JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)

Vol. 50 No. 1, Sept. 2015

Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology; Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals; Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK; Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory; 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond; Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F); Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES; Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer; New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”; Introduction of JEOL Products;

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