JEOL Resourceshttps://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-DownloadsNew Generation LC-TOF/MS "AccuTOF"https://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/new-generation-lc-tofms-accutofJEOL News ArticlesMon, 27 Jul 2020 20:18:01 GMTIt has been a decade since Dodonov and his colleagues first announced the electrospray ionization time-of-flight mass spectrometer (ESI-TOF MS). Their initial findings have been enhanced by Standing and others, and it has been recently reported that a large TOF MS system achieved a mass resolution exceeding 10,000.<p>It has been a decade since Dodonov and his colleagues first announced the electrospray ionization time-of-flight mass spectrometer (ESI-TOF MS). Their initial findings have been enhanced by Standing and others, and it has been recently reported that a large TOF MS system achieved a mass resolution exceeding 10,000.</p> Direct Analysis in Real Time (DART®) Mass Spectrometryhttps://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/direct-analysis-in-real-time-dart-mass-spectrometryMass Spectrometry (MS)Fri, 13 Mar 2020 16:11:22 GMTMass Spectrometry (MS) is one of the fastest-growing areas in analytical instrumentation. The use of mass spectrometry in support of synthetic, organic, and pharmaceutical chemistry is well established. Mass spectrometry is also used in materials science, environmental research, and forensic chemistry. It has also evolved into one of the core methods used in biotechnology. However, currently available ion sources place extreme restrictions on the speed and convenience of sample analysis by mass spectrometry. Here we report a method for using mass spectrometry to instantaneously analyze gases, liquids, and solids in open air at ground potential under ambient conditions. Traditional ion sources used in mass spectrometry require the introduction of samples into a high vacuum system.<p>Atmospheric pressure ion sources such as atmospheric pressure chemical ionization(APCI)[5], electrospray ionization (ESI)[6-8],matrix-assisted laser desorption ionization(MALDI)[9-10] and atmospheric pressure photoionization (APPI)[11] have broadened the range of compounds that can be analyzed by mass spectrometry. However, these ion sources require that samples be exposed to elevated temperatures and electrical potentials,ultraviolet irradiation, laser radiation, or a high-velocity gas stream. Safety considerations require that the ion source be fully enclosed to protect the operator from harm.</p> <p>The new ion source reported herein overcomes these limitations. The new technique, referred to as Direct Analysis in Real Time(DART™), has been coupled to the AccuTOF-LC™ atmospheric pressure ionization mass spectrometer to permit high-resolution, exact mass measurements of gases, liquids, and solids[12,13]. DART successfully sampled hundreds of chemicals, including chemical agents and their signatures, pharmaceutics,metabolites, pesticides and environmentally significant compounds, peptides and oligosaccharides, synthetic organics, organometallics, drugs of abuse, explosives, and toxic industrial chemicals. These chemicals were detected on a variety of surfaces such as concrete, human skin, currency, airline boarding passes, fruits and vegetables, body fluids, cocktail glasses,and clothing. The composition of drug capsules and tablets was directly analyzed.</p> Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™https://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/rapid-characterization-of-bacteria-using-clairscope-and-spiraltofJEOL News ArticlesFri, 06 Mar 2020 06:48:40 GMTIn many fields such as clinical diagnosis and food inspection, there is a demand for rapid, reliable and simple-to-use methods for characterizing bacteria. This paper explores the use of two new and innovative instruments called ClairScope™ and SpiralTOF™ for this rapid characterization. The JASM-6200 ClairScope™ integrates an optical microscope (OM) with a scanning electron microscope (SEM) where it is possible to observe samples in solution, in an open system, by the SEM at atmospheric pressure. This type of sample would typically require extensive sample pretreatment that would take a day or more with conventional SEM techniques. With the recently developed ClairScope™, fine morphological observation can be performed directly in solution with simple sample pretreatment of one hour or less. The JMS-S3000 SpiralTOF™, is a matrix-assisted laser desorption/ionization mass spectrometer (MALDI-MS) with a spiral ion trajectory. With sample pretreatment as fast as a few minutes, the SpiralTOF™ can characterize ribosomal proteins and phospholipids with high accuracy. Ribosomal proteins are biomarkers for phylogenetic classification, and phospholipids are used for chemotaxonomic analysis. The combination of ClairScope™ and SpiralTOF™ are found to be powerful instruments for the characterization of bacteria.