Microprobe (EPMA) and Auger
Extreme elemental analysis of sub-micron areas (approaching 100nm), high spatial resolution in X-ray mapping, and high detection sensitivity for trace elements.
Scanning Electron Microscopes
JEOL offers a wide range of tungsten and field emission SEMs with versatile capabilities for high resolution imaging and analysis.
JEOL offers unparalleled sample preparation capabilities. The CP produces pristine, artifact-free samples. It is routinely used to validate oil shale deposits.
Our correlative microscopy solutions simplify cross-platform navigation from light microscopy to SEM and EPMA.