JEOL Milestones

JEOL USA celebrates 60th anniversary

50th anniversary of JEOL e-beam lithography systems

Introduction of new 8100FS Direct Write EBL

JEOL introduces new HFX NMR Probe for Fluorinated Compounds

50th Anniversary of first JEOL SEM - more than 22,000 sold worldwide since 1966

10th Anniversary of introduction of award-winning DART™ Direct Analysis in Real Time ion source

New "best-in-class" Field Emission SEM JSM-7200F and new versatile, compact tungsten SEM IT100 series introduced

JEOL introduces new generation InTouchScope IT100 Series SEM

Introduction of Grand ARM 300kV TEM with 63pm resolution

JEOL USA launches Image Contest

New ECZ Series NMR Spectrometer introduced

New Zero Boiloff Magnet for NMR

JEOL and Zoex Partner to Offer Two-Dimensional Gas Chromatography (GCxGC) for High Sensitivity Mass Spectrometer AccuTOF-GCx

JEOL partners with Gatan to offer Serial Block Face Imaging for SEM

1400PLUS 120kV TEM, IT300 extended pressure SEM introduced

JEOL USA celebrates its 50th anniversary

JEOL Brasil moves to new office

JEOL introduces new Field Emission SEM series with sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale

Fast, small solid state NMR probe introduced

1000 Cross Section Polishers sold worldwide for sample preparation

100 JEM-1400 TEMs sold worldwide

JEOL USA receives its 11th Omega Award for outstanding service

R&D 100 Award goes to InTouchScope (JSM-6010) SEM

MT10-Award goes to ClairScope atmospheric SEM

JEOL chemist receives prestigious Anachem Award

New Chilean partner, Arquimed, announced

Environmental Control System for labs introduced

Large Angle SDD-EDS for TEM introduced

Joint venture company, JEOL Resonance, formed for NMR and ESR

R&D 100 Award goes to ClairScope atmospheric SEM

JEOL receives 10th Omega award for customer service

JEOL offers first commercially available thin film phase plate technology for TEM

JEOL receives 9th Omega award for customer service

JEOL introduces ClairScope, JASM-6200, first integrated correlative microscopy tool

JEOL introduces JEM-ARM200F, atomic resolution analytical microscope with STEM-HAADF resolution of 0.08 nm

JEOL receives 8th Omega award for customer service

JEOL introduces benchtop SEM with LV and high resolution

JEOL ships 10,000th SEM unit from Technics group in Japan

JEOL receives 7th Omega award for customer service

Cross-Atlantic operation of JEOL aberration-corrected TEM

JEOL TEMs installed in BioSafety Level 3 Lab

JEOL introduces cyber-enabled NMR

Minimum linewidths of 8nm achieved with direct write lithography system

New ultrahigh resolution FE SEM achieves true 1,000,000X imaging

JEOL speeds NMR experiments with ability to perform DART mass analysis directly from NMR tube

JEOL announces untethered TEM – on-the-go microscopy with cellular connection

Direct Analysis in Real Time (DART™) revolutionizes mass spectrometry

DART wins Pittcon Editors’ Gold Award, R&D 100 Award

360° wafer edge review improves yield with wafer analysis SEMs

Sirius remote TEM operation software lets scientists see atoms from halfway around the world

JEOL USA named Major Industrial Partner with MIT’s Institute for Soldier Nanotechnologies

DART appears on popular crime television show CSI

U.S. Patent awarded for DART

JEOL receives 5th consecutive Omega award for outstanding service

Argon beam cross section polisher introduced to prepare distortion-free SEM samples

GCMate II mass spectrometer used in analysis of antioxidants in blueberries

New Electron Probe Microanalyzer (EPMA) maps with analytical resolution approaching 100nm

JEOL receives 4th consecutive Omega award for outstanding service

Introduced ultrahigh resolution TEM – JEM-2100F

Automated structural elucidation software for NMR introduced

Cs corrected SEM developed – JSM-7700F

JEOL receives 3rd consecutive Omega Award for outstanding service

Cross-section FIB/STEM solution introduced

Introduced ultrahigh resolution TEM – JEM-2100F

ColdSpray ionization source introduced for AccuTOF MS

New CD Metrology Software announced for JEOL SEMs

New SPM introduced for native environment imaging – JSPM-5200

JEOL Ltd. ISO 14001 certified

TEEMmate mass spectrometer for explosives introduced

JEOL West Coast Technology Center in Pleasanton, California opens

Robert Santorelli appointed JEOL USA President/COO

Gentle Beam technology introduced with new JSM-7400F SEM

New generation of high resolution SEMs introduced (JSM-6360 /LV and JSM-6460 /LV)

New generation of NMR spectrometers introduced – ECA/ECX

JEOL receives Omega Award for outstanding service

APIA membership

New Time-of-Flight LC/MS AccuTOF™ introduced

JEOL receives Omega Award for outstanding service

I-Checker Wafer Process Monitor introduced

New multipurpose lithography/inspection SEM (6500F)

JEOL celebrates 50th Anniversary

Winner of VLSI Research Top Ten Award for service

Winner of VLSI Research Top Ten Award for service

Recipient of National Semiconductor Silver Award

First JEOL SPM introduced

First JEOL Wafer Inspection System

JEOL USA, Inc. moved to new Peabody, MA headquarters

Soquelec, Ltd. becomes JEOL representative in Canada

First JEOL e-beam lithography system introduced

First JEOL SEM introduced

JEM-1000 Ultrahigh Voltage (1000 kV) Electron Microscope completed

First JEOL MS introduced

JEOL shares listed on the Second Section of the Tokyo Stock Exchange

JEOL CO (USA) INC. established as the first overseas subsidiary

Akishima Factory Building No. 1 (South Wing) completed

Company name changed to JEOL Ltd.

First JEOL EPMA introduced

First JEOL NMR introduced

First JEOL TEM introduced

Japan Electron Optics Laboratory Co., Ltd. established in Mitaka, Tokyo

JEM-1 electron microscope completed