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Ion Beam Cross Section Polisher (CP)

The JEOL CP produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation.

The ability to create perfect cross sections of paper, shale, yeast, latex beads, coatings, and wire bonds, or to create a mirrored surface on soft materials such as gold, polymers, ceramics, and glass has greatly enhanced research and analysis for many of our customers.

The CP uses an argon beam to mill cross sections or polish virtually any material that is affixed to the continuously rotating sample holder. The high power optical microscope allows the user to position a sample to within a few microns of the precise cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface.

Cooling Cross Section Polisher with Air Isolation

JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, metallic lithium, and galvanized steel. The CCP allows long cooling periods while conserving liquid nitrogen. An isolation and transfer system allows processing to be performed without exposure to air.

Cross Section Polisher (CP) Details

  • Clean polished cross section of hard, soft, and composite materials
  • Clean mirrored surface with minimal strain or distortion
  • Wide area cross sections (up to several mm across)
  • Easy touch panel operation
Cooling CP Advantages
  • Nitrogen cooling prevents thermal damage to materials with low melting and low glass transition points
  • Air Isolation transfer system protects samples that are sensitive to exposure

Applications

Cross Sectioning Semiconductors (brochure)

Cross Sectioning Shale and Solar Thin Films (brochure)

Cross Sectioning Metals and Coatings (brochure)

Operation of CP

Animation of rotating sample holder (optional)

Argon Beam Cross Sectioning
Artifact-free Cross-sections
Cross Section Polisher Brochure
Instrument Overview - Microscopy Today
Introduction of Cross Section Specimen Preparation
Precise SEM Cross Section Polishing via Argon Beam Milling
13 JUN
2016

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