles, and there is always a demand for even better performance and safety. In order to ensure the performance and quality of LIB, analysis and evaluation using high-performance assessment systems is necessary. JEOL offers a full line-up of equipment to support the development of new LIB technologies and to improve product quality, including instruments for morphology observation and surface analysis, chemical analysis systems to perform structural analysis on a molecular level, as well as fabrication systems to create high-performance coatings and powders. This LIB note offers solutions for researchers and engineers who are looking for the best equipment for their application.