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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope™
HV/LV Tungsten/LaB6 SEMs
:
IT200
|
IT510
High-Res, Large-Chamber SEM
:
IT700HR
FE SEM
:
JSM-IT800
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
|
Carbon Coater
Microprobe (EPMA) and Auger
JXA-iHP200F
|
JXA-iSP100
|
JAMP-9510F
Additive Manufacturing
JAM-5200EBM 3D Printer
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NEOARM
|
CRYO ARM™ 200
|
JEM-F200
|
JEM-ACE200F
|
JEM-2100Plus
|
Monochromated ARM200F
300 kV
:
JEM-ARM300F2
|
CRYO ARM™ 300
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
|
JIB-4000PLUS
Medical Equipment
Industrial Equipment
Mass Spectrometers
AccuTOF™ DART®
AccuTOF™ GC-Alpha
AccuTOF™ GCxGC MS
AccuTOF™ LC-Plus
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
MALDI SpiralTOF™ TOF/TOF
MALDI Imaging SpiralTOF™
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
Delta NMR Software
CRAFT for Delta
NMR in Pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
|
JES-X320
|
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
APPLICATIONS
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Milestones
JEOL Milestones
2019
JEOL Introduces New GC/Triple Quadrupole Mass Spectrometer with High Speed and High Sensitivity for Trace Detection of Pesticides, Dioxins, and Regulated Chemicals
2018
50th anniversary of JEOL e-beam lithography systems
JEOL Announces New Monochromated ARM200F Addition to Atomic Resolution TEM Family
UC Irvine Materials Research Institute (IMRI) - JEOL Center for Nanoscale Solutions Grand Opening
JEOL Introduces new IT500HR High Resolution SEM
2017
50th anniversary of JEOL e-beam lithography systems
Introduction of new 8100FS Direct Write EBL
JEOL Unveils new Field Emission Cryo-Electron Microscope JEM-Z200FSC
JEOL introduces new HFX NMR Probe for Fluorinated Compounds
2016
50th Anniversary of first JEOL SEM - more than 22,000 sold worldwide since 1966
JEOL Founders Recognized with Pittcon Heritage Award
JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis
2015
10th Anniversary of introduction of award-winning DART™ Direct Analysis in Real Time ion source
New "best-in-class" Field Emission SEM JSM-7200F and new versatile, compact tungsten SEM IT100 series introduced
JEOL introduces new generation InTouchScope IT100 Series SEM
2014
Introduction of Grand ARM 300kV TEM with 63pm resolution
JEOL USA launches Image Contest
New ECZ Series NMR Spectrometer introduced
2013
New Zero Boiloff Magnet for NMR
JEOL and Zoex Partner to Offer Two-Dimensional Gas Chromatography (GCxGC) for High Sensitivity Mass Spectrometer AccuTOF-GCx
JEOL partners with Gatan to offer Serial Block Face Imaging for SEM
1400PLUS 120kV TEM, IT300 extended pressure SEM introduced
2012
JEOL USA celebrates its 50th anniversary
JEOL Brasil moves to new office
JEOL introduces new Field Emission SEM series with sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale
Fast, small solid state NMR probe introduced
2011
1000 Cross Section Polishers sold worldwide for sample preparation
100 JEM-1400 TEMs sold worldwide
JEOL USA receives its 11th Omega Award for outstanding service
R&D 100 Award goes to InTouchScope (JSM-6010) SEM
MT10-Award goes to ClairScope atmospheric SEM
JEOL chemist receives prestigious Anachem Award
New Chilean partner, Arquimed, announced
Environmental Control System for labs introduced
Large Angle SDD-EDS for TEM introduced
Joint venture company, JEOL Resonance, formed for NMR and ESR
2010
R&D 100 Award goes to ClairScope atmospheric SEM
JEOL receives 10th Omega award for customer service
JEOL offers first commercially available thin film phase plate technology for TEM
2009
JEOL receives 9th Omega award for customer service
JEOL introduces ClairScope, JASM-6200, first integrated correlative microscopy tool
JEOL introduces JEM-ARM200F, atomic resolution analytical microscope with STEM-HAADF resolution of 0.08 nm
