JEOL USA Press Releases

24 Hours of Life Science Conference

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including: - Connectomics and the study of complete volumes of tissues or materials captured at high resolution - Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small ...
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JEOL CANADA Names SOQUELEC as Microscopy Sales Representative in Canada

April 1, 2021 Peabody, Mass -- JEOL, the leading supplier of electron microscopes in North and South America, begins a new partnership on April 1st, 2021 with SOQUELEC LTD., a Montreal, Quebec company with more than 40 years of experience specializing in sales of scientific instruments. SOQUELEC will serve as the sales representative agency for JEOL’s electron microscope product line throughout all of Canada. JEOL will benefit from SOQUELEC’s expanded sales team in the ...
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Pristine Sample Preparation for SEM Using Broad Ion Beam Milling

Feb. 22, 2021 Peabody, Mass. - JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM).  The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature) and air-isolated transfer for atmosphere sensitive specimens (for example Li batteries). Traditional mechanical preparation of specimen ...

JEOL Announces 2020 Microscopy Image Grand Prize Winners

January 7, 2021, Peabody, Mass. - JEOL USA awarded two Grand Prizes to winners of its 2020 Electron Microscopy Image Contest, and kicked off its 2021 Image Contest at the beginning of the new year. The annual contest showcases JEOL microscope users’ artistically or esthetically pleasing images with good composition, sharp focus, and technical competency, especially in the use of accelerating voltage. The Grand Prize Transmission Electron Microscope (TEM) Image award was given to Lita ...

JEOL Introduces New Compact Field Emission Scanning Electron Microscope

August 3, 2020, Peabody, Mass. JEOL expands its revolutionary FE SEM product group with the introduction of a compact, versatile Field Emission SEM that offers ultrahigh resolution and versatile analytical capabilities at a great value. The new JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded ...
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JEOL Begins Remote Demonstrations of New Ultrahigh Resolution Field Emission SEM in July

July 1, 2020 Peabody, Mass. – The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale. Capabilities include up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making ...

JEOL USA showcases product updates in MS, SEM and NMR

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020.  JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more than 50 years of e-beam lithography leadership. Mass spectrometry (MS) JEOL expanded its mass spectrometer product line with the development ...

JEOL Introduces New Field Emission SEM with Automated Analytical Intelligence

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...
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JEOL Demonstrates Next-Generation Benchtop Scanning Electron Microscope at Pittcon 2019

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...
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High profile forensics cases investigated at Microtrace

Whenever there’s a forensic investigation that requires a closer look with a high-powered electron microscope, chances are the microscope is from JEOL. After being made aware of some of the high profile cases investigated by Microtrace LLC in Illinois using the JEOL Field Emission Scanning Electron Microscope, JEOL spoke with the lab’s forensic scientist. At Microtrace, the company’s father-son team of Skip and Chris Palenik have achieved a kind of celebrity status. But more ...