JEOL NEWS Magazine

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- Degradation of CuPd Nanoparticles upon Redox Cycling Shown by In situ Scanning Transmission Electron Microscopy in the JEOL NEOARM
- Accurate Quantification of Qⁿ Species Distributions in Modified Silicate Glass by Phase Adjusted Spinning Sideband NMR Experiment
- Electron Cryomicroscopy: Recent Progress and Future Perspective for Structural Life Sciences
- Chemical=State Analysis of Li Compounds and Nitrogen-Getter Material for Liquid Li by Soft X-ray Emission Spectroscopy
- Observation and Analysis of Micro-Textures in Mineral Samples with an Aberration Corrected STEM
- New Semi-in-lens SEM JSM-IT800 <i>/<is> Excellent for Semiconductor Device Observation
- Automated TEM Iamella Preparation with JIB-4700F
- Spectrum Imaging for Secondary Electrons and Backscattered Electrons Using Band Pass Filter with Variable Energy Resolution
- Developing an Electron-Beam Metal 3D Printer JAM-5200EBM
- Gas Chromatograph - Quadrupole Mass Spectrometer, JMS-Q1600GC UltraQuad™ SQ-Zeta
- Introduction to JEOL Products
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JEOL NEWS Magazine (previous issues)

Vol. 52 No. 1, July 2017

• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products