JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens <SHL>
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
      New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

  • Vol. 55 No. 1, July 2020 Vol. 55 No. 1, July 2020
    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
    Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
    Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products
  • Vol. 54 No. 1, July 2019 Vol. 54 No. 1, July 2019
    • Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
    • Analytical SEM and TEM: Applications in Product-related Material Development
    • Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
    • Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
    • Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
    • High-Field DNP Using Closed-Cycle Helium MAS System
    • Application of "operando -ESR" to Organic Electronics Materials
    • YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
    ‒ Characterization of Biomimetic Lacquer ‒
    • Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
    • Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
    • Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
    • Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
  • Vol. 37 No. 1, July 2002 Vol. 37 No. 1, July 2002
    • A Cs Corrected HRTEM: Initial Applications in Materials Science
    • Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
    • Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
    • Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
    • Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
    • A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
    • Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
    • Development of Nano-Analysis Electron Microscope JEM-2500SE
    • Development of JSM-7400F
    • New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
    • Applications of Image Processing Technology in Electron Probe Microanalyzer
    • Technology of Measuring Contact Holes Using Electric Charge in a Specimen
    • Organic EL Display Production Systems - ELVESS Series
    • In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
    • Peak Deconvolution of Analysis in Auger Electron Spectroscopy
    • JEOL's Challenge to Nanotechnology
    • Progress in Development of High-Density Reactive Ion Plating
    • Applications of High-Power Built-in Plasma Gun
    • Introduction of New Products
  • Vol. 35 No. 1, July 2000 Vol. 35 No. 1, July 2000
    • 100kV E-Beam Lithography System: JBX-9300FS
    • Gate Oxide Characterization using Annualr Dark Field Imaging
    • JEOL Intro of New Products
    • Kankan Diamonds (Guinea): probing the lower mantle
  • Vol. 53 No. 1, July 2018 Vol. 53 No. 1, July 2018
    • Fast Pixelated Detectors: A New Era for STEM
    • Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    • Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    • Electronic State Analysis by Monochromated STEM-EELS
    • Chemical State Analyses by Soft X-ray Emission Spectroscopy
    • X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    • Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    • Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    • Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    • Development of the JBX-8100FS Electron Beam Lithography System
  • Vol. 52 No. 1, July 2017 Vol. 52 No. 1, July 2017
    • Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
    • Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
    • High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
    • A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
    • High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
    • A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
    • Introduction of a Next-Generation 200 kV Cryo TEM
    • Development of Pixelated STEM Detector "4DCanvas"
    • Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
    • JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
    • The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
    • New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
    • Introduction of New Products
  • Vol. 34 No. 1, July 1999 Vol. 34 No. 1, July 1999
    A 1000kV TEM Running Over 25 Years
    • Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
    • The Growing Role of Electron Crystallography in Structural Biology
    • Factors Promoting R&D in Electron Microscopy in Japan
    • The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
    • Immunogold-labeling in Scanning Electron Microscopy
    • Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
    • Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
    • Miniaturized STM Working Simultaneously in UHV Electron Microscope
    • High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
    • Development of Optical Technology for JEOL's Electron Probe Instruments
    • Observation of Protein Structures through an Electron Beam
    • Transition of JEOL's Semiconductor Equipment, and Future Development
    • Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
    • Development History of JEOL's Transmission Electron Microscopes
  • Vol. 51 No. 1, July 2016 Vol. 51 No. 1, July 2016
    • Atomic Resolution Microscopy of Intermetallic Clathrates
    • Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
    • Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
    • Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
    • Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
    • Visualization of Invisible Defects in Semiconductor Devices
    • Development of Cryo-Coil MAS Probe for Multinuclear Measurement
    • Development of JEM-F200(F2) Multi-Purpose Electron Microscope
    • Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
    • Depth Profile Measurement with JPS-9030
  • Vol. 50 No. 1, Sept. 2015 Vol. 50 No. 1, Sept. 2015
    • Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
    • Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
    • Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
    • Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
    • 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
    • Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
    • Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
    • Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
    • New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
    • Introduction of JEOL Products
  • Vol. 49 No. 1, Sept. 2014 Vol. 49 No. 1, Sept. 2014
    • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
    • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
    • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
    • Photonic Crystal Lasers
    • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
    • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
    • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
    • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
    • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
    • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
    • New Series of NMR Spectrometers JNM-ECZ
123Next
  • Vol. 56 No. 1, July 2021 Vol. 56 No. 1, July 2021
    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
    • New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products