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JEOL USA Transmission Electron Microscopes

JEOL is a world leader in the development and manufacture of high performance, high stability Transmission Electron Microscopes (TEM). We have more than 60 years of expertise in producing TEMs designed for life sciences and material sciences. Some of the world’s most notable researchers use JEOL TEMs in their work.

JEOL’s innovations in TEM technology are legion, ranging from ultrahigh resolution optics for atom-to-atom characterization, to optimizing the user experience with an ergonomic design, user-friendly software and remote operation.

Using the JEOL TEM, biologists and pathologists can view and reconstruct 3D images of the finest cell structures. Crystallographers, metallurgists or semiconductor research scientists use high voltage/high spatial resolution TEMs to routinely image atoms. Materials researchers monitor and design materials at the nanoscale with custom-tailored properties. Often JEOL TEMs are used for multidisciplinary purposes among several research teams.

There is a JEOL TEM for every application, including cryotomography, STEM, MDS, and EDS. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter. The aberration corrected (Cs) TEM ensures the highest image resolution.

200kV TEMs

NEOARM
Atomic Resolution TEM with (Cold-FEG) and next-generation Cs corrector (ASCOR)
JEM-F200 "F2"
Advanced analytical, high throughput 200kV S/TEM with Cold Field Emission Gun and dual Silicon Drift Detectors
JEM-2800F
High throughput TEM/STEM
JEM-2200FS
In-Column Energy Filter FE TEM Phase Contrast Ready
JEM-2100Plus
Multipurpose LaB6 TEM
JEM-2100F
Multipurpose Field Emission TEM
CRYO ARM™ 200
Automatic acquisition of image data for Single Particle Analysis

Environmental Control Solutions

300kV TEMs

JEM-ARM300F
World's Highest Resolution in a Commercially-Available TEM
CRYO ARM™ 300
Automatic acquisition of image data for Single Particle Analysis

Atomic Resolution TEMs

JEM-ARM300F
World's Highest Resolution in a Commercially-Available TEM
CRYO ARM™ 300
Automatic acquisition of image data for Single Particle Analysis
NEOARM
Atomic Resolution TEM with (Cold-FEG) and next-generation Cs corrector (ASCOR)
CRYO ARM™ 200
Automatic acquisition of image data for Single Particle Analysis