JEOL is a leading manufacturer of EDS detectors for electron microscopy.
Our analytical model SEMs include a fully-embedded JEOL EDS microanalysis system with advanced functionality. From our benchtop SEM to our highest-resolution FE SEM, we offer an EDS spectrometer designed by JEOL exclusively for each model of JEOL Scanning Electron Microscope.
With the analytical SEM you can view the EDS spectrum in real-time while searching for the area of interest on the sample. Our EDS software makes it possible to perform Live Analysis, high resolution spectral mapping and quantitative mapping, drift compensation, line scan, and the ability to collect large area montage maps all in the Standard EDS software package.
The JEOL integrated EDS detector is capable of detecting elements from Be to U. Detection limits are typically considered to be ≥1% for low atomic number elements (F to Be) and ≥0.1% (1000 ppm) for higher atomic number elements.