This website uses cookies to ensure you get the best experience on our website. Learn more
PRODUCTS

Multipurpose Analytical S/TEM

JEM-F200 "F2"

JEM-F200 "F2" Multipurpose Analytical S/TEM

The JEM-F200 "F2" Multipurpose Analytical S/TEM is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found in any other non-aberration corrected S/TEM.

The boost in probe current from the Cold FEG combined with dual EDS detectors makes the F2 a top performance analytical S/TEM. The high brightness/narrow energy spread of the next-generation JEOL Cold-FEG achieves high energy resolution electron energy loss spectroscopy (EELS) for rapid identification of chemical bonding states. Dual Silicon Drift Detectors (SDD) offer the ultimate high sensitivity and throughput for X-ray analysis. Additionally, the new Advanced Scan System employs De-Scan to achieve wide-field STEM-EELs spectrum imaging.

The F2 features a quad lens condenser system that independently controls electron beam intensity (spot size) and convergence angle.

With more versatility and functionality than ever before in a non-aberration corrected S/TEM, the F2 operation is easier as well. More than 100 beam conditions can be selected at the push of a button, and prior settings can be easily recalled. ECO mode saves power consumption.

A new automated sample holder transfer system, the SpecPorter, makes it easier than ever before to load samples. Once loaded, the PicoStage conducts precise, high speed sample movements of 0.5 nm steps, allowing the operator to move the field of view smoothly over a wide spatial scale range from millimeters to picometers.

Contact Us

  • Contact your local Sales Representative to schedule a virtual demo now
    (USA, Canada, Mexico, Brazil)

Learn More

New microscopes will allow researchers to see small and think big at Singh Center - University of Pennsylvania

Exploring TEM Phenomena from Milliseconds to Femtoseconds: webinar

Demonstration of F200 at High-Res Electron Microscopy Facility 4K, IIT Hyderabad Video

Key Features

  • Quad lens condenser system
  • Advanced scan system
  • Pico stage drive for ultra-fast, high-precision movement of field-of-view
  • SpecPorter automated sample holder transfer system
  • Cold FEG with narrow energy spread
  • Dual Silicon Drift Detectors
  • Intuitive and efficient operation

Videos

Application Notes

Request JEM-F200 F2 Product Info / Virtual Demo

Loading
  • Product / Page of Inquiry: JEM-F200 F2


  • By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.

    JEOL USA, Inc.
    11 Dearborn Road
    Peabody, MA 01960
    © Copyright 2022 by JEOL USA, Inc.