SpiralTOF™ Ion Optics

Revolutionary, Ultrahigh Performance TOF Ion Optics

Reference: J. Mass Spectrom., 38, 1125-1142

To improve the mass resolving power and mass accuracy of a time-of-flight (TOF) mass spectrometer, the flight path must be extended to larger distances. However, simply extending the flight distance of a conventional linear or reflectron TOF increases the overall physical size of the instrument.  JEOL’s SpiralTOF ion optics design realizes a long flight path (17m) in a small console by employing a figure-eight trajectory. In addition to the SpiralTOF configuration, the console also supports both a parabolic reflectron TOF/TOF as well as a linear TOF.

Watch our short video showing the SpiralTOF Flight Path 


Perfect Ion Refocusing

Reference: Int. J. Mass. Spectrom., 197, 179-189

The SpiralTOF ion optics system utilized for the JMS-S3000 surpasses the conventional linear and reflectron ion optical systems by focusing the ion packets back in space at every fixed distance (i.e., each figure-eight trajectory) during the flight. Thus, even after the extended flight distance, the ion packets do not diverge at the detection plane, achieving high mass resolving power, high mass accuracy, and high ion transmission.


Ultrahigh Resolution over a Wide Mass Range


MALDI-TOF systems have delayed extraction ion optics and energy focusing ion optics immediately after the ion source, which greatly enhance the mass resolving power. However, a challenge of this method is that it limits the mass range in which high mass resolving power is achieved. This challenge is solved by increasing the ratio of the TOF flight path length to the distance of the delayed extraction focal point from the source. Since the JEOL SpiralTOF has an order of magnitude longer flight distance than the conventional reflectron TOFMS, this system achieves high mass resolving power and high mass accuracy over a wide mass range.

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