JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases

NeoScope model JCM-7000

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...

(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...

September 1, 2015, Peabody, MA -- JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon. The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation. Featuring through-the-lens detectors that can collect a variety of ...

June 15, 2015, Peabody, MA -- Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April's winning image of hibiscus pollen grains was submitted by Dr. Howard Berg of Danforth Plant Science in St. Louis, MO, who used the JEOL JSM-6010 InTouchScope Scanning Electron Microscope (SEM) to image the sample ...

December 10, 2013 (Peabody, Mass.) -- JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View® Serial Block Face Imaging ...

July 10, 2012 (Semicon West, San Francisco, CA) -- Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes and traditional SEMs in the lab. Now JEOL introduces the NeoScope with higher magnification, multi-touch screen control, and a sleek ...

May 31, 2012 (Peabody, Mass.) -- JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis. JEOL's highest performance FE-SEM makes it possible to: observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution perform low kV imaging and analysis of ...

April 17, 2012 (Peabody, Mass.) -- JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage. Designed for the budget-conscious lab, the JSM-7100F model is a highly versatile, easy-to-use ...

July 7, 2011 (Peabody, Mass.) -- JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2. The larger the solid angle of measurement, the more ...

May 31, 2011 (Peabody, MA) -- JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification optical microscope. The external camera eliminates the need for a dedicated port on the electron column. The user simply ...