Smart – Flexible – Powerful:
A New Generation of JEOL Field Emission SEMs

JEOL never stops innovating, and now we are proud to introduce our most advanced Field Emission Scanning Electron Microscope series yet in our 70-year history. The new generation of JEOL FE SEMs delivers single-digit Angstrom resolution at low kV operation and enhances the user experience with automated beam optimization and control.

Learn more about how:

NeoEngine Automates and Optimizes Electron Beam Control
ZeroMag Streamlines Sample Navigation as Magnification Increases
EDS Live Analysis is Done Directly from SEM Imaging
SMILE VIEW™ Lab Manages Data

Enter your details in the form below to view videos and a detailed explanation of these advanced features and how our new generation of FE SEMs provide higher resolution and faster implementation.
Email
City
Company / Institution
State/Region
Name

First Name
Last Name
Country
Captcha