JEOL USA Press Releases

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020.  JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more than 50 years of e-beam lithography leadership. Mass spectrometry (MS) JEOL expanded its mass spectrometer product line with the development ...

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...

NeoScope model JCM-7000

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...

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Whenever there’s a forensic investigation that requires a closer look with a high-powered electron microscope, chances are the microscope is from JEOL. After being made aware of some of the high profile cases investigated by Microtrace LLC in Illinois using the JEOL Field Emission Scanning Electron Microscope, JEOL spoke with the lab’s forensic scientist. At Microtrace, the company’s father-son team of Skip and Chris Palenik have achieved a kind of celebrity status. But more ...

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For further information, please visit https://www.jeol.co.jp/en/products/detail/JSM-IT500HR.html.

(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens. Advanced research and analysis requires ever more powerful capabilities in a flexible, ...

New JEOL JSM-IT300HR InTouchScope™ SEM

Ultrahigh resolution imaging of large samples in their native state May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface ...

(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...

March 7, 2016 (Pittcon 2016, Atlanta, Georgia) --- JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers high sensitivity backscatter electron detection with a JEOL BSE detector to detect contrast between areas of the sample with different chemical compositions. JEOL's benchtop SEM makes it possible to bring ...

March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. It can be outfitted for 10 or more analytical attachments including: energy dispersive ...