Field Emission Cryo-electron Microscope


JEOL CRYO ARM Presentation - SoCal Cryo Electron Microscopy Symposium

Quick and easy to operate for high-contrast and high-resolution images.

CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high quality images by simple operations even for those who have never used an electron microscope before.

CRYO ARM™ 300 II Details

High Throughput

Increased productivity for cost effectiveness

Quick Collection

The JEM-3300 CRYO ARM™ 300 II achieves high speed data acquisition by combining beam shift with precise specimen stage movement. The excellent beam control of this system minimizes the beam tilt that causes coma aberration, even with beam shift. Hence, the throughput can be increased without degrading image quality.

Zero Fringe System

In addition to the ordinary beam illumination, the CRYO ARM™ 300 II has a unique "Koehler mode" illumination. This mode has no interference fringes and eliminates electron-beam damage to areas not used for imaging and allows you to get more images from a smaller area.

Highly Flexible Operation

High precision stage drive

The CRYO ARM™ 300 II has a rotation free stage. The advantage of this stage is excellent positional reproducibility. Even if you move samples back and forth between the microscope column and sample storage, you can reuse low magnification images, which we call "global map". It allows for obtaining good sample conditions to capture high-quality data because exposure to the electron beam is greatly reduced.


The CRYO ARM™ 300 II is equipped with new version of "JADAS*" software to enable novice users to acquire data. New JADAS allows the users to automatically acquire image data by simply selecting the acquisition parameters with a wizard.

* JEOL Automated Data Acquisition System

Contamination free sample storage and removal

The grids can be kept clean in storage for weeks or longer in the CRYO ARM™ 300 II. Moreover, those grids can be replaced from a single grid by the transfer magazine. Liquid nitrogen temperatures and nitrogen gas atmosphere are kept at specimens ejection.

High Stability

New Cold Field Emission Electron Gun

The CRYO ARM™ 300 II is equipped with the new cold field emission electron gun (CFEG). This new gun not only has a low energy spread, but also provides an improved probe current stability, allowing users to obtain high quality images at any time.

New Omega filter

The CRYO ARM™ 300 II is equipped with a new improved in-column energy filter, the Omega filter, which is self-adjusting and always delivers the best performance with high stability.

Main instrument

Electron gun Cold field emission gun (New CFEG)
Standard accelerating voltage 300 kV, 200 kV
Energy filter In-column Omega energy filter (New Omega Filter)
Accessory Hole-free phase plate

Specimen stage / Automated specimen exchange system / Specimen storage

Specimen stage
 Coolant Liquid nitrogen, Automated liquid-nitrogen filling system built-in
 Specimen cooling temperature 100 K or less
 Temperature measurement Near specimen, Cryo-shield, Near LN2 tank
Specimen movements
 X, Y Motor drive (Movements: ± 1 mm)
Piezoelectric elements
 Z Motor drive (Movements: ± 0.2 mm)
 Tilt-X Motor drive ( Tilt: ± 70°)
Rotation Settable to 0°or 90° within the specimen plane
Specimen exchange system Air-lock, Automated cryo-transfer system built-in
 Cooling temperature 105 K or less
 Specimen exchange cartridge Up to 4 specimens can be changed at one time.
Specimen storage Up to 12 specimens can be held
 Coolant Liquid nitrogen, Automated liquid-nitrogen filling system built-in
 Cooling temperature 105 K or less


  • Low accelerating voltage
    (Please make a separate inquiry about requests for the other accelerating voltage except standard.)
  • Bright-field STEM detector
  • Dark-field STEM detector
    (JEOL Automated Data Acquisition System for Cryo-EM)
  • Direct detection camera
  • TEMography
  • Automated tilt series acquisition software for MicroED
  • EDM (Electrostatic Dose Modulator)

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