JEOL NEWS Magazine

Loading

  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Nanoscale Positioning Highly Coherent Spin Defects in Diamond Using JBX-8100FS
    • Development of a Semi-Automated 3D ED/MicroED System and Its Operation as a Shared-Use Facility
    • Structural Analysis of AMorphous Alumina Using Nuclear Magnetic Resonance Spectroscopy
    • High-Resolution STEM Image Acquisition Method for Tilted Specimen Using a New Type of Aberration Corrector
    • Structure Solution of Nano-Crystalline Powder: A YOKOGUSHI Approach of SynergyED, HRMS, NMR, and Computation
    • Toward Full Automation of Scanning Electron Microscopy: Automating Specimen Exchange and Measurement with Neo Action Robo
    • Introduction of In-situ Charge-Discharge Cycle System and Battery Application
    • Expansion of Crystal Orientation Analysis in Entry-Level SEM
    • Development of an Electron Spectroscopy System (f-HSA) and Its Application to High-Speed Spectrum Imaging
    • Development of an Ultra-Low Temperature Solid-State DNP-NMR System Using a Compact Microwave Source
    • Analysis of Metabolites in HeLa Cells Using GCxGC-TOFMS and Unknown Compounds Structure Analysis Software msFineAnalysisAI

JEOL NEWS Magazine (previous issues)

Vol. 52 No. 1, July 2017

• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products

Showing 0 Comment

© Copyright 2026 by JEOL USA, Inc.
  • Contact your local Sales Representative to schedule a
    virtual demo now (USA, Canada, Mexico, Brazil)
Terms of Use
|
Privacy Policy
|
Cookie Preferences