Simply set the sample and touch the screen; that’s how easy it is to operate. Another touch of the screen is all it takes to switch between analysis results and spectrum display. It is as easy to operate as a tablet PC or a smart phone. (Operation using a keyboard and a mouse is also supported.)
High Sensitivity & High Throughput
JEOL’s own SDD (silicon drift detector) and newly-developed optical system, in combination with filters designed to handle the entire energy range, make it possible to achieve high-sensitivity analysis. The sample chamber vacuum unit (option) further increases detection sensitivity for lighter elements.
Sensitive analysis throughout the entire energy range
High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.
Element correspondence with each filter and sample chamber vacuum unit. Cl, Cu, Mo and Sb are options.
Example: trace element detection (10 ppm or less)
With solution based applications, the desired analysis can be executed automatically according to pre-recorded recipes. Simply select the desired solution icon from the solution application list for automated analysis and display of results. Solution applications offer simplified analysis in a wide range of fields.
The new Smart FP (Fundamental Parameter) method makes it possible to obtain highly-accurate quantitative results without the need to prepare a standard sample, and includes automatic correction for thickness and residual ingredient balance.
Note: the residual balance correction and thickness correction functions are only applicable to organic samples.
- Chamber Vacuum Unit
- 12-Position Auto Sample Changer
- Filter Set
- Software Solutions:
Filter FP method, Thin Film FP method, Ni plating screening, Sn plating screening, Halogen screening, Sum peak removal