JEOL USA Press Releases

JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026. Development Background Benchtop scanning electron microscopes are increasingly used across a wide range of fields, including electrical and electronics, automotive and machinery, steel and metals, chemical and pharmaceuticals. They are utilized not only in research and development but also in manufacturing-related applications, such as quality control and product inspection. In addition, they ...

JEOL Ltd. (President & CEO: Izumi Oi) has developed the ACE eye™, a transmission electron microscope (TEM) for semiconductor analysis, and began sales in July 2026. By automating the entire measurement workflow —from TEM/STEM observation to EDS analysis— the ACE eye™ delivers highly reproducible measurements that are less dependent on operator expertise. It also supports long-duration, continuous automated measurement, helping to improve the efficiency of semiconductor device R&D, process evaluation, and failure analysis. Background to Development Semiconductor ...

JEOL Ltd. (President & CEO: Izumi Oi) has developed the “LazEdge”, an SEM system equipped with a laser processing system, and begins sales on May 25, 2026. Cross-section preparation instruments such as the focused ion beam system (FIB system), are widely used in science and technology fields across research institutes, universities, and industries. In recent years, demand is increasing for a system that can process large-areas at a high speed, while achieving high-quality of ...

Program recognizes outstanding IU student research performed on the JEM-NeoARM200CF; multi-year initiative continuing through 2027 Peabody, MA – JEOL USA, Inc announced the winners of the 2025 JEOL–IU NeoARM Research Award, a program recognizing compelling undergraduate and graduate research conducted using the JEOL JEM-NeoARM200CF electron microscope. First Place: Baixu Zhu Superstructural phase transitions in polymer-grafted nanooctahedra - https://www.science.org/doi/10.1126/sciadv.adw2740 Second Place: Megan Knobeloch Visible light absorbing intergrowths with SrBi3O4Cl3 and Bi2GdO4Cl as building blocks for water splitting Third Place: Rukshanthan Selvaraj Effect of ...

January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user ...

JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).  This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the ...

JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen. This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology. Recently highlighted in a ...

The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”). This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM ...

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) ...

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and ...