JEOL Resourceshttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-DownloadsA Note on Magnificationhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/a-note-on-magnificationIT200Mon, 02 Nov 2020 12:04:09 GMTSEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.<h4>JEOL Technical Note</h4> <p>Magnification is defined as the ratio of the size of the rastered area on the sample to the size of the rastered area of the output, as is shown in Figure 1. Traditionally, the output size was defined as a Polaroid 4x5 film size by all vendors and results were easy to compare. However, since images are now collected digitally and can be output at various sizes, this “output size” is ill-defined. SEM manufacturers can choose different output sizes for their images, making magnification a very deceptive number when comparing SEM micrographs from different SEM manufacturers. Because of this fact, the best way to compare images is to compare the length of the micron bar or field of view.</p> <p class="caption" style="text-align: center;"><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/A%20Note%20on%20Magnification%20fig1.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=qwBAKbK5vdFXBnMuqKvDTHaPuWU%3D" /><br /> <strong>Figure 1</strong>: A small raster on the specimen leads to a large magnification for the same output size.</p> <p>The SEM images of hematite from two different SEM manufacturers below illustrate this point. The left image is from a JEOL SEM and has a magnification labeled as 75,000 X with a 100 nm micron bar. The right image is from another SEM manufacturer and has a magnification labeled as 150,000 X with the exact same length 100 nm scale bar (highlighted in red). This shows that the enlargement of the sample is identical in the two images, even though the magnification value stated by the other SEM manufacturer is twice that of the JEOL image.</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/A%20Note%20on%20Magnification%20fig2.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=ee9XnW4z%2FNODAGjnIrjYn%2B%2Bz9%2Fg%3D" /><br /> <strong>Figure 2</strong>: SEM images of hematite with the same enlargement of the sample despite having different magnification values stated. Left image: From a JEOL SEM Right image: From a different SEM manufacturer</p> Advantages of Benchtop Scanning Electron Microscopy vs. Optical Microscopy for Pharmaceutical Applicationshttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/advantages-benchtop-scanning-electron-microscopy-vs-optical-microscopy-pharmaceutical-applicationsNeoScope™ Benchtop SEMSat, 20 Jan 2024 20:32:17 GMTWith the JEOL NeoScope Benchtop SEM, pharmaceutical companies gain a robust and versatile tool for analyzing substance morphology, topography and composition right from within their own laboratory environment. The small footprint and intuitive operation make it easy for any lab personnel to conduct the high resolution imaging and analysis that only an SEM can deliver.<p style="text-align: center;"><img alt="Optical microscope image (left) vs. Scanning Electron Microscope (SEM) image (right) of pharmaceutical tablet." src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2001.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=3WkDMib5MNxdPqWaX7HBAWoAOQM%3D" /><br /> <em>Optical microscope image (left) vs. Scanning Electron Microscope (SEM) image (right) of pharmaceutical tablet.</em></p> <p>Throughout the discovery and manufacturing phases of bringing pharmaceuticals to market, scanning electron microscopy (SEM) plays a pivotal role in design and quality control. For visual inspection, the benchtop SEM far surpasses the capabilities of traditional optical or light microscopy with its large depth of field and functionality.</p> <h2>Quality Imaging and Resolution</h2> <p>With SEM it is possible to observe the compositional contrast that cannot be seen on an optical image.  Examination of a pharmaceutical tablet or powder sample in the benchtop SEM reveals greater detail and compositional contrast than can be achieved with optical microscopes, even at the same magnification. With magnification up to 100,000X and versatile, automated settings, the SEM makes it possible to easily inspect the microstructure of tablets and powders, textures and coatings, foreign particles, and their chemical composition. Using the benchtop SEM, it is possible to identify the source of contamination from manufacturing processes.</p> <p style="text-align: center;"><img alt="SEM Image and EDS Analysis of Foreign Particle Contaminants (Metal and Glass)" src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2002.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=VLhUOFnWILszIhCI5WxCxXOJpV8%3D" /><br /> <em>SEM Image and EDS Analysis of Foreign Particle Contaminants (Metal and Glass)</em></p> <p>The JEOL benchtop SEM offers 100,000X magnification and selectable settings for imaging: backscattered electrons to reveal morphology and topography and give insight as to composition, or secondary electrons to reveal surface topography.</p> <p>Adding to these characterization capabilities, the JEOL NeoScope SEM has a 3D imaging feature for surface reconstruction using the multi-segmented BSE detector and automated montaging for high resolution view of a larger area.