JEOLink Newsletter

• Join JEOL USA in the November Battery Forum
• 2025 JEOL x Indiana University NeoARM Research Award
• JEM-120i: Compact and Easy to Use
• JEOL is proud to provide solutions for Nobel Prize–level innovations!
• Featured Research
• Image Contest Winners
• Fall Community Service Events
• Application Spotlight: Additive Manufacturing

• REALab: Inside the Microscopy Core Labat UMass Lowell
• New IDES Application Note: Sub-millisecond Time resolved TEM imagesof CeO2 with Relativity™
• Featured Research
• Image Contest Winners
• Citizens Inn Food Drive
• Application Spotlight: Semiconductor

• Gather-X Webinar - Watch the Recording
• Access the New Excimer UV Cleaner Note
• Unlocking Insights into Battery Materials Using SEM Analysis
• Featured Research
• Image Contest Winners
• New EPMA Application Notes Available
• The Power of Desktop Scanning Electron Microscopy

• JEOL USA Introduces New Broad Ion Beam Milling Cross Section Polisher™
• Celebrate International Women’s Day at the Women In Microscopy Conference
• Featured Research: Nanoscale Electromagnetic Field Imaging by Advanced DPC STEM
• 2024 Grand Prize Image Contest Winners
• Monthly Image Contest Winners
• Winter Trade Show Highlights
• Honoring Women in STEM on the International Day of Women and Girls in Science
• JEOL Powering Quantum Innovation at the University of Waterloo
• Application Spotlight: Failure Analysis