PRODUCTS

JEM-ARM300F2 GRAND ARM™2

Transmission Electron Microscope

JEM-ARM300F2 GRAND ARM™2 Transmission Electron Microscope

A new pole piece design accepts dual large-area EDS detectors, enabling high-speed, high-sensitivity chemical characterization without sacrificing spatial resolution. Automated HT settings, corrector alignment routines, and lens optimizations promote ease-of-use while providing the ultimate in functionality and performance.

Standard features such as a cold field emission gun, a hybrid HAADF detector for increased S/N throughout the entire 40-300kV operating range, and enhanced light element contrast via e-ABF imaging, solidify the GRAND ARM2 as a high-performance analytical instrument with unparalleled flexibility.

high-performance analytical instrument with unparalleled flexibility

No compromise in spatial resolution

new pole piece design yields increased EDS solid angle without sacrificing resolution

Mitigation of environmental effects

new enclosure reduces impact of air flow, temperature changes, and acoustic noise

Ultimate functionality

automated HT settings, corrector alignments, and optimized lens routines promote ease-of-use

Application Notes

Videos

Atomic resolution EDS map by GRAND ARM™2 with FHP2 pole piece and 158mm2 dual SDD system
Live observation of OBF-STEM images

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