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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT500
High-Res, Large-Chamber SEM
JSM-IT500HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-7900F
JSM-7610FPlus
JSM-F100
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEOL Cryo TEMs for Structural Biology
300 kV
JEM-ARM300F
CRYO ARM™ 300
JEOL Cryo TEMs for Structural Biology
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
JEM-2200FS
Tomography Solution
SerialEM Tomography Software
IMOD Tomography Software
Chimera Visualization Software
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Nuclear Magnetic Resonance
JNM-ECZS
JNM-ECZR
Probes
ROYAL Probe
ROYAL HFX Probe
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF DART Application Notes
AccuTOF GCx-plus
AccuTOF GCx Design Features
AccuTOF GCx Tuning Assistant Function
EI/FI/FD Combination Ion Source for AccuTOF GCx
AccuTOF GCx Technology
AccuTOF GCxGC MS
AccuTOF LC-Plus
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
GC/Triple-Quadrupole Mass Spectrometer
InfiTOF
MALDI SpiralTOF TOF/TOF
SpiralTOF Ion Optics
Spiral TOF Monoisotopic Precursor Ion Selection
Spiral TOF MALDI Target Plates
Spiral TOF Configurations
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
EB Source Power Supply
Plasma Source
Electron Beam Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope
HV/LV Tungsten/LaB6 SEMs
:
IT200
IT500
High-Res, Large-Chamber SEM
:
IT500HR
FE SEM
:
JSM-7900F
JSM-F100
JSM-7610FPlus
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Medical Equipment
Industrial Equipment
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NeoARM
CryoARM
JEM-F200
300 kV
:
JEM-ARM300F
CryoARM
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
Tomography Solution
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Mass Spectrometers
AccuTOF DART
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
AccuTOF GCx-plus
AccuTOF GCxGC MS
AccuTOF LC-Plus
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
InfiTOF
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZS Routine NMR
JNM-ECZR Research NMR
Probes
Delta NMR Software
CRAFT for Delta
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
APPLICATIONS
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Photomask / Direct Write Lithography
Documents & Downloads
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JEOL MS Calculator App
SERVICE / SUPPORT
JEOL USA Service & Support
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