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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT500
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
JSM-7610FPlus
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEOL Cryo TEMs for Structural Biology
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300
JEOL Cryo TEMs for Structural Biology
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
JEM-2200FS
Tomography Solution
SerialEM Tomography Software
IMOD Tomography Software
Chimera Visualization Software
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Ion Slicer
Nuclear Magnetic Resonance
JNM-ECZS
JNM-ECZR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X310
JES-X320
JES-X330
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF DART Application Notes
AccuTOF GCx-plus
msFineAnalysis
AccuTOF GCx Design Features
AccuTOF GCx Tuning Assistant Function
EI/FI/FD Combination Ion Source for AccuTOF GCx
AccuTOF GCx Technology
AccuTOF GCxGC MS
AccuTOF LC-Plus
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
GC/Triple-Quadrupole Mass Spectrometer
InfiTOF
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope
HV/LV Tungsten/LaB6 SEMs
:
IT200
|
IT500
High-Res, Large-Chamber SEM
:
IT700HR
FE SEM
:
JSM-IT800
|
JSM-7610FPlus
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
|
Ion Slicer
Microprobe (EPMA) and Auger
JXA-iHP200F
|
JXA-iSP100
|
JAMP-9510F
Medical Equipment
Industrial Equipment
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NeoARM
|
CryoARM
|
JEM-F200
|
JEM-ACE200F
|
JEM-2100Plus
|
Monochromated ARM200F
300 kV
:
JEM-ARM300F2
|
CryoARM
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
Tomography Solution
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
|
JIB-4000PLUS
Mass Spectrometers
AccuTOF DART
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
AccuTOF GCx-plus
AccuTOF GCxGC MS
AccuTOF LC-Plus
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
InfiTOF
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZS Routine NMR
JNM-ECZR Research NMR
Probes
Delta NMR Software
CRAFT for Delta
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
|
JES-X320
|
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
APPLICATIONS
Application List
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SEE MORE HERE
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RESOURCES
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Photomask / Direct Write Lithography
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JEOL MS Calculator App
JEOL Webinars and Videos
SERVICE / SUPPORT
JEOL USA Service & Support
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PRODUCTS
/
Mass Spectrometers
NEW!
GC/Triple Quadrupole MS
for trace analysis.
SpiralTOF MALDI Image of nicotine in a fingerprint
AccuTOF-DART Analysis of a Spice drug
GC x GC / HRMS Analysis of diesel fuel
JEOL Mass Spectrometer Solutions for Today’s Analytical Challenges
APPLICATIONS
Chemicals / Polymers / Materials
JEOL has more than one way to answer your chemical composition questions
Environmental
Accurately measure trace levels of pesticides, regulated chemicals, and pollutants.
Failure Analysis
Determine the causes of failure in a wide variety of materials.
Forensics
Eliminate backlogs with rapid analysis of drugs, trace evidence, explosives and more
Nanotechnology
Develop novel and significantly improved materials
Natural Products / Food / Herbal
Ambient ionization lets you analyze samples in their native state
Neuroscience
Invaluable tools for mapping the brain for advanced neuroscience studies
Petroleum
Powerful tools for analyzing truly complex mixtures
Process / Gas Monitoring
Continuous high-resolution monitoring of gases from hydrogen to process gases
Protecting Wildlife and Forests
The JEOL AccuTOF™-DART® plays an important role in identifying illegally traded products for CITES compliance
Mass Spectrometry Tips
Visit our corporate website where you can see all the tips available for Mass Spectrometry
Mass Spectrometry Webinars
View all of our recent and upcoming webinars on various applications of Mass Spectrometry
INSTRUMENTS
Reflectron Time-of-Flight
AccuTOF™ DART® 4G
-The ambient ionization toolbox
-Real-time, open air analysis
AccuTOF™ GCx-plus
-High-resolution and high mass accuracy
-Variety of ion sources and direct probes
AccuTOF™ GCxGC/MS
-Comprehensive GCxGC/MS
-Full complement of ion sources and probes
AccuTOF™ LC-plus 4G
-LC/TOFMS
-Exact mass analysis
Multi-Turn Time-of-Flight
InfiTOF Gas Analysis TOF
-Portable gas analysis system
-Real-time direct gas injection
MALDI Imaging SpiralTOF™
-Ultrahigh mass-resolution MALDI imaging
SpiralTOF™ MALDI TOF/TOF
-Ultrahigh resolution TOF
-Monoisotopic precursor selection for MS/MS
Mass Spec Instrument Software
msFineAnalysis
-Auto-qualitative Analysis Software
-For the AccuTOF™ High Res GC-TOFMS
Quadrupole Mass Spectrometers
GC/Triple-Quadrupole Mass Spectrometer
-Ultra-high Speed GC-MS/MS Analysis
GC/Single-Quadrupole Mass Spectrometer
-A 5th generation GC/MS system that increases speed and sensitivity
Magnetic Sector
MStation Magnetic Sector
-GC/MS, direct probe
-Dioxin analysis
Recent News - Mass Spec
Recent Posts
Think20 Labs Addressing Regulatory Challenges for Pesticides in Cannabis
Posted 2 months ago
US Department of Homeland Security, Customs and Border Protection, Selects JEOL Mass Spectrometers for Five Labs
Posted 8 months ago
AccuTOF-DART Used For Determining Ethanol Concentration In Beer
Posted 10 months ago
JEOL USA highlights new strategic partnerships strengthening its position as world-leading instrument provider
Posted 11 months ago
JEOL USA showcases product updates in MS, SEM and NMR
Posted 11 months ago
JEOL Introduces New GC/Triple Quadrupole Mass Spectrometer with High Speed and High Sensitivity for Trace Detection of Pesticides, Dioxins, and Regulated Chemicals
Posted last year
Read More »
60 Years of Mass Spectrometry Poster
Click on the image below and then download the file for a better resolution image.
history poster image.png