2008
JEOL receives 8th Omega award for customer service
JEOL introduces benchtop SEM with LV and high resolution
2007
JEOL ships 10,000th SEM unit from Technics group in Japan
JEOL receives 7th Omega award for customer service
Cross-Atlantic operation of JEOL aberration-corrected TEM
JEOL TEMs installed in BioSafety Level 3 Lab
JEOL introduces cyber-enabled NMR
2006
Minimum linewidths of 8nm achieved with direct write lithography system
New ultrahigh resolution FE SEM achieves true 1,000,000X imaging
JEOL speeds NMR experiments with ability to perform DART mass analysis directly from NMR tube
JEOL announces untethered TEM – on-the-go microscopy with cellular connection
2005
Direct Analysis in Real Time (DART™) revolutionizes mass spectrometry
DART wins Pittcon Editors’ Gold Award, R&D 100 Award
360° wafer edge review improves yield with wafer analysis SEMs
Sirius remote TEM operation software lets scientists see atoms from halfway around the world
JEOL USA named Major Industrial Partner with MIT’s Institute for Soldier Nanotechnologies
DART appears on popular crime television show CSI
U.S. Patent awarded for DART
JEOL receives 5th consecutive Omega award for outstanding service
2004
Argon beam cross section polisher introduced to prepare distortion-free SEM samples
GCMate II mass spectrometer used in analysis of antioxidants in blueberries
New Electron Probe Microanalyzer (EPMA) maps with analytical resolution approaching 100nm
JEOL receives 4th consecutive Omega award for outstanding service
2003
Introduced ultrahigh resolution TEM – JEM-2100F
Automated structural elucidation software for NMR introduced
Cs corrected SEM developed – JSM-7700F
JEOL receives 3rd consecutive Omega Award for outstanding service
Cross-section FIB/STEM solution introduced
Introduced ultrahigh resolution TEM – JEM-2100F
ColdSpray ionization source introduced for AccuTOF MS
New CD Metrology Software announced for JEOL SEMs
New SPM introduced for native environment imaging – JSPM-5200
JEOL Ltd. ISO 14001 certified
2002
TEEMmate mass spectrometer for explosives introduced
JEOL West Coast Technology Center in Pleasanton, California opens
Robert Santorelli appointed JEOL USA President/COO
Gentle Beam technology introduced with new JSM-7400F SEM
New generation of high resolution SEMs introduced (JSM-6360 /LV and JSM-6460 /LV)
New generation of NMR spectrometers introduced – ECA/ECX
JEOL receives Omega Award for outstanding service
APIA membership
2001
New Time-of-Flight LC/MS AccuTOF™ introduced
JEOL receives Omega Award for outstanding service
2000
I-Checker Wafer Process Monitor introduced
New multipurpose lithography/inspection SEM (6500F)
1999
JEOL celebrates 50th Anniversary
Winner of VLSI Research Top Ten Award for service
1998
Winner of VLSI Research Top Ten Award for service
1997
Recipient of National Semiconductor Silver Award
1989
First JEOL SPM introduced
1982
First JEOL Wafer Inspection System
1979
JEOL USA, Inc. moved to new Peabody, MA headquarters
1974
Soquelec, Ltd. becomes JEOL representative in Canada
1967
First JEOL e-beam lithography system introduced
1966
First JEOL SEM introduced
JEM-1000 Ultrahigh Voltage (1000 kV) Electron Microscope completed
1964
First JEOL MS introduced
1962
JEOL shares listed on the Second Section of the Tokyo Stock Exchange
JEOL CO (USA) INC. established as the first overseas subsidiary.
1961
Akishima Factory Building No. 1 (South Wing) completed.
Company name changed to JEOL Ltd.
1960
First JEOL EPMA introduced
1956
First JEOL NMR introduced
1950
First JEOL TEM introduced
1949
Japan Electron Optics Laboratory Co., Ltd. established in Mitaka, Tokyo.
JEM-1 electron microscope completed.
JEOL History Infographic
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JEOL USA - A History of Innovation
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