</p> <p style="text-align: center;"><img alt="Live 3D Surface Reconstruction – Pharmaceutical Tablet" src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2003.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=r9kLWcCKeTqw3vVQ%2BHO545XSSkc%3D" /><br /> Live 3D Surface Reconstruction – Pharmaceutical Tablet</p> <table class="table"> <tbody> <tr> <td><img alt="Specimen: Pharmaceutical Tablet" src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2004.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=EgrfB0bPAs1zukI0r%2FmAXd9PeeY%3D" style="width: 500px; height: 419px;" /></td> <td>Specimen: Pharmaceutical Tablet<br /> Montage – Composite Image<br /> Signal BED-C<br /> Landing Voltage 10.0 kV<br /> FOV 5.803 x 4.352 mm<br /> Number of Fields 4 x 4<br /> Field Magnification x75</td> </tr> </tbody> </table> <p>When configured with analytical capabilities, the SEM conducts real-time chemical analysis using Energy Dispersive Spectroscopy (EDS). The operator can view EDS spectra in real time, set the analysis points, areas of interest, and map position.</p> <table class="table"> <tbody> <tr> <td><img alt="EDS composite map of elements in Lantoprazole, a heartburn medication." src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2005.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=LVaUoh5xHrmgHGy8wXoZZ0Hysu4%3D" style="height: 276px; width: 500px;" /></td> <td>EDS composite map of elements in Lantoprazole, a heartburn medication.</td> </tr> </tbody> </table> <p>In most pharmaceutical products, drug molecules are present in a particulate, crystalline form. The Benchtop SEM can analyze the size, shape, purity, and other characteristics of a drug crystal to help predict its behavior in large-scale production. The characterization of these crystals can be used to guide the optimization of process parameters, minimizing manufacturing costs.</p> <p style="text-align: center;"><img alt="Insulin particles Au coated and imaged with the JEOL NeoScope Benchtop SEM." src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2006.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=13jJtD6rq060j4yYJOo7PZS5jp8%3D" /><br /> <em>Insulin particles Au coated and imaged with the JEOL NeoScope Benchtop SEM.</em></p> <p>JEOL’s <a href="/PRODUCTS/Scanning-Electron-Microscopes-SEM/Benchtop/NeoScope-Benchtop-SEM">NeoScope Benchtop SEM</a> features simple navigation software, auto functions, selectable High and Low Vacuum modes, and integrated management of data collected through imaging and elemental analysis.</p> <p style="text-align: center;"><img alt="JEOL 4th generation NeoScope Benchtop SEM." src="https://jeolusa.s3.amazonaws.com/resources_eo/NeoScope%20for%20pharmaceuticals%2007.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=LEgrMtTyOZzLctPIevsVLYDGEP8%3D" /><br /> <em>JEOL 4th generation NeoScope Benchtop SEM.</em></p> <p>With the JEOL NeoScope Benchtop SEM, pharmaceutical companies gain a robust and versatile tool for analyzing substance morphology, topography and composition right from within their own laboratory environment. The small footprint and intuitive operation make it easy for any lab personnel to conduct the high resolution imaging and analysis that only an SEM can deliver.</p> Can I Trust My Quantitative EDS Data?https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/can-i-trust-my-quantitative-eds-dataIT200Mon, 02 Nov 2020 17:48:37 GMTScanning electron microscopes (SEM) coupled with an energy dispersive X-ray detector (EDS) are used extensively to provide insight into a sample’s chemical makeup. This SEM-EDS technique can provide information on the elements present, their relative concentrations and spatial distribution over very small volumes (micron and some instances nanometer scale).<p>NOTES ON STANDARDLESS QUANTITATIVE EDS IN SEM</p> <p>Scanning electron microscopes (SEM) coupled with an energy dispersive X-ray detector (EDS) are used extensively to provide insight into a sample’s chemical makeup. This SEM-EDS technique can provide information on the elements present, their relative concentrations and spatial distribution over very small volumes (micron and some instances nanometer scale).</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%201.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=iHeVhLBcmf2p1U5phWwmVO7q5BE%3D" /></p> <p>EDS, in general, is considered a semi quantitative elemental analysis technique. We are often asked how reliable are the quantitative results using SEM-EDS. This is a pretty broad question as it is dependent on a variety of factors including the sample matrix and morphology in addition to instrument considerations.</p> <p>So… what can be detected and how much? Modern systems are capable of detecting elements from Be to U. Detection limits are typically considered to be ≥1% for low atomic number elements (F to Be) and ≥0.1% (1000 ppm) for higher atomic number elements.</p> <p>One of the most common techniques used for quantitative EDS analyses is a method often described as Standardless quantitative EDS. With this method, the user does not use physical standards but instead uses a ratio of peak intensities to determine the relative abundance of the elements detected. The peak intensities are corrected for background and matrix effects and the results are then normalized to 100% based on the elements detected. This normalization can hide errors in the analysis results. With that said, if all criteria are met, one can expect around ±2% to ±5% relative for major components. However, this error can increase significantly for particles or rough surfaces.