<h3>Introduction</h3> <p>Rapid characterization methods are in demand for bacteria, which are simple to use and reliable, in a variety of fields such as clinical diagnosis, food inspection, and in environmental energy industries. Bacterial characterization methods can be divided into two categories: analysis of phenotype and genotype. Phenotype analysis includes a morphological study and chemotaxonomy where analysis of bacterial cell components such as proteins and lipids are analyzed. Genotype analysis includes gel electrophoresis and DNA sequencing using a sequencer.</p> <p>In many cases, a skilled operator can identify the species of bacteria using an optical microscope combined with supplemental information. However, optical microscope (OM) has limited resolution and with bacterial size typically smaller than a few micrometers, detailed structural information cannot be obtained. The use of scanning electron microscope (SEM) overcomes this resolution limitation but often requires long sample pretreatment such as dehydration and fixation that can take a day or even longer.</p> Features and Applications of Newly-Developed GC-TOFMS “The AccuTOF GC”https://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/features-and-applications-of-newly-developed-gc-tofms-the-accutof-gc1Mass Spectrometry (MS)Fri, 06 Mar 2020 06:43:39 GMTA gas-chromatograph mass spectrometer (GC-MS) is a combined analyzer that has superior ability in analyzing organic compounds qualitatively and quantitatively. The first part, gas chromatograph, separates the compounds included in a sample (mixture), then the second part, mass spectrometer, obtains mass spectra of the compounds to carry out qualitative analysis. Quantitative analysis can be carried out as well from the peak area of the mass chromatogram of the compound. As a mass spectrometer of a GC-MS system, several types of mass spectrometers are on the market, such as magnetic field, quadrupole (QMS), ion trap (ITD), and time-of-flight (TOF). Each mass spectrometer has its own features and applications.<p>By the way, “fast GC”, one of the GC methods, has become to attract attention recently. The fast GC method can shorten the analysis time remarkably while keeping a good separation ability equal to the conventional GC methods, by using a narrow and short column of about 0.1 mm inside diameter and 10 m long. The fast GC method, adopted in a GC-MS system, has the ability to improve the system throughput. However, it requires a fast spectrum- acquisition speed to the mass spectrometer, because the chromatograph peaks are narrower in time than a conventional GC. TOFMS only has the ability to satisfy the demand for fast spectrum-acquisition speed at the present time, but the existing GC-TOFMS systems are not satisfactory by either of the following reasons: it can follow the fast speed of the fast GC, but its mass resolution is too low to measure accurate mass, or, on the inverse, it has a mass resolution high enough to measure accurate masses but cannot follow the fast speed of the fast GC.</p> Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectoryhttps://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/development-of-jms-s3000-maldi-toftof-utilizing-a-spiral-ion-trajectoryJEOL News ArticlesFri, 06 Mar 2020 06:39:49 GMTWe have developed the JMS-S3000, matrix assisted laser/desorption ionization time-of-flight mass spectrometer (MALDI-TOFMS). An innovative ion optical system, which achieved a spiral ion trajectory, surpassed basic specification of the reflectron ion optical system presently used in most commercially available TOFMSs. Furthermore, we have developed the TOF-TOF option for the JMS-S3000. In the case of attaching the TOF-TOF option, a spiral ion optical system is adopted for the first TOFMS, whereas a reflectron ion optical system with offset parabolic reflectron is adopted for the second one. Utilizing the spiral trajectory ion optical system, the JMS-S3000 provides unprecedentedly high mass resolution and high precursor ion selectivity. In this paper, we demonstrate not only the high mass resolution of more than 60,000 (FWHM) at m/z 2093 but also achievement of high mass resolution over a wide mass range. In addition, we present the high selectivity that enables selection of monoisotopic ions of precursor ions. By selecting only monoisotopic ions of precursor ions, one signal peak corresponding to each fragmentation channel is observed on a product ion spectrum. Consequently, the analysis of the product ion spectrum is made clearer.<p>Introduction</p> <p>The time-of-flight mass spectrometer (TOFMS) is one of mass spectrometry techniques, which include the quadrupole mass spectrometer, the magnetic sector mass spectrometer, the ion trap mass spectrometer and the Fourier transform ion cyclotron resonance mass spectrometer. In the case of TOFMS, ions of various <em>m/z</em> values, which are generated in the ion source, are accelerated to the detection plane by a pulse voltage applied from a starting time of data acqisition. Since the time-of-flight of ions at the detection plane are proportional to the square root of their m/z values, the ions generated in the ion source can be separated. One of the TOFMS feature is fast measurement, which is due to the unnecesity of scan for any physical parameters such as electric or magnetic fields. Recently, not only a single type mass spectrometer, but also a tandem type mass spectrometer connected with the quadrupole mass spectrometer (Q/TOF) or tandemly connected two TOFMSs (TOF/TOF) are available.</p> Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”https://www.jeolusa.com/RESOURCES/Analytical-Instruments/Documents-Downloads/analysis-of-organic-thin-films-by-the-laser-desorptionionization-method-using-the-jms-s3000-spiraltofJEOL News ArticlesFri, 06 Mar 2020 06:36:14 GMTLaser Desorption/ Ionization-Time of Flight Mass Spectrometry (LDI-TOFMS) is generally used for analysis of organic compounds because this technique generates little fragmentation of molecular ions at ionization. It makes possible to obtain information on molecular weights and molecular structures in organic compounds. In particular, a technique which uses the matrix compounds for enhancing ionization efficiency is well known as Matrix-Assisted Laser Desorption/ Ionization-Time of Flight Mass Spectrometry (MALDI-TOFMS). This technique is widely used in the bio markets owing to its capability of ionizing proteins and peptides with the molecular weights of several thousands to several hundreds of thousands. The MALDI-TOFMS is also utilized for analysis of synthetic polymers. In many cases, LDI-TOFMS and MALDI-TOFMS have been used to estimate the molecular weights of organic compounds in solution. But very recently, techniques of imaging mass spectrometry, which controls the laser irradiation position by two-dimensional scan to acquire mass spectra for visualizing localization of chemical compounds with specific molecular weights, have been improved. The application of this innovative technique is increasingly spreading in the bio markets. The technology of Imaging Mass Spectrometry has been advancing for analyzing biological tissue sections, but in the future, it is expected to develop toward the material science markets. It is noted that various surface analytical techniques are already available in the material science markets. In order to study the advantages of LDI-TOFMS as one of effective surface analysis tools, it is essential to consider the complementary analysis of LDI-TOFMS with the existing surface analytical techniques. In this article, the advantages of using LDI-TOFMS for analyzing organic lightemitting diode material thin films, in accordance with comparison with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), X-ray Photoelectron Spectroscopy (XPS) and Scanning Electron Microscopy/Energy-Dispersive X-Ray Spectroscopy (SEM/EDS), have been studied. In addition, since LDI-TOFMS is a destructive analytical technique, the influence on the sample surface caused by LDI-TOFMS was also examined.<h3>Introduction</h3> <p>The surface analytical techniques i r radiate an electron beam, an ion beam or X-ray on the surface of the sample for investigation of i t s morphology and physical characteristics based on the interactions between the beam and substances existing on the sample surface. To observe the sample morphology, an optical microscope and an electron microscope are mainly used. To study the sample characteristics, a wide range of techniques is available depending on the incident particles (beam) and the signals to be detected. They include Electron Probe Microanalysis (EPMA) , Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) . In recent years, electronic devices are frequently composed of organic compounds such as organic semiconductor, organic light-emitting diode (OLED) and organic film solar cell, and the use of them will be expected to further expand. It is increasingly important to inspect organic-compounds and their degradation mechanism in the products . Among sur f a c e analytical techniques, AES and XPS are capable of obtaining chemical bonding states or information on functional groups in chemical compounds, but those techniques have a difficulty in structural analysis of organic compounds. The TOF-SIMS is a mass spectrometry technique well known as a surface analytical technique. By using the dynamic SIMS, fragmentation of the molecular ions is likely to occur at ionization, thus making it difficult to apply SIMS to analyze organic compounds. Recently, techniques which utilize metallic clusters or gas clusters as a primary ion beam attached to TOF-SIMS have been succeeded to ionize more softly. These techniques are expected to expand the TOF-SIMS applications for organic compounds.</p>