With advanced analytical capabilities, the JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis. The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale.
For more information, see: Development of a Cold Field-Emission Gun for a 200kV Atomic Resolution Electron Microscope
To learn more about how the JEOL JEM-ARM200F has revolutionized TEM with the best atomic level imaging and chemical mapping available, or for a bibliography of papers and proceedings published on the JEOL Cs corrected TEM, please complete the form below.
Annular Bright Field (ABF) STEM image of Al2O3 corundum showing positions of the Oxygen atoms. Annular Bright Field STEM is a technique only available on the ARM200F.