An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed.
The ElementEye is capable of 50kV excitation and features our newest silicon drift detector (SDD) technology. Coupled with JEOL's advanced Fundamental Parameters (FP) method, this instrument provides high-sensitivity qualitative and quantitative analysis results in minutes. Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.
High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.
An optional 12-position auto sample changer speeds analysis with continuous acquisition.
Watch the Video Introduction to JEOL ElementEye Benchtop ED-XRF
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