</p> <p>So, what are the criteria to consider when performing EDS quantitative analysis? Several assumptions are made with this technique regardless of whether the quantitative method is ‘Standardless’ or with physical standards. First, the sample is polished and flat. It is also homogeneous and infinitely thick relative to the beam interaction volume. If the sample is not homogeneous with respect to the beam interaction volume, the results may vary based on the contribution of neighboring components (Figure 1).</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%202.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=BtDfGCccxIm7elmvNbElmv209jg%3D" /><br /> <strong>Figure 1</strong>: A: Homogeneous sample within the beam scattering volume. B: Heterogeneous sample, a particle within the scattering volume will contribute to EDS quantitative results</p> <p>On the other hand, it may be particles or inclusions that you are trying to identify and quantify. By placing the beam on the particle, you may get a contribution from the surrounding matrix if the scattering volume is larger than the particle itself. For non-uniform materials it is good practice to collect spectra from several different areas and average the results.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%203.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=b3qC0e1VkfJ62zHvLYKBlM60vDQ%3D" /><br /> <strong>Figure 2</strong>: A: X-rays are blocked from reaching the detector by sample topography. B: Rotating the stage presents the region of interest in sight of the EDS detector allowing the X-rays to be detected.</p> <p>Only those X-rays that are within line of sight to the EDS detector are collected. If the sample has significant topography, the X-rays can be blocked entirely and not reach the detector. Or, in some instances, low energy X-rays may be absorbed by the sample matrix more than higher energy X-rays contributing to error in the quantitative results.</p> <p>When dealing with a topographic sample, it is important to understand the sample position with respect to the EDS detector position. It is often possible to position the region of interest so that it has direct line of sight to the detector (Figure 2).</p> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%204.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=NZHYugmVDjNyUDZIVQdScSM6KuQ%3D" /><br /> <strong>Figure 3</strong>: Example of C X-ray Intensity Map of Ink on Paper taken from EDS detector position 2. The ink is raised on surface of paper and the result is a shadow where C X-rays are blocked by the topography of the sample from reaching the detector.</p> <p>Finally, the accelerating voltage must be high enough for efficient excitation of the X-ray lines for the elements present in the sample and there should be sufficient probe current to generate a statistically significant X-ray count rate. What is typical is to choose an accelerating voltage that is 1.5 to 2 times higher in energy than the energy of the X-Ray lines that is of interest. For an unknown sample, 15kV to 20kV is recommended. Deviation from any of these conditions will contribute to errors in the quantitative analysis results.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Can%20I%20Trust%20My%20Quantitative%20EDS%20Data%205.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=LRgblLX28XR7oK0SiJ9FWwpRTiw%3D" /><br /> <strong>Figure 4</strong>: Example: EDS Standardless Quantitative Results – Gold Alloy</p> <p style="margin-left: 40px;">Acquisition Condition<br /> Volt : 20.00 kV<br /> Live time : 203.01 sec.<br /> Real Time : 244.76 sec.<br /> DeadTime : 17.00 %<br /> Count Rate : 11546.00 CPS</p> Choose the Right SEM for Your Labhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/choose-the-right-sem-for-your-labNeoScope™ Benchtop SEMThu, 04 Feb 2021 05:12:17 GMTBiological SEM comparisons and Materials SEM comparisons<script> /* * rwdImageMaps jQuery plugin v1.6 * * Allows image maps to be used in a responsive design by recalculating the area coordinates to match the actual image size on load and window.resize * * Copyright (c) 2016 Matt Stow * https://github.com/stowball/jQuery-rwdImageMaps * http://mattstow.com * Licensed under the MIT license */ ; (function(a){ a.fn.rwdImageMaps=function(){ var c=this; var b=function(){ c.each(function(){ if(typeof(a(this).attr("usemap"))=="undefined"){ return} var e=this,d=a(e); a("<img />").on('load',function(){ var g="width",m="height",n=d.attr(g),j=d.attr(m); if(!n||!j){ var o=new Image(); o.src=d.attr("src"); if(!n){ n=o.width} if(!j){ j=o.height} } var f=d.width()/100,k=d.height()/100,i=d.attr("usemap").replace("#",""),l="coords"; a('map[name="'+i+'"]').find("area").each(function(){ var r=a(this); if(!r.data(l)){ r.data(l,r.attr(l))} var q=r.data(l).split(","),p=new Array(q.length); for(var h=0;h<p.length;++h){ if(h%2===0){ p[h]=parseInt(((q[h]/n)*100)*f)} else{ p[h]=parseInt(((q[h]/j)*100)*k)} } r.attr(l,p.toString())} )} ).attr("src",d.attr("src"))} )}; a(window).resize(b).trigger("resize"); return this} } )(jQuery); </script> <h2>Biological SEM Comparisons</h2> <p style="text-align: center;"><img alt="" class="img-responsive" data-gjs-type="image" draggable="true" loading="lazy" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20Biological%20SEM%20Comparisons.