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JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)


  • Vol. 52 No. 1, July 2017 Vol. 52 No. 1, July 2017
    Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy; Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University; High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials; A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System; High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University; A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation; Introduction of a Next-Generation 200 kV Cryo TEM; Development of Pixelated STEM Detector "4DCanvas"; Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus; JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis; The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation; New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis; Introduction of New Products;
  • Vol. 51 No. 1, July 2016 Vol. 51 No. 1, July 2016
    Atomic Resolution Microscopy of Intermetallic Clathrates; Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy; Microscopic Analyses of Deformation Structures around Fatigue Crack Tips; Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy; Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics; Visualization of Invisible Defects in Semiconductor Devices; Development of Cryo-Coil MAS Probe for Multinuclear Measurement; Development of JEM-F200(F2) Multi-Purpose Electron Microscope; Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM; Depth Profile Measurement with JPS-9030;
  • Vol. 50 No. 1, Sept. 2015 Vol. 50 No. 1, Sept. 2015
    Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology; Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals; Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK; Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory; 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond; Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F); Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES; Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer; New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”; Introduction of JEOL Products;
  • Vol. 49 No. 1, Sept. 2014 Vol. 49 No. 1, Sept. 2014
    Development of Aberration Corrected Differential Phase Contrast (DPC) STEM; Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago; Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM; Photonic Crystal Lasers; Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection; Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F; Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES; Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes; Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”; Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe); New Series of NMR Spectrometers JNM-ECZ;
  • Vol. 48 No. 1, July 2013 Vol. 48 No. 1, July 2013
    Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM; Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy; Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy; Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance; Introduction of New Products;