JEOL Field Emission SEMs are effectively nanolabs in a single, powerful, smart instrument, with the ability to provide sub100nm scale resolution easily and quickly, navigate to specific areas of a sample, and retain optimum imaging settings for each sample. Additional detectors such EBSD enable easy observation of grain orientation, but the JEOL FE SEM also obtains BSE images at a high resolution while maximizing orientation contrast.  The FE SEM combines large beam currents with a small probe size at ANY accelerating voltage.

Learn more about imaging and analysis with the JEOL Field Emission SEMs:

• JSM-IT800
• JSM-7610FPlus
• JSM-IT700HR

The JEOL Cross Section Polisher maintains the integrity of the sample for optimal imaging and analysis of grain orientation at a high probe current and low scan rates on a well-polished, flat surface.  

• Clean polished cross section of hard, soft, and composite materials
• Clean mirrored surface with minimal strain or distortion
• Wide area cross sections (up to several mm across)
• Easy touch panel operation

Learn more about the CP and new Cooling CP

• Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion Milling
• Quantitative Hyperspectral X-ray Map (QMap) - Ceramic Automotive Brake Pad
• Introduction of Cross Section Specimen Preparation