JEOL instrumentation is unmatched for atomic-resolution imaging and spectroscopic analysis, ideal for researchers pushing materials to new frontiers.
Since its introduction, the JEOL ARM series with spherical aberration correction has become the leading advanced analytical microscope for materials science applications. The newly-released NEOARM
, built on the tried-and-true ARM platform, combines a next-generation ASCOR Cs corrector with a cold FEG electron source and a highly-stable specimen stage and column. This combination yields unparalleled results in atomic-resolution imaging, and X-ray and EEL spectroscopies, across the entire range of operating voltages, 30 – 200 kV.
The JEM-F200 "F2"
is a multi-purpose, analytical workhorse instrument with features not found in any other non-Cs corrected instrument. Owing to the cold FEG source in combination with dual, large-area silicon-drift EDS detectors, this 200 kV S/TEM delivers results unprecedented for an uncorrected microscope, including imaging, chemical mapping, and EEL spectroscopy at the atomic scale. The 'F2' employs the newest in JEOL innovations and auto-functions, yielding an easy-to-use, extremely stable, and high-throughput analytical 200 kV S/TEM.
The JEM-ARM300F “GRAND ARM”
exceeds atomic resolution boundaries for any commercially-available TEMs today.