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=dHDOrM%2F5qq%2FCpV6xpfbeDuDyN9c%3D" usemap="#BioMap" /></p> <p><map name="BioMap"><area coords="199,51,399,249" href="https://fast.wistia.com/embed/channel/9blz7xcp7c" shape="rect" /> <area coords="636,200" href="#" shape="poly" /> <area coords="455,13,683,247" href="https://fast.wistia.com/embed/channel/121ptvxx1o" shape="rect" /> <area coords="752,14,1000,251" href="https://fast.wistia.com/embed/channel/tujhlg1mss" shape="rect" /> <area coords="1045,12,1330,244" href="https://fast.wistia.com/embed/channel/xe5ehq9rf7" shape="rect" /></map><script> $('img[usemap]').rwdImageMaps(); </script></p> <h2>Materials SEM comparisons</h2> <p style="text-align: center;"><img alt="" class="img-responsive" data-gjs-type="image" draggable="true" loading="lazy" src="https://jeolusa.s3.amazonaws.com/resources_eo/JEOL%20Materials%20SEM%20Comparisons.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=UFtdy0dreaeT9%2B3IsKXxiOaSlFg%3D" usemap="#MaterialMap" /><map name="MaterialMap"><area coords="200,26,403,247" href="https://fast.wistia.com/embed/channel/9blz7xcp7c" shape="rect" /> <area coords="470,11,698,252" href="https://fast.wistia.com/embed/channel/121ptvxx1o" shape="rect" /> <area coords="753,13,1011,258" href="https://fast.wistia.com/embed/channel/tujhlg1mss" shape="rect" /> <area coords="1048,10,1284,261" href="https://fast.wistia.com/embed/channel/xe5ehq9rf7" shape="rect" /></map><script> $('img[usemap]').rwdImageMaps(); </script></p> <p>JEOL Intelligent SEM technology offers the best solutions for your imaging and analysis needs. Our suite of electron microscopes feature the most advanced electron optics in the industry. Combining our unique technology with advances in automation algorithms provides exceptional ease of use, automation, and streamlined workflow.</p> <p>Highlight Include:</p> <ul style="list-style-type:square;"> <li>Advanced AI for quick change of any SEM parameters</li> <li>Intuitive software interface</li> <li>Guaranteed instrument uptime</li> <li>Seamless navigation from optical to SEM image</li> <li>Automated montage collection</li> <li>Embedded chemical composition analysis</li> </ul> Compact Tabletop Imaging and Analysis Workflows – A Multidimensional Approachhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/compact-tabletop-imaging-and-analysis-workflows-a-multidimensional-approachNeoScope™ Benchtop SEMThu, 01 Jul 2021 09:31:30 GMTThe tabletop workflow solutions from JEOL allow researchers to setup a compact and user-friendly lab environment without compromising data integrity. This technology seamlessly guides the user from sample preparation to imaging, microanalysis and reporting.<p>The advent of new technologies and materials with specific properties designed and manifested at the sub-micron scale has ushered in an increased need to equip characterization labs with innovative -- yet compact -- scanning electron microscopy (SEM) and microanalysis (EDS or XRF) setups. The purpose of such a resource is to provide, in most cases, an easy-to-use platform that will serve as an initial step in materials characterization workflow. This SEM/EDS resource will perform full characterization of a specimen, requiring a high level of performance in terms of resolution, complimentary analytical detectors, and software for comprehensive analysis.</p> <p>Scanning electron microscopes are considered to be one of the most versatile and powerful tools for scientists because of their large depth of field (in comparison to optical microscopes), great spatial resolution (high magnification), and the capacity for chemical composition analysis via several types of spectroscopy. Visualization of specimen topography, microstructure, or establishing the cause of failure is achieved easily through a single image in some cases. Yet, it is often necessary to set up a multidimensional approach to be able to answer questions about material properties that will steer future technological progress.</p> <p>In such cases SEM provides unparalleled flexibility through the addition of an assortment of electrical, mechanical, and chemical test equipment making the instrument a self-contained ‘nano-laboratory.’ The JEOL tabletop SEM workflows enable new and more flexible approaches to the analysis of various types of materials, such as semiconductors, powders for additive manufacturing, and polymers, as well as unique approaches to 3D analysis in SEM.</p> <h3>From Macro to Nano – Seamless Navigation and Cross-Referencing</h3> <p>One of the requirements vital to researchers is the ability to connect microstructural defects or features to its micro and nanostructural properties. This could be key to understanding and improving upon the current material design. This new feature, ZEROMAG, enables the user to take a snapshot of the specimen (an optical image) prior to SEM observation, and then maneuver to a region of interest based on this image.