JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Progress in Photonic Crystal Lasers and Their Application to LiDAR
    • And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
    • Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
    • Characterization of Localized Physical Properties Using High Resolution EELS
    • In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
    • Degradation Analysis for Polymer Materials by Spin-Trapping
    • High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laer Delivery
    • System to the Specimen in Transmission Electron Microscopy
    • The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens <SHL>
    • Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ~ Applications to Allende meteorite ~
    • Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
    • Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
    • MultiAnalyzer - Unknown Compounds Analysis System
      New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
    • Introduction to JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 52 No. 1, July 2017

• Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
• Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
• High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
• A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
• High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
• A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
• Introduction of a Next-Generation 200 kV Cryo TEM
• Development of Pixelated STEM Detector "4DCanvas"
• Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
• JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
• The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
• New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
• Introduction of New Products

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