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Atomic resolution structure results from the JEOL 300 kV CRYO ARM™ TEM

High resolution structure determination by electron cryo-microscopy (cryoEM) and Single Particle Analysis (SPA) has progressed to the point where structures can be determined routinely to better than 2Å on a 300 kV microscope. Here, we show results from Kato et al. at1 Osaka University from the JEOL CRYO ARM™ 300 installed at SPring8 (Riken, Japan), that was obtained on mouse heavy chain apo-ferritin at 1.5Å resolution. The 3D map shows surprising details in the map reflecting the high resolution quality of the data.

Other Resources

The following resources are available concerning Electron Optic related instruments:

  • Image Gallery
    -View a selection of electron images
  • FAQs
    -See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    -View our page of useful and interesting links to various electron microscopy resources
  • Videos
    -View some product presentations of our instruments
  • SEM Theory and SEM Training

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  • Technical Documentation for JEOL EPMA (Microprobes)