JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases

NeoScope model JCM-7000

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...