JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases

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JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.

July 12, 2011 (Peabody, Mass.) -- A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The ...

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...

October 25, 2010 (Peabody, Mass.) -- JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for both biological and materials applications. It features rapid data acquisition with uncompromised resolution and analytical performance. This latest generation ...

September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado. "We are very excited to be partnering with this premier Federal ...

November 5, 2007 (Peabody, Mass.) -- JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL MultiBeam, the JIB-4500, a high-performance SEM and micromilling FIB with LaB6 source. The MultiBeam will be housed in new laboratory ...