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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-PS500i
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
Application List
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Semiconductor
SEE MORE HERE
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SEM Applications
TEM Applications
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REALab Customer Stories
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
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FAQs
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Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
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No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
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Photomask / Direct Write Lithography
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JEOL USA Service & Support
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NEWS & EVENTS
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JEOL USA Image Contest Entries & Winners
2023 Entries & Winners
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2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
NeoScope Image Contest
JEOL USA Image Contest Entry Form
JEOL USA Large Chamber SEM Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
ABOUT US
The Company
Career Opportunities
Corporate Benefits
Current Career Opportunities
Submit Application
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Electron Microscopy
ESR, NMR, Mass Spectrometry
EB Lithography (Direct Write)
Additive Manufacturing
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Elemental Analysis
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-PS500i
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
UV Cleaner
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis AI
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
msRepeatFinder Polymer Analysis Software
MALDI Imaging SpiralTOF
UltraFOCUS DIOXIN Analysis
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Embedded EDS for SEM
Gather-X Windowless EDS
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
APPLICATIONS
Application List
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Semiconductor
SEE MORE HERE
Application List By Product
SEM Applications
TEM Applications
NMR Applications
FIB Applications
Mass Spec Applications
Sample Prep Applications
REALab Customer Stories
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
Links & Resources
Videos
Scanning Electron Microscopy Basics
Analytical Instruments
Documents & Downloads
Walkup NMR
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Webinars and Videos
Posters
JEOL Periodic Table App
JEOL MS Calculator App
Financing
SERVICE / SUPPORT
JEOL USA Service & Support
Request Service
Offered Services
Service Level Agreements
Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
Blog
What's New
Press Releases
JEOL in the News
Events & Shows
JEOL USA Image Contest Entries & Winners
2023 Entries & Winners
2022 Entries & Winners
2021 Entries & Winners
2020 Entries & Winners
2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
NeoScope Image Contest
JEOL USA Image Contest Entry Form
JEOL USA Large Chamber SEM Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
ABOUT US
The Company
Career Opportunities
Corporate Benefits
Current Career Opportunities
Submit Application
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Electron Microscopy
ESR, NMR, Mass Spectrometry
EB Lithography (Direct Write)
Additive Manufacturing
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
ABOUT US
Management Team
JEOL USA Management Team
Executive Management Team and Board of Directors
Takeshi Kawakami
Managing Director
In his role as Managing Director at JEOL USA, Mr. Kawakami is an important liaison between JEOL, Ltd. in Japan and JEOL USA, and is responsible for business administration in North America and Latin America. He has held various sales and general management positions in the company since 1990, including Manager of the Electron Microscopy Sales Promotion Group when the first ARM200F TEM was introduced. He was at JEOL USA from 2013-2018 as Sales Manager for North America and Latin America. JEOL USA welcomed Mr. Kawakami in April 2023 for his second assignment in the U.S.
Robert Pohorenec
President
Bob Pohorenec was appointed President of JEOL USA in 2019. A thirty-five year veteran of JEOL most recently as Vice President and General Manager of Sales and Service, Bob has held senior management positions in customer service, sales, operations and product development. As President of JEOL USA Bob oversees JEOL’s business operations in the United States and throughout the Americas through JEOL’s subsidiaries in Brazil, Canada, and Mexico. Bob is a graduate of Northeastern University.
Dr. Thomas Isabell
Vice President, JEOL USA
Dr. Isabell was promoted to Vice President in April 2020. He has been a member of the JEOL management team since 2003, most recently as Director of Product Management, overseeing a team of product managers and scientists responsible for sales support, customer technical support, instrument demonstrations and analytical development for JEOL scientific instrument products. Previously he served as Director of the Transmission Electron Microscope product division, managing a team of scientists and working closely with customers to help keep JEOL at the forefront of TEM technology in materials and life sciences research. He has been instrumental in the introduction of the ARM series TEMs and CryoARM TEMs. Prior to joining JEOL, Dr. Isabell held positions in business development at EmiSpec in Tempe, Arizona and applications support at Fischione Instruments in Export, Pennsylvania. Dr. Isabell received a B.S. in Materials Science and Engineering from the University of Minnesota and a Ph.D. in Materials Science and Engineering from Northwestern University.
Naoki Shimura
Assistant Managing Director, JEOL USA Service
Naoki Shimura is Assistant Managing Director of JEOL USA and the Assistant General Manager for JEOL’s service operations throughout the Americas, which includes 12 service offices in the U.S. and additional offices in Canada, Mexico, and Brazil.
Mr. Shimura joined JEOL in 1999 as a Field Service Engineer in Japan after first gaining experience as an electron microscope user in a hospital environment doing pathology work. In his first assignment with JEOL, he supported the installation and maintenance of electron microscopes. He was instrumental in training service engineers when he moved to JEOL Asia In 2006. When JEOL began development of the ARM300F Field Emission Atomic Resolution Microscope in 2012, he took on responsibilities in product development and support.
Most recently he served as Field Solutions Business Operations Support Manager in Japan while continuing his focus on the ARM300F microscopes. We welcomed Mr. Shimura to the JEOL USA office in Peabody, Massachusetts in May 2021.
Collette Hanlon
Vice President, Human Resources
Collette joined JEOL USA’s management team in 2009 and skillfully navigated us through a variety of complex employee relations initiatives. Her innovative approach to Human Resources management contributed to the enhancement of our employee programs and communication channels.
Collette’s credentials bridge over 20 years as a senior manager with responsibilities in all functional disciplines of Human Resources. Promoted to JEOL’s Board of Directors in April 2014, the addition of Collette’s expertise, insight and judgment will provide an important dimension to the Board of Directors and a new perspective to its deliberations.
Collette holds her degree in Business Administration from Salem State University and resides on the North Shore of Massachusetts.
Executive Team
Peter Genovese
Chairman Emeritus & Senior Advisor
Pete Genovese is Chairman Emeritus of JEOL USA and Senior Advisor to JEOL, Ltd. Pete served as President of JEOL USA from 2009 to 2019 and Corporate Officer to JEOL, LTD. and has held key positions in the JEOL sales organization for 38 years, including: Vice President and General Manager of the Sales and Marketing Division for electron optics and analytical instrumentation; Manager of the New England regional sales area for electron optics; and Assistant Sales Manager of JEOL USA's regional sales offices. Mr. Genovese received a B.S. in Economics from Boston College and an Executive M.B.A. from Suffolk University, and is a member of several microscopy societies throughout the U.S.
Robert T. Santorelli
Chairman Emeritus & Senior Advisor
Robert Santorelli, Chairman Emeritus, has held the positions of Chairman of the Board, President, CEO and COO during his 35-plus years at JEOL USA, Inc. Additionally, he has served as President of JEOL's subsidiary companies in Mexico and Canada.
Mr. Santorelli has been instrumental in guiding the company to become a stable, well-recognized organization made up of many dedicated, long-term employees located throughout the Western Hemisphere.
He began his career in the U.S. Air Force gaining technical knowledge and expertise in the area of electro optics. Bob selected a two year tour of duty in Japan and developed first hand understanding and appreciation of the Japanese people and their culture of respect and humility. He received his business education at Leslie College's Program for Business and Industry, Suffolk University, and Newbury Jr. College (Boston) and also studied at the University of Maryland Far East Asian Division (Japan).
Customers, employees and colleagues have come to know Bob's counsel, dedicated to corporate values of stability, honesty and integrity. Along with his new role as Chairman Emeritus, he will serve as the Senior Advisor to support both JEOL USA and JEOL Ltd. (Tokyo) business activities.
Directors
Chris Rood
Vice President, Sales & Marketing
Chris Rood joins the management team after nearly 15 very successful years as the Sales Manager of the Southwestern United States for JEOL USA. Chris has a background in electron microscopy and ran the SEM lab at Sandia National Labs before coming to work for JEOL USA as an Application Engineer. Chris has a degree in Geophysics from UC Riverside and an MBA from Santa Clara University. As the National Sales Manager, Chris will oversee sales activities for all products in North America. With his positive attitude and easy demeanor, Chris is a welcome addition to the USA management team.
Sales
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Inquiry
JEOL USA Headquarters
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JEOL USA, Inc.
11 Dearborn Road
Peabody, MA 01960
(978) 535-5900
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