</p> <p>The user can magnify the area to the requisite feature size and observe and chemically analyze the location with the SEM while retaining the optical image tag (see Fig. 1). This is remarkably useful for the observation of multiple specimens or multiple locations on the same specimen.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Compact%20Tabletop%20Imaging%20and%20Analysis%20Workflows%20001.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=937tHM%2FWGmEkkIAHaK05q9WYrAA%3D" /><br /> <strong>Figure 1:</strong> Linking optical image to SEM imaging and analysis via ZEROMAG function, showing multiple samples in position.</p> <h3>Real-time, Embedded Chemical Analysis with SEM</h3> <p><a href="https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/Benchtop/NeoScope-Benchtop-SEM">Neoscope</a> is a tabletop SEM that features a fully embedded and integrated Energy Dispersive X-Ray Spectroscopy (EDS) system that can tag specific locations with chemical analysis and offer real-time compositional data (point analysis or mapping) and spatial distribution of components at the micro and nanometer scale as the multiple samples or locations on the specimen are scanned.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Compact%20Tabletop%20Imaging%20and%20Analysis%20Workflows%20002.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=RQRqUBbeQqiOQfYRpA%2B71nahfxM%3D" /><br /> <strong>Figure 2:</strong> EDS Map - Pharma API for Drug Delivery</p> <h3>Particle and Fiber Analysis</h3> <p>SEM is well suited to perform particle and fiber analysis by providing a high-resolution view of the sample’s surface morphology and details on sizes and shapes. Integrated Energy Dispersive X-ray Spectroscopy (EDS) further allows the SEM to classify particles by their chemical type. To streamline this process, automation workflows are available for fast throughput and unattended operation. This enhances existing inspection capabilities in areas like automotive cleanliness, additive manufacturing, pharma, and energy.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Compact%20Tabletop%20Imaging%20and%20Analysis%20Workflows%20003.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=zFqv9xSlK3O5I8ORBcM6kM4qIVU%3D" /><br /> <strong>Figure 3:</strong> Particle Morphology for Additive Manufacturing</p> <h3>3D Analysis of Surfaces</h3> <p>Long depth of field related to SEM imaging has conventionally appealed to the researchers because of the fundamental ability to generate a more three-dimensional representation of the specimen surface in contrast to optical microscopy. There has been a concerted effort recently to take this capability even further, with various software and hardware solutions that provide not only qualitative but also a quantitative representation of the 3D nature of specimen surfaces.</p> <p>The proposed solutions range from simple composites of two or more stereo pair images (easily acquired through tilt series) to the actual redesign of detectors to obtain several images synchronously and merge those images to create a <a href="https://www.jeolusa.com/BLOG/basics-3d-electron-microscopy">LIVE 3D representation</a> of the specimen surface (Fig. 2) that can be easily tilted, rotated, and manipulated by the user.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Compact%20Tabletop%20Imaging%20and%20Analysis%20Workflows%20004.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=fX1IpfeGRc1vpCp9Avn%2FQRav%2F%2FQ%3D" /><br /> <strong>Figure 4:</strong> Live 3D surface morphology of star-shaped beach sand during SEM observation using a multi-segmented backscatter detector</p> <h3>Additional Workflow Components - Sample Preparation</h3> <p>SEM analysis integrity always relies on suitable sample preparation, which is an integral part of an efficient tabletop workflow. A compact <a href="https://www.jeolusa.com/PRODUCTS/Sample-Preparation-Tools/Smart-Coater">Smart Coater</a> makes it easy to quickly and consistently coat non-conductive specimens with either a metal or carbon coating layer prior to imaging. A tabletop broad ion beam specimen preparation device, the <a href="https://www.jeolusa.com/PRODUCTS/Sample-Preparation-Tools/Cross-Section-Polisher">Cross-section Polisher (CP)</a>, prepares pristine cross-sections of any type of material. CP users can utilize cryogenic and air isolated transfer mechanisms for preparation of temperature and environment sensitive materials. Moreover, users can easily coat their samples with metal or carbon in the CP prior to SEM analysis.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Compact%20Tabletop%20Imaging%20and%20Analysis%20Workflows%20005.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=5SFT4yiem%2BkOfQeD44vieOK22SQ%3D" /><br /> <strong>Figure 5:</strong> Paper face mask. A) High vacuum image (Au coated), B) 3D color image, C) SEM image of cross section, D) Cross section colorized to show outer layers and middle of sample.</p> <h3>Conclusion</h3> <p>The tabletop workflow solutions from JEOL allow researchers to setup a compact and user-friendly lab environment without compromising data integrity. This technology seamlessly guides the user from sample preparation to imaging, microanalysis and reporting.