JEOL USA Focused Ion Beam

Energy

• Integrating sub-nanometer resolution SEM and TEM imaging and analysis for Energy Exploration

Materials Science

• Obtain microstructural information and surface/bulk chemical analyses

Nanotechnology

• Develop novel and significantly improved materials

Semiconductor Applications

• e-Beam and ion beam optics are designed for precise patterning and inspection

• JIB-4700F
  Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB.

• JIB-4000PLUS
  Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column.