JXA-iHP200F Field Emission EPMA

JXA-iHP200F Field Emission EPMA

The JXA-iHP200F Field Emission EPMA is a state of the art, top of the line, research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist. A full knobset and stage control module are both standard.

The iHP200F features an automated specimen exchange airlock, with an integrated color stage navigation camera mounted on the roof, providing easy access to the areas of interest on the sample with one click. The software also prompts users when routine maintenance is suggested. The EPMA also allows the transfer of JEOL EDS and or JEOL XRF data directly into the EPMA software which will automatically select the appropriate spectrometers and crystals. New standard software includes "Phase Analysis" and "Phase Map Maker", which utilizes both.

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Key Features

  • Higher total probe current deliverable to the sample
  • Performs both beam scanned line scans and maps as well as large area line scans and maps with stage scanning
  • Maximum beam current of 3 µAmps at the sample, at 30kV, assuring the ability to get sufficient beam currents at low kV for fast, high spatial resolution microanalysis
  • Flexible, customizable configuration of spectrometers and crystals
  • Automated aperture angle control lens (ACL) reduces the Cs of the OL for high resolution analysis at high current and low kV
  • A 30mm2 integrated and embedded UTW-SDD-EDS system with high sensitivity including an in situ aperture wheel for ultrahigh beam current operation without compromising EDS spectrometer resolution and "Live" survey EDS acquisition to easily help find elements of interest
  • Specimen chamber supports a panchromatic, high bandwidth imaging CL and a fully-quantitative hyper spectral CL (xCLent V System) with no loss of a WDS or any limitation on image collection
  • Supports JEOL's Soft XRay Emission Spectrometers (SXES, SXES-ER) for ultralight elements and chemical state analysis
  • Fully dry pumped vacuum system to reduce hydrocarbon contamination
  • Integration with Probe for EPMA (PfE)

Application Notes

  • 1
  • 2
  • EPMA documents
  • Contact Info
  • Technical Documentation for JEOL EPMA (Microprobes)


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