JEOL USA Press Releases

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JEOL Introduces New Scanning Electron Microscope with “Simple SEM” Automation and Live Elemental and 3D Analysis

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) ...
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Covalent Metrology and JEOL Announce Partnership, Silicon Valley Demonstration Facility

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and ...
atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures

Researchers Achieve Extraordinary Spatial Resolution for In-situ Atomic Resolution TEM Using New Luminary Micro Technique

Materials science researchers in Japan have achieved extraordinary in-situ Transmission Electron Microscope (TEM) experiments using a new Luminary Micro laser technique. They succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures. The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles. This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system ...
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JEOL and SCiLS Sign a Distribution Agreement for SCiLS Lab MVS Software

JEOL Ltd. and SCiLS, a division of Bruker Daltonics, announced that they have concluded a non-exclusive, worldwide distribution agreement for SCiLS Lab MVS software. The SCiLS Lab has been the software of choice for researchers wanting to gain new insights from mass spectrometry imaging. Used in science and industry, the software sets new standards in analysis and visualization, simplifying everyday work and advancing the research. The SCiLS Lab MVS (Multi-Vender Support) can be used for ...

24 Hours of Life Science Conference

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including: - Connectomics and the study of complete volumes of tissues or materials captured at high resolution - Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small ...
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JEOL USA Welcomes New Managing Director, Hidetaka Sawada

April 19, 2021 Peabody, Mass. -- JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL, Ltd. in Akishima, Japan. Dr. Sawada’s expertise includes the development and installation of the aberration-corrected (Cs) Transmission Electron Microscopes for ...
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JEOL CANADA Names SOQUELEC as Microscopy Sales Representative in Canada

April 1, 2021 Peabody, Mass -- JEOL, the leading supplier of electron microscopes in North and South America, begins a new partnership on April 1st, 2021 with SOQUELEC LTD., a Montreal, Quebec company with more than 40 years of experience specializing in sales of scientific instruments. SOQUELEC will serve as the sales representative agency for JEOL’s electron microscope product line throughout all of Canada. JEOL will benefit from SOQUELEC’s expanded sales team in the ...
JEOL JMS-T2000GC AccuTOF™ GC-Alpha Mass Spectrometer

JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF™ GC-Alpha

February 17, 2021, Peabody, Mass. – JEOL builds upon its legacy of successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers with the release of the JMS-T2000GC "AccuTOF™ GC-Alpha". This product is a GC-MS that represents significant improvement in performance and functionality using two newly developed key technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration. High-Performance Hardware The JMS-T2000GC “AccuTOF™ GC-Alpha”, the ...
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Pristine Sample Preparation for SEM Using Broad Ion Beam Milling

Feb. 22, 2021 Peabody, Mass. - JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM).  The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batteries). Traditional mechanical preparation of specimen ...

JEOL Announces New Cold Field Emission Cryo-Electron Microscope: CRYO ARM™ 300 II

January 22, 2021 - JEOL Ltd. (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of “Quick and easy to operate and get high-contrast and high-resolution images”. Product development background Recent dramatic improvement of resolution in single particle analysis (SPA) using cryo-EM has led to SPA as ...