• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe
• Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products

• Atomic Resolution Microscopy of Intermetallic Clathrates
• Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
• Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
• Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
• Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
• Visualization of Invisible Defects in Semiconductor Devices
• Development of Cryo-Coil MAS Probe for Multinuclear Measurement
• Development of JEM-F200(F2) Multi-Purpose Electron Microscope
• Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
• Depth Profile Measurement with JPS-9030

• Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics
• Quantitative ADF STEM for Catalyst Nanoparticle Metrology
• Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
• Dressing Living Organisms in the NanoSuit® for FE-SEM Observation
• Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
• Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
• 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
• Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
• Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
• Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
• New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
• Introduction of JEOL Products

• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells
• Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ

• Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
• Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
• Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
• Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
• Introduction of New Products

• High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
• Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
• Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
• A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
• Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
• Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
• Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
• Introduction of New Products

• Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
• Exploring Biological Samples in 3D Beyond Classic Electron Tomography
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
• Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
• Development of JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JEM-2800 High Throughput Electron Microscope
• Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope

• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES

JEOL 60th Anniversary Issue.

• Congratulatory Message for the 60th Anniversary of JEOL
• Congratulations from Arizona State University
• Marking Our 60th Anniversary
• Aiming for Best Total Solutions
• Exit Wavefunction Reconstruction
• Single Shot Nanosecond Imaging in the Dynamic TEM
• An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
• Observation of Membrane Proteins Through An Electron Beam
• HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
• Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
• Development of Nanoimprint Mold Using JBX-9300FS
• Introduction of New Products

• Interface Studies by Cs-Corrected STEM
• Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
• Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
• Quantitative Electron Microscopy Using Digital Data Processing
• Case Study on Failure Analysis by Electron Beam Absorbed Current Method
• Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
• Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
• High Power Electron Beam Source Used for Melting Metal Materials
• Introduction of New Products

• Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
• Improvement of Reflection Electron Microscopy: LODREM
• Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
• A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
• High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
• Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
• New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
• Auger Analyses Using Low Angle Incident Electrons
• Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
• Introduction of New Products

• The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
• Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
• Visualization of Biological Nano-Machines at Subnanometer Resolutions
• Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
• Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
• Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
• Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass
  Spectrometry
• Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy

• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction
  • Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
  • 100 Sample Auto Sample Changer and Tubeless NMR
  • Windows Delta 
  • Latest Information and Future for ALICE2 Software
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review

• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products

• A Double Aberration Corrected, Energy Filtered HREM/STEM
• Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
• The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
• Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
• ALCHEMI Studies on Quasicrystals
• Electron Spin Resonance Spectroscopy in Food Radiation Research
• Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
• Introduction of new products

• Atomic Resolved HAADF-STEM for Composition Analysis
• Atomic Structure Analysis
• Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
• Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
• Electron Spin Resonance (ESR) in Nanocarbon Research
• Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
• JWS-3000 High-Resolution Review SEM
• Application and Extension of Pickup Method to Various Materials
• Introduction of New Products

• Mapping of sp²/sp³ in DLC Thin Film by Signal Processed ESI series Energy Loss Image
• Electron Holographic Analysis of Nanostructured Gold Catalyst
• Single Atomic Column Observation in Silicon Boundary
• The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
• Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
• Protein NMR - Ability of the JNM-ECA series
• Development of the JBX-3030MV Mask Making E-Beam Lithography System
• Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
• Peak Deconvolution Analysis in Auger Electron Spectroscopy II
• Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
• Introduction of New Products

• A C_s Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F; New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products

• 100kV E-Beam Lithography System: JBX-9300FS
• Gate Oxide Characterization using Annualr Dark Field Imaging
• JEOL Intro of New Products
• Kankan Diamonds (Guinea): probing the lower mantle

• A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defectst
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes