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Vol. 55 No. 1, July 2020
• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products
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Vol. 54 No. 1, July 2019
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
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Vol. 37 No. 1, July 2002
• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products
-
Vol. 35 No. 1, July 2000
• 100kV E-Beam Lithography System: JBX-9300FS
• Gate Oxide Characterization using Annualr Dark Field Imaging
• JEOL Intro of New Products
• Kankan Diamonds (Guinea): probing the lower mantle
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Vol. 53 No. 1, July 2018
• Fast Pixelated Detectors: A New Era for STEM
• Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
• Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
• Electronic State Analysis by Monochromated STEM-EELS
• Chemical State Analyses by Soft X-ray Emission Spectroscopy
• X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
• Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
• Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
• Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
• Development of the JBX-8100FS Electron Beam Lithography System
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Vol. 52 No. 1, July 2017
• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products
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Vol. 34 No. 1, July 1999
A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes
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Vol. 51 No. 1, July 2016
• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030
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Vol. 50 No. 1, Sept. 2015
• Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
• Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
• Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
• 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
• Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
• Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
• Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
• New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
• Introduction of JEOL Products
-
Vol. 49 No. 1, Sept. 2014
• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ
Vol. 56 No. 1, July 2021
• Progress in Photonic Crystal Lasers and Their Application to LiDAR
• And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
• Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
• Characterization of Localized Physical Properties Using High Resolution EELS
• In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
• Degradation Analysis for Polymer Materials by Spin-Trapping
• High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
• System to the Specimen in Transmission Electron Microscopy
• The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
• Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
• Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
• Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
• MultiAnalyzer - Unknown Compounds Analysis System
• New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
• Introduction to JEOL Products
• Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
• Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
• Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast Scanning Transmission Electron Microscopy
• Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
• Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
• Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
• Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
• Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
• Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
• Introduction of Newly Developed Electron Probe Micro Analyzers
• High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
Combined with Large-Volume Injection Technique and Fast-GC Method
• Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
Laser Desorption Ionization Time-of-Flight Mass Spectrometer
• Introduction of JEOL Products
• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC
• A Cs Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F
• New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products
• 100kV E-Beam Lithography System: JBX-9300FS
• Gate Oxide Characterization using Annualr Dark Field Imaging
• JEOL Intro of New Products
• Kankan Diamonds (Guinea): probing the lower mantle
• Fast Pixelated Detectors: A New Era for STEM
• Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
• Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
• Electronic State Analysis by Monochromated STEM-EELS
• Chemical State Analyses by Soft X-ray Emission Spectroscopy
• X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
• Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
• Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
• Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
• Development of the JBX-8100FS Electron Beam Lithography System
• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products
A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defects
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes
• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030
• Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics; Quantitative ADF STEM for Catalyst Nanoparticle Metrology
• Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
• Dressing Living Organisms in the NanoSuit® for FE-SEM Observation; Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
• 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
• Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
• Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
• Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
• New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
• Introduction of JEOL Products
• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ
• Progress in Photonic Crystal Lasers and Their Application to LiDAR
• And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
• Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
• Characterization of Localized Physical Properties Using High Resolution EELS
• In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
• Degradation Analysis for Polymer Materials by Spin-Trapping
• High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
• System to the Specimen in Transmission Electron Microscopy
• The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens
• Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
• Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
• Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
• MultiAnalyzer - Unknown Compounds Analysis System
• New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
• Introduction to JEOL Products