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JEOL USA Focused Ion Beam
JEOL offers two solutions for Focused Ion Beam milling.
JIB-4700F
Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB.
JIB-4000
Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column.