JEOL Resourceshttps://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-DownloadsObservation of wet specimens sensitive to evaporation using scanning electron microscopy (Microscopy magazine)https://www.jeolusa.com/RESOURCES/Electron-Optics/Documents-Downloads/observation-of-wet-specimens-sensitive-to-evaporation-using-scanning-electron-microscopy-microscopy-magazineIT500Sun, 13 Feb 2022 17:31:22 GMTWet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen chamber pressure cannot prevent the initial evaporation effects. The wet cover method, where the original surface water is retained (and, therefore, considered wet), provides a way to introduce and subsequently image specimens that are sensitive to evaporation within a SEM, while preventing evaporation-related damage, and to observe interesting specimen–water interactions.<p>Wet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen chamber pressure cannot prevent the initial evaporation effects. The wet cover method, where the original surface water is retained (and, therefore, considered wet), provides a way to introduce and subsequently image specimens that are sensitive to evaporation within a SEM, while preventing evaporation-related damage, and to observe interesting specimen–water interactions.</p> <p>As seen in <em>Microscopy</em>, 2018, 356–366</p>