JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
      Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
      Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
      Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
      Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
  • Vol. 53 No. 1, July 2018 Vol. 53 No. 1, July 2018
    • Fast Pixelated Detectors: A New Era for STEM
    • Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    • Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    • Electronic State Analysis by Monochromated STEM-EELS
    • Chemical State Analyses by Soft X-ray Emission Spectroscopy
    • X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    • Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    • Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    • Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    • Development of the JBX-8100FS Electron Beam Lithography System
  • Vol. 52 No. 1, July 2017 Vol. 52 No. 1, July 2017
    • Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
    • Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
    • High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
    • A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
    • High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
    • A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
    • Introduction of a Next-Generation 200 kV Cryo TEM
    • Development of Pixelated STEM Detector "4DCanvas"
    • Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
    • JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
    • The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
    • New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
    • Introduction of New Products
  • Vol. 51 No. 1, July 2016 Vol. 51 No. 1, July 2016
    • Atomic Resolution Microscopy of Intermetallic Clathrates
    • Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
    • Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
    • Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
    • Visualization of Invisible Defects in Semiconductor Devices
    • Development of Cryo-Coil MAS Probe for Multinuclear Measurement
    • Development of JEM-F200(F2) Multi-Purpose Electron Microscope
    • Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
    • Depth Profile Measurement with JPS-9030
  • Vol. 50 No. 1, Sept. 2015 Vol. 50 No. 1, Sept. 2015
    • Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
    • Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
    • Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
    • Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
    • 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
    • Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
    • Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
    • Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
    • New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
    • Introduction of JEOL Products
  • Vol. 49 No. 1, Sept. 2014 Vol. 49 No. 1, Sept. 2014
    • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
    • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
    • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
    • Photonic Crystal Lasers
    • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
    • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
    • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
    • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
    • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
    • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
    • New Series of NMR Spectrometers JNM-ECZ
  • Vol. 48 No. 1, July 2013 Vol. 48 No. 1, July 2013
    • Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
    • Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
    • Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
    • Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
    • Introduction of New Products
  • Vol. 47 No. 1, July 2012 Vol. 47 No. 1, July 2012
    • High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
    • Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
    • Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
    • A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
    • Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
    • Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
    • Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
    • Introduction of New Products
  • Vol. 46 No. 1, July 2011 Vol. 46 No. 1, July 2011
    • Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
    • Exploring Biological Samples in 3D Beyond Classic Electron Tomography
    • Application of Scanning Electron Microscope to Dislocation Imaging in Steel
    • Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
    • Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
    • Development of JEM-2800 High Throughput Electron Microscope
    • Introduction of New Product JEM-2800 High Throughput Electron Microscope
    • Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope
  • Vol. 45 No. 1, July 2010 Vol. 45 No. 1, July 2010
    • Lithium Atom Microscopy at Sub-50pm Resolution by R005
    • Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
    • Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
    • Ultrahigh-Resolution STEM Analysis of Complex Compounds
    • Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
    • JEM-2100: Applications in Nanotechnology
    • Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
    • Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
    • Micro Area Analysis with JXA-8530F (FE-EPMA)
    • Analysis of Insulator Samples with AES
123Next
  • Vol. 55 No. 1, July 2020 Vol. 55 No. 1, July 2020
    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
    Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
    Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products