</p> How Benchtop SEM Can Benefit Energy Storage Applicationshttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/how-benchtop-sem-can-benefit-energy-storage-applications1NeoScope™ Benchtop SEMSat, 21 May 2022 18:08:18 GMTThe quest for renewable energy sources is prompting the development of technologies capable of tapping into alternative energy sources such as solar, wind, geothermal and tidal energy. To fully exploit these energy sources, engineers need novel ways of storing and converting these energies.<p>The quest for renewable energy sources is prompting the development of technologies capable of tapping into alternative energy sources such as solar, wind, geothermal and tidal energy. To fully exploit these energy sources, engineers need novel ways of storing and converting these energies.</p> <p><a href="https://www.jeolusa.com/BLOG/how-benchtop-sem-can-benefit-energy-storage-applications">View our blog post</a> to find out more:</p> <ul> <li>Characterization of Energy Storage Devices Using a Benchtop SEM</li> <li>Use Cases of a Benchtop SEM in Energy Storage Applications</li> <li>Benchtop SEM from JEOL</li> </ul> JCM-7000, NeoScope™ Benchtop SEM Live 3Dhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/jcm-7000-neoscope-benchtop-sem-live-3dNeoScope™ Benchtop SEMThu, 17 Jun 2021 11:39:55 GMTSEM is a natural extension to viewing specimens with an optical microscope due in part to its inherent higher depth of field and ability to resolve smaller microstructures. Creating a 3-dimensional (3D) surface model can further enhance our understanding with specimens that have complex topographical features.<h3><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Live%203D%20001.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=bPe4kj%2FXqw3KFSDpJ7njWpb4Z1U%3D" style="margin: 6px 12px; float: right; width: 128px; height: 157px;" />REAL-TIME 3D SURFACE RECONSTRUCTION WITH NEOSCOPE™</h3> <p>SEM is a natural extension to viewing specimens with an optical microscope due in part to its inherent higher depth of field and ability to resolve smaller microstructures. Creating a 3-dimensional (3D) surface model can further enhance our understanding with specimens that have complex topographical features.</p> <p>The JCM-7000 includes a high sensitivity, multi-segmented backscatter electron detector that allows for collection of multiple images simultaneously. These images are then combined to provide a 3D model of the surface in Real-Time as you navigate around the specimen. The Live 3D surface rendering can be tilted and rotated and the resulting 3D image output directly to a report.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Live%203D%20002.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=YZ2yA3pT22BX8HjqCQNZr984Dg0%3D" /><br /> <em>Live 3D Image - Pharmaceutical Tablet Surface</em></p> <p>With the addition of JEOL’s Smile View™ Map software not only qualitative but also quantitative texture information can be obtained and much more.</p> <p>Use Smile View™ Map to:</p> <ul> <li>Improve image quality</li> <li>Colorize SEM images</li> <li>Apply texture analysis to the 3D surface models</li> <li>Stitch images</li> <li>Correlate with data collected from other instruments or detectors</li> </ul> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Live%203D%20003.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=lPTm6U%2BUgnp%2BzhxlO6nekeVNQao%3D" /></p> Particle Analysis 3https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/particle-analysis-3IT200Wed, 04 Nov 2020 12:43:38 GMTJEOL’s Particle Analysis Software 3 (PA3) enhances the capability of your analytical SEM by automating the detection, EDS analysis and classification of particles, grains or other features in your samples. Fully integrated with our SEM-EDS systems, PA3 increases throughput and productivity by providing fast, unattended measurements across large areas of a sample, or multiple samples.<h4><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Particle%20Analysis%203.1.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=pIOOQIClcvEiGhh%2FAkvTK86bsyI%3D" style="margin: 5px 12px; float: right;" />PARTICLE ANALYSIS 3 (EX-36320PA3)</h4> <p>JEOL’s Particle Analysis Software 3 (PA3) enhances the capability of your analytical SEM by automating the detection, EDS analysis and classification of particles, grains or other features in your samples. Fully integrated with our SEM-EDS systems, PA3 increases throughput and productivity by providing fast, unattended measurements across large areas of a sample, or multiple samples.</p> <p>From manufacturing, quality management, product development and research, PA3 augments existing inspection capabilities at the micron and sub-micron scale. Areas that benefit from PA3 include: inclusions in metal alloys, automotive cleanliness, additive manufacturing, pharmaceutical products, identification of foreign substances, forensics (GSR) and electronics etc.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Particle%20Analysis%203.2.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=0YCLNp8EISoC7EnlTKwqLxebMEI%3D" /></p> <p>For routine analyses, recipes can be created which store specific configurations for particle detection and user-defined chemical classifications. Recipes simplify the setup and make it fast and easy for the less experienced user. Optional libraries are available that meet various industry standards such as:</p> <ul> <li><img alt="" src="https://jeolusa.s3.amazonaws.com/resources_eo/Particle%20Analysis%203.4.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=NDglxaizub8po3KvxWGeYvD8tMI%3D" style="margin: 5px 12px; float: right;" />Metal Feature Analysis (MFA) Library. For the analysis of inclusions in steel with classification and reporting that complies with ISO 4967.</li> <li>Road Vehicle Cleanliness (RVCLB) Library. For particle analysis from automotive parts with classification and reporting that complies with ISO 16232.</li> </ul> <p>Advanced functions are built-in for optimizing particle characterization routines and include: probe tracking, using shape information to include/exclude particles from EDS analyses, automatic gun axis alignment to control brightness changes and stopping the run once a specified number of particles are detected.</p> <p style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Particle%20Analysis%203.3.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=pe4KJuT7MJYxcn3657MQRnOwChM%3D" /></p> <p>Particle morphology and element composition results can be processed and viewed in multiple ways (histogram, scatter plots, Microsoft Excel, Word, PowerPoint, PDF) for reports adaptable to meet your requirements.</p> <p>Offline software is available to process data on another PC.</p> Quantitative Hyperspectral X-ray Map (QMap)https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/quantitative-hyperspectral-x-ray-map-qmapIT200Mon, 02 Nov 2020 20:43:14 GMTWhen a sample is exposed to the electron beam in a scanning electron microscope a variety of signals are generated. X-rays being one of those signals that can provide valuable insight into a materials chemical makeup. The collected X-ray signal includes background X-ray radiation and more importantly, X-rays of specific energies, that are characteristic of the elements present in the sample. For this reason, an energy dispersive X-ray detector (EDS) is one of the most common detectors that is added to a scanning electron microscope (SEM). It is used to not only determine the elements present in a sample but in many instances can give insight to the quantity as well as the spatial distribution of these elements over very small volumes.<p>When a sample is exposed to the electron beam in a scanning electron microscope a variety of signals are generated. X-rays being one of those signals that can provide valuable insight into a materials chemical makeup. The collected X-ray signal includes background X-ray radiation and more importantly, X-rays of specific energies, that are characteristic of the elements present in the sample. For this reason, an energy dispersive X-ray detector (EDS) is one of the most common detectors that is added to a scanning electron microscope (SEM). It is used to not only determine the elements present in a sample but in many instances can give insight to the quantity as well as the spatial distribution of these elements over very small volumes.</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Quantitative%20Hyperspectral%20X-ray%20Map%201.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=yHmWj7H83sSVCIbLgypI%2B5Men0w%3D" /><br /> <strong>Figure 1</strong>: Data Cube – Hyperspectral Imaging with EDS</p> <p>Most EDS systems today have the capability of hyperspectral imaging. An EDS spectrum is collected at each pixel in the map data set is stored as a large data cube (Figure 1). The data set can be reprocessed at any time. New element maps can be created and spectra can be extracted from different regions within the map. JEOL EDS systems include not only hyper spectral imaging but also can construct quantitative maps (QMap). A QMap can be instructive when characterizing your sample if you are experiencing high background or faced with peak overlaps. In QMap, a quantitative analysis is performed at each point in the map data set. This subtracts the background, and in many instances, can successfully deconvolute overlapping X-ray peaks. Some common peak overlaps with EDS systems are shown in Table 1 below.</p> <table class="table"> <tbody> <tr> <th>Element X-ray Line</th> <th>Interferes With</th> </tr> <tr> <td>S Kα & Kβ</td> <td>Mo Lα, Pb Mα</td> </tr> <tr> <td>Ti Kα</td> <td>Ba Lα</td> </tr> <tr> <td>Mn Kβ</td> <td>Fe Kα</td> </tr> <tr> <td>As Kα</td> <td>Pb Lα</td> </tr> <tr> <td>W Mα and Mβ</td> <td>Si Kα and Kβ</td> </tr> <tr> <td>Zr Lα</td> <td>P Kα</td> </tr> </tbody> </table> <p class="caption" style="text-align:center;"><strong>Table 2</strong>: Common X-ray Peak Overlaps with EDS</p> <p>To show the benefit of QMap in Hyperspectral Imaging, consider an example of a ceramic automotive brake pad. These pads are a complex mixture of many components where a major challenge in their manufacturing process is controlling the quantity and distribution of the individual ingredients. An SEM can play a key role in examining this distribution as well as investigating failures or wear.</p> <p>Figure 2 shows the EDS sum spectrum from a map data set. From the EDS sum spectrum, it is obvious that there are many components present. In this instance amongst the components both barium and titanium are detected.