JEOL Introduces New FIB-SEM for Fast, Atomic Resolution STEM Sample Preparation
February 1, 2023 – Peabody, MA
JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument.
High Quality Fast TEM Sample Preparation
The new FIB sample stage offers fast transitioning between processing and imaging, allowing for real-time feedback of specimen ...