JEOL USA Sample Preparation Tools

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM.

From Focused Ion Beam (FIB) systems to a benchtop broad ion beam Cross Section Polisher, we offer a selection of specialized instruments to quickly prepare precise cross sections of semiconductor devices, metals, ceramics, multi-layer structures and also environment or beam sensitive materials.

JEOL also offers a line of sputter and evaporative coaters (metal or carbon) that facilitate imaging and analysis of non-conductive samples. These and other peripheral pieces of equipment complement JEOL’s comprehensive line of electron microscopes.


JEOL USA offers a full Sample Prep product listing for your scientific needs.
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