JEOL USA Press Releases

JIB-PS500i multipurpose FIB-SEM

JEOL Introduces New FIB-SEM for Fast, Atomic Resolution STEM Sample Preparation

February 1, 2023 – Peabody, MA JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. High Quality Fast TEM Sample Preparation The new FIB sample stage offers fast transitioning between processing and imaging, allowing for real-time feedback of specimen ...
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