JSM-IT700HR
InTouchScope™ SEM

The JSM-IT700HR InTouchScope™ Field Emission SEM is a compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.

Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for imaging and analysis of nanostructures. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. The JSM-IT700HR can be outfitted with our fully embedded EDS microanalysis system providing EDS spectrum in real time during image observation.

 

Smart – Flexible - Powerful

Smart – Building off our ever popular InTouchScope™ series, this SEM is accessible to even the new or occasional user. An integrated CCD camera mounted on the chamber simplifies specimen navigation and the transition is seamless to the live SEM image as the magnification is increased. Advanced auto functions deliver sharp, high resolution images with ease. Smart, with its built-in Specimen Exchange Navi mode. This mode guides the user step-by-step from sample introduction to automatic condition setting and image formation based on the sample type and application. Also, reproduce imaging and analysis conditions from any stored image.

Flexible – The JSM-IT700HR SEM is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber. The JSM-IT700HR platform includes both secondary and backscatter electron detectors for capturing stereoscopic and compositional detail.

Powerful – Combining large probe currents with a small probe size at any accelerating voltage increases analytical resolution with fast results saving time which translates to efficiency and savings. Add our fully embedded EDS microanalysis system and observe EDS spectra in Real-Time during image observation.  Our Zeromag function links the optical image, SEM images and EDS data for an instant map of analysis positions. Expanded functionality such as: automated montage, movie capture of the live SEM image and compatibility with Python scripting are all included in the JSM-IT700HR platform. This SEM also supports live web viewing and remote control.

More Info

  • Contact your local Sales Representative to schedule a virtual demo now
    (USA, Canada, Mexico, Brazil)

Request JSM-IT700HR
Product Info / Virtual Demo


JSM-IT700HR Details

  • In-lens field emission gun delivers ≥300nA to the specimen
  • Aperture Angle Control Lens (ACL) for high resolution at any kV or probe current
  • Advanced auto functions including beam alignment, focus, astigmatism correction
  • High and Low Vacuum modes
  • Large specimen chamber with multiple ports
  • Mechanically eucentric, large, 5-axis automated specimen stage mounted in the chamber
  • Navigation is easy with embedded color camera (Stage Navigation System)
  • Zeromag simplifies navigation providing a seamless transition from the optical image to live SEM image. All data is linked for instant map of analysis positions.
  • Live Analysis with integrated JEOL EDS
  • Automated montage includes EDS maps (with JEOL EDS)
  • SmileView Lab for data management and report generation
  • Step-by-Step auto function guided operation for the new or occasional user
  • Small footprint and easy maintenance (no cooling water required)

These documents are available by request.

Applications Notes

  • A Note on Magnification
  • Stage Navigation System
  • 3D Image Software
  • Resolution in SEM
  • QMap Quantitative Hyperspectral X-ray Map
  • Aperture Angle Control Lens
  • STEM-in-STEM
  • Low Cost STEM
  • Air Isolated Transfer
  • Cryo Block
  • Can I Trust My Quantitative EDS Data? Notes on Standardless Quantitative EDS in SEM

Articles and Papers

  • Some Thoughts on Low kV Imaging
  • Electron Microscopy: An Integral Tool in Mechanical Testing
  • Electron Mirror – When Sample Charging is Your Friend
  • Why Use CryoTransfer System for SEM
  • Stereomicroscopy – search for the 3rd dimension
  • Low Cost STEM
  • Electron Flight Simulator

These documents are available by request.

3 SEP
2020

Product Information / Virtual Demo Request for JSM-IT700HR

0
Loading
  • Product: JSM-IT700HR

Comments are closed.