From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials.

Ceramic powders - examine the inner structure and core of the powder as well as the differences between multiple samples.

Complex mixtures - observe quantity and distribution of multiple components, and investigate failures and wear.

JEOL Field Emission SEMs are effectively nanolabs in a single, powerful, smart instrument, with the ability to provide sub100nm scale resolution easily and quickly, navigate to specific areas of a sample, and retain optimum imaging settings for each sample. Additional detectors such EBSD enable easy observation of grain orientation, but the JEOL FE SEM also obtains BSE images at a high resolution while maximizing orientation contrast. The FE SEM combines large beam currents with a small probe size at ANY accelerating voltage.

Learn more about imaging and analysis with the JEOL Field Emission SEMs: