JEOL USA Press Releases

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JEOL Introduces New Scanning Electron Microscope with “Simple SEM” Automation and Live Elemental and 3D Analysis

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) ...
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Covalent Metrology and JEOL Announce Partnership, Silicon Valley Demonstration Facility

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and ...

24 Hours of Life Science Conference

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including: - Connectomics and the study of complete volumes of tissues or materials captured at high resolution - Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small ...
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JEOL USA Welcomes New Managing Director, Hidetaka Sawada

April 19, 2021 Peabody, Mass. -- JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL, Ltd. in Akishima, Japan. Dr. Sawada’s expertise includes the development and installation of the aberration-corrected (Cs) Transmission Electron Microscopes for ...

JEOL Announces 2020 Microscopy Image Grand Prize Winners

January 7, 2021, Peabody, Mass. - JEOL USA awarded two Grand Prizes to winners of its 2020 Electron Microscopy Image Contest, and kicked off its 2021 Image Contest at the beginning of the new year. The annual contest showcases JEOL microscope users’ artistically or esthetically pleasing images with good composition, sharp focus, and technical competency, especially in the use of accelerating voltage. The Grand Prize Transmission Electron Microscope (TEM) Image award was given to Lita ...
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JEOL Announces New High Throughput Analytical Transmission Electron Microscope

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.

JEOL Introduces World's Fastest Direct Write E-Beam Tool

May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS. This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. ...

NEW Versatile High Throughput SEM from JEOL

Portland, OR - November 4, 2015 -- JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design. Featuring expanded EDS analysis capabilities and ports for multiple detectors, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. ...

JEOL Brasil Sponsors LNNano Transmission Electron Microscopy Summer School

August 20, 2015 (Peabody, MA and Sao Paulo, Brazil) --- JEOL BRASIL Instrumentos Científicos Ltda. is proud to sponsor the 6th biannual Transmission Electron Microscopy (TEM) Summer School being held at the Brazilian Nanotechnology National Laboratory (LNNano), located in the Brazilian Center for Research in Energy and Materials (CNPEM) campus, Campinas - Brazil. The classroom sessions will be scheduled between January 11 and 29, 2016. Candidates may apply until August 31st. 100 participants are ...

New JEOL E-Beam Lithography System to Enhance Quantum NanoFab Capabilities

May 5, 2015 - Peabody, MA -- A state-of-the-art JEOL e-beam lithography system will soon be a new resource for quantum information science researchers that utilize the cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario. The JEOL JBX-6300FS e-beam system will be used to write circuitry patterns at very high resolution and linewidths as small as 8nm. With accelerating voltage capability to 100kV, high resolution patterns can be written on ...