JEOL USA Focused Ion Beam

JEOL offers two solutions for Focused Ion Beam milling.

  • JIB-4700F
    Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB.
  • JIB-4000
    Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column.