Scanning Electron Microscopes (SEM)
support the development of new LIB technologies with morphological observation at the micrometer to nanometer scale, as well as the chemical analysis needed to create high-performance coatings and powders. Ultra-low voltage imaging combined with signal filtering in the SEM allows direct imaging and analysis of battery constituents (anode and cathode) with nanometer resolution. Additionally, one of the important aspects of the analysis is the ability to probe chemistry of the constituents at nm scale.
JEOL Field Emission SEMs perform microanalysis with energy dispersive spectroscopy (EDS) at extremely low voltages to pinpoint localized makeup of the specimens and, in particular, low atomic number materials such as carbon and fluorine. The Gather-X Windowless EDS
has higher sensitivity and low-energy X-Ray detection for lithium. The JEOL Soft X-ray spectrometer (SXES)
delivers high spectral resolution (0.3eV) which allows for the Nitrogen Kα and Titanium Lℓ line to be resolved with a separation of only 1.78eV. It has ultra-low energy, low-concentration sensitivity with the capability to detect Li even at low single digit weight percent concentration.