</p> <p>Since the X-ray lines for these elements overlap each other in an EDS system, the X-ray intensity maps for these elements appear to be the same. That is, the spatial distribution of the barium versus titanium components are not resolved (Figure 3)</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Quantitative%20Hyperspectral%20X-ray%20Map%202.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=HprohU%2B5ILcZb6MdZlY4C00krcU%3D" /><br /> <strong>Figure 3</strong>: Ceramic Brake Pad - Sum Spectrum from EDS Hyperspectral Imaging Data Set</p> <p>By processing the data to create a QMap, we can successfully de-convolute the barium and titanium X-ray lines to give a clear indication of the spatial distribution of these elements in this brake pad (Figure 4).</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Quantitative%20Hyperspectral%20X-ray%20Map%203.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=Ru8WsQ8h9Mlo2XyO4IuAU3n0EJc%3D" /><br /> <strong>Figure 4</strong>: Ceramic Brake Pad - X-ray Maps (Barium and Titanium X-ray Maps and Overall)</p> <p class="caption" style="text-align:center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Quantitative%20Hyperspectral%20X-ray%20Map%204.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=GKnnD0WJC99nWFMvtMZW92O%2F6tk%3D" /><br /> <strong>Figure 5</strong>: Ceramic Brake Pad Showing Barium and Titanium X-ray Maps Before and after QMap</p> Resolution in SEMhttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/resolution-in-semNeoScope™ Benchtop SEMMon, 02 Nov 2020 15:39:22 GMTThe first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard for determining SEM resolution. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution.<h4>JEOL Technical Note</h4> <p>The first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard for determining SEM resolution. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution.</p> <p>Two of the most common ways to determine resolution are by:</p> <ol> <li>Measuring the separation between two adjacent objects</li> <li>Collecting a line profile of the signal intensity changes across a sharp edge</li> </ol> <p class="caption" style="text-align: center;"><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Resolution%20in%20SEM%201.jpg?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=N7vKYkfG33KNyBGkL9a6wDdYQEM%3D" /><br /> <strong>Figure 1</strong>: SEM Image of a gold on carbon test sample</p> <p>JEOL has traditionally used a sample of small gold particles evaporated on a carbon substrate (Figure 1). With this type of sample, resolution is then determined by either measuring the separation between two adjacent gold particles or by evaluating the line profile of the signal intensity changes across a gold particle’s edge.</p> <p>These techniques are subjective in nature. Defining the edge of a particle will be different from one person to the next based on how that person interprets or ‘sees’ the edge of a particle. When using the line profile method, the distance for the signal transition is considered to be related to probe diameter. JEOL uses the traditional convention and measures at the 84th and 16th percentile of the transition (1 sigma value). This is not true for all manufacturers and values of 75<sup>th</sup>/25<sup>th</sup> and 65<sup>th</sup>/35<sup>th</sup> percentile have been reported by other vendors. As can be seen in Table 1, this leads to lower reported values of resolution even from the same edge profile in an image. Clearly, resolution specifications cannot be compared easily today between different manufacturers.</p> <table class="table"> <tbody> <tr> <td> </td> <td>84%</td> <td>75%</td> <td>65%</td> </tr> <tr> <td>Beam diameter (resolution)</td> <td>1.4 nm</td> <td>1.1 nm</td> <td>0.6 nm</td> </tr> </tbody> </table> <p class="table" style="text-align: center;"><strong>Table 1</strong>: Example showing the resolution determined from the same edge profile using three different percentiles to calculate the beam diameter.</p> <p>Another layer of complexity is added with digital image acquisition in today’s SEMs. The pixel resolution of the final image has an impact on the smallest features that can be resolved, meaning that the resolution measurement is intimately linked to the pixel size. Consider an image taken at 100,000X with a field of view of 1.28 um. If the image pixel resolution is 1280 X 960, then we have a pixel length of 1 nm/pixel. To distinguish a probe diameter of 3 nm would require image information that could be observed across only 3 pixels. Taking the same image with an increased pixel density of 2560 x 1920 would mean that the same information could be observed across 6 pixels.</p> <p class="caption" style="text-align: center;"><strong><img alt="" class="img-responsive" src="https://jeolusa.s3.amazonaws.com/resources_eo/Resolution%20in%20SEM%202.png?AWSAccessKeyId=AKIAQJOI4KIAZPDULHNL&Expires=2145934800&Signature=t8X%2Fw0pONBrOtSGi9i4%2BPwwj0Ss%3D" /><br /> Figure 2</strong>: Line Profile Method for SEM Resolution</p> <p>Since image acquisition and the actual measurement procedures can vary considerably between different microscope vendors, it is important to be mindful when relating and comparing resolution numbers. How the measurement is made and what sample and parameters are selected can have a profound impact on the resolution number reported.</p>