JEOL USA Press Releases

JEOL USA Press Releases

rss

JEOL USA Press Releases

news_20181115_JEM-ACE200F.jpg

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.

Specify Alternate Text

(above: IMRI Director Xiaoqing Pan gives opening ceremony speech at UC Irvine Materials Research Institute) (June 22, 2018, Peabody, MA) - When is a Grand Opening truly grand? When the facility and symposium is as impressive as the one at the University of California Irvine Materials Research Institute and the JEOL Center for Nanoscale Solutions. The three-day event kicked off on June 6, 2018 with a welcome from Dr. Xioaqing Pan, Director of the University of California ...

Specify Alternate Text

(May 1, 2018 – Peabody, Mass.) With the next generation Monochromated Transmission Electron Microscope, JEOL, a leader in development of electron microscopes for imaging and analysis, introduces the latest technology for cutting edge research in development of new materials. The JEOL Monochromated ARM200F offers ultrahigh energy resolution EELS analysis of materials at the atomic scale, made possible by the development of a unique Spot-in-Spot-out double Wein filter monochromator. The double Wein filter maintains the spot ...

Specify Alternate Text

GRAND ARM Transmission Electron Microscope - JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI) Renowned Materials Scientists to Present at the 1st International Symposium on Advanced Microscopy and Spectroscopy (ISAMS) April 18, 2018 – Peabody, Mass. ---- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine Materials Research Institute (IMRI), for the Grand Opening of the JEOL Center for Nanoscale Solutions and a three-day symposium June 6-8, ...

Specify Alternate Text

The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI). Further information: JEOL UK press release Also See: CRYO ARM™ 200 Field Emission Cryo-electron Microscope CRYO ARM™ 300 Field Emission Cryo-electron Microscope

Tokyo (April 26, 2017) Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation ...

Scientists from the Institute of Microbiology and Immunology and the Institute of Pathology in Ljubljana, Slovenia are the first in the world to publish and prove that the ZIKA virus is associated with Microcephaly (New England Journal of Medicine, February 10, 2016). ZIKV was found in fetal brain tissue on reversetranscriptase–polymerase-chain-reaction (RT-PCR) assay, with consistent findings on electron microscopy. The complete genome of ZIKV was recovered from the fetal brain. Imaging of the ultrathin ...

(February 3, 2016 -- Peabody, MA) -- JEOL's most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or "F2," the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. "The combined boost in probe current from the Cold FEG with the dual EDS makes this a fabulous analytical machine," says Dr. Thomas Isabell, Director of the JEOL ...

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The ...

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...