Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion Milling October 20, 2020 Applications, Sample Preparation 0 A method for directly observing the ferroelectric domain structure by scanning electron microscopy after argon ion milling has been established. Its advantages are exemplified by exposing the domain structure in three widely used ferroelectric ceramics, BaTiO3, (Na,K)NbO3, and Pb(Ti,Zr)O3. Stable high-resolution images revealing domains with widths <30 nm have been obtained. The domain contrast is caused by electron channeling and is strongly dependent on the sample tilt angle. Owing to a strain- and defect-free surface generated by gentle ion milling, pronounced orientation contrast is observed. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. Ferromagnetic materials.pdf 598.21 KB Related Articles Integrated Preparation and Imaging Techniques for the Microstructural and Geochemical Characterization of Shale by Scanning Electron Microscopy To better understand the influence of microscale geochemical and microstructural relationships on the bulk petrophysical properties of unconventional shale systems, core samples from four producing North American formations were cross-sectioned with an argon ion polisher and imaged with a field emission scanning electron microscope (FE-SEM) using a variety of complementary detectors. We demonstrate distinct advantages of the ion-polishing technique for the preservation of the internal shale structure. Moreover, we show how such preparation affords a wider choice of imaging options for both chemical and structural characterization, such as backscatter electron observation at varying beam potentials coupled with x-ray and cathodoluminescence spectroscopic techniques. Designing Better Batteries Through Innovative Microscopy Characterization Scanning Electron Microscopes (SEM) support the development of new LIB technologies with morphological observation at the micrometer to nanometer scale, as well as the chemical analysis needed to create high-performance coatings and powders. Ultra-low voltage imaging combined with signal filtering in the SEM allows direct imaging and analysis of battery constituents (anode and cathode) with nanometer resolution. Additionally, one of the important aspects of the analysis is the ability to probe chemistry of the constituents at nm scale (Fig. 1). JEOL FESEM offers the ability to perform microanalysis with energy dispersive spectroscopy (EDS) at extremely low voltages to pinpoint localized makeup of the specimens and, in particular, low atomic number materials such as carbon and fluorine. Moreover, the unique JEOL Soft X-ray spectrometer (SXES) allows researchers to analyze Li. SEM Backscattered-Electron Images of Paint Cross Sections as Information Source for the Presence of the Lead White Pigment and Lead-Related Degradation and Migration Phenomena in Oil Paintings Scanning electron microscopy backscattered-electron images of paint cross sections show the compositional contrast within the paint system. They not only give valuable information about the pigment composition and layer structure but also about the aging processes in the paint. This article focuses on the reading of backscatter images of lead white-containing samples from traditional oil paintings (17th–19th centuries). In contrast to modern lead white, traditional stack process lead white is characterized by a wide particle size distribution. Changes in particle morphology and distribution are indications of chemical/physical reactivity in the paint. Lead white can be affected by free fatty acids to form lead soaps. The dissolution of lead white can be recognized in the backscatter image by gray ~less scattering! peripheries around particles and gray amorphous areas as opposed to the well-defined, highly scattering intact lead white particles. The small particles react away first, while the larger particles/lumps can still be visible. Formed lead soaps appear to migrate or diffuse through the semipermeable paint system. Lead-rich bands around particles, at layer interfaces and in the paint medium, are indications of transport. The presence of lead-containing crystals at the paint surface or inside aggregates furthermore point to the migration and mineralization of lead soaps. High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer – Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit Ion Slicer (IS) is an instrument used to prepare TEM lamellas and SEM cross-sections by employing an Ar broad ion beam. The IS has been getting quite popular in TEM and SEM laboratories because of its ease of use and high quality results. However, it is difficult to mill low melting point materials by the Ar broad ion beam because of thermal damage during the milling. Therefore, we have developed a specimen cooling unit for the IS. This cooling unit keeps specimen at low temperature during the ion milling to avoid the thermal damage. We named this system Cryo Ion Slicer(CIS). Imaging Texture and Porosity in Mudstones and Shales: Comparison of Secondary and Ion-Milled Backscatter SEM Methods Observations from a number of unconventional reservoirs lead us to conclude that four major pore types exist in fine-grained reservoir and non-reservoir rocks, that they are effectively connected, and that pore sizes from nanometers to microns must be considered when evaluating size distributions. This paper uses SEM imaging of Haynesville, Horn River, Barnett and Marcellus Shales to illustrate that pore types other than those hosted by organics are present in unconventional shale gas reservoirs, and that they are continuous and connected to kerogen-hosted pores. In addition, we present evidence that the maximum size of pores originating in organic matter is determined by the size of the kerogen mass (in the case of organic particles) or the geometry of enclosing crystals (in the case of amorphous, pore-filling kerogen). Pairs of secondary and ion-milled backscatter SEM images address the misconception that large pores observed in secondary electron images are grain pullouts. Precise SEM Cross Section Polishing via Argon Beam Milling Instrument overview, as seen in Microscopy Today. Showing 0 Comment Comments are closed.