The JXA-iHP200F Field Emission EPMA is a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist. A full knobset and stage control module are both standard.
The iHP200F features an automated specimen exchange airlock, with an integrated color stage navigation camera mounted on the roof, providing easy access to the areas of interest on the sample with one click. The software also prompts users when routine maintenance is suggested. The EPMA also allows the transfer of JEOL EDS and or JEOL XRF data directly into the EPMA software which will automatically select the appropriate spectrometers and crystals. New standard software includes "Phase Analysis" and "Phase Map Maker", which utilizes both.