JSM-IT700HR InTouchScope™

High Resolution SEM

The JSM-IT700HR InTouchScope™ Field Emission SEM is a compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.

Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for imaging and analysis of nanostructures. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. The JSM-IT700HR can be outfitted with our fully embedded EDS microanalysis system providing EDS spectrum in real time during image observation.

 

Smart – Flexible - Powerful

Smart – Building off our ever popular InTouchScope™ series, this SEM is accessible to even the new or occasional user. An integrated CCD camera mounted on the chamber simplifies specimen navigation and the transition is seamless to the live SEM image as the magnification is increased. Advanced auto functions deliver sharp, high resolution images with ease. Smart, with its built-in Specimen Exchange Navi mode. This mode guides the user step-by-step from sample introduction to automatic condition setting and image formation based on the sample type and application. Also, reproduce imaging and analysis conditions from any stored image.

Flexible – The JSM-IT700HR SEM is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber. The JSM-IT700HR platform includes both secondary and backscatter electron detectors for capturing stereoscopic and compositional detail.

Powerful – Combining large probe currents with a small probe size at any accelerating voltage increases analytical resolution with fast results saving time which translates to efficiency and savings. Add our fully embedded EDS microanalysis system and observe EDS spectra in Real-Time during image observation. Our Zeromag function links the optical image, SEM images and EDS data for an instant map of analysis positions. Expanded functionality such as: automated montage, movie capture of the live SEM image and compatibility with Python scripting are all included in the JSM-IT700HR platform. This SEM also supports live web viewing and remote control.

More Info

  • Contact your local Sales Representative to schedule a virtual demo now
    (USA, Canada, Mexico, Brazil)

Request JSM-IT700HR
Product Info / Virtual Demo


JSM-IT700HR Details

Request Product Information

Loading
  • Product / Page of Inquiry: JSM-IT700